This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST/spl I.bar/PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6's anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6's robustness with respect to noise.
['Suzette Vandivier', 'Mark Wahl', 'Jeff Rearick']
First ic validation of IEEE Std. 1149.6