Effects of built-in current sensors on IDDQ measurement as well as on the performance of circuit under test are considered. Most of the Built-In Current Sensor designs transform the ground terminal of the circuit under test to a virtual ground. This causes increase in both propagation delay as well as IDDQ sampling time with the increase in the number of gates, affecting both test as well as operational performance. The effect that current sensor has on the operational and test performance are considered. Circuit partitioning may be used for overcoming the eflects of BICS on IDDQ measurements as well as on the performance of the circuit under test.
['Sankaran M. Menon', 'Yashwant K. Malaiya', 'Anura P. Jayasumana', 'Carol Q. Tong']
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance*