Technology scaling brings about increased process variations and aging effects. In this paper, we analyze the effects of process variations on aging effects and the correlations between process variations and aging effects are considered using Monte-Carlo based transistor-level simulations including independent component analysis (ICA) for non-Gaussian parameters. The aging analysis using ICA well reflect the long-tail characteristics by aging effects compared to the principal component analysis (PCA)
['Joonee Choung', 'Sangwoo Han', 'Byung-Su Kim', 'Juno Kim']
Variation-aware aging analysis with non-Gaussian parameters