This paper presents a novel method for designing type-I and type-II single and double output TSC Berger code checkers taking into account a realistic fault model including stuck-at, transistor stuck-open, transistor stuck-on, resistive bridging faults and breaks. A benefit of the proposed type-I single and double output checkers is that all faults are testable by a very small set of code words the number of which does not increase with the information length, that is, the checkers are C-testable. The proposed double output checkers are two-times faster than the corresponding single output checkers, but require for their implementation twice as many transistors as the single output checkers. The proposed single output checkers are the first known TSC Berger code checkers in the open literature, while the type-I single output checkers are near optimal with respect to the number of the transistors required for their implementation. The checkers of this paper with either, single or double output are significantly more efficient, with respect to the implementation area and speed than the already known from the open literature Berger code checkers.
['Xrysovalantis Kavousianos', 'Dimitris Nikolos']
Novel single and double output TSC Berger code checkers