In this paper, we propose a post-silicon debug framework utilizing high-level design description, which provides great advantage of comprehensibility and readability in analyzing erroneous behaviors for debugging complicated post-silicon errors. The framework consists of the following methods; mapping between high-level and RTL, extracting error-relevant portions, and rank them by the degree of relevance with the error. We also exhibit several experimental results to show its effectiveness.
['Yeonbok Lee', 'Tasuku Nishihara', 'Takeshi Matsumoto', 'Masahiro Fujita']
A Post-Silicon Debug Support Using High-Level Design Description