In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a "soft" fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.
['Soon Jyh Chang', 'Chung Len Lee', 'Jwu E. Chen']
Functional test pattern generation for CMOS operational amplifier