True random number generator (TRNG) designers should provide a stochastic model of the target of evaluation to be compliant with the AIS-31 standard evaluation process. In this paper, we present a model of a TRNG that extracts its randomness from the metastable behavior of a D-Latch. Such a model needs to be set up for the TRNG evaluation process. In this work, we describe and analyse the random- ness coming from a chain of D-Latches when set near their metastable state. Then, we present a physical model of a metastability-based TRNG. The main novelty of this paper is the stochastic modeling process of a metastability-based TRNG. The presented model is validated on FPGA and a 65nm CMOS technology prototype chip.
['Molka Ben-Romdhane', 'Tarik Graba', 'Jean-Luc Danger']
Stochastic Model of a Metastability-Based True Random Number Generator