In this paper, a new approach for reducing the subthreshold leakage current of digital circuits is proposed. It does not use a multi-threshold process technique which is more expensive. The technique which makes to use of a new variable supply voltage oscillator, combines the ideas of both Standby Leakage Control Using Transistor Stacks (SRB) and variable threshold (VT) methods. In this technique compared to the Leakage Control Using Transistor Stacks method, the subthreshold current decreases three times. In addition, leakage current monitor (LCM) and its related circuits which are used in VT techniques are not required here. This makes the proposed technique more power and area efficient.
['A. Amirabadi', 'Jalal Jafari', 'Ali Afzali-Kusha', 'M. Nourani', 'A. Khakifirooz']
Leakage current reduction by new technique in standby mode