Indirect reflection component degrades the preciseness of 3-D measurement with structured light projection. In this paper, we propose a method to suppress the indirect reflection components by spatial synchronous detection of structured light modulated withMLS (Maximum Length Sequence, M-sequence). Our method exploits two properties of indirect components; one is the high spatial frequency component which is attenuated through the scattering of projected light, and the other is the geometric constraint between projected light and its corresponding pixel of camera.#R##N##R##N#Several experimental results of measuring translucent or concave objects show the advantage of our method.
['Tatsuhiko Furuse', 'Shinsaku Hiura', 'Kosuke Sato']
Synchronous detection for robust 3-d shape measurement against interreflection and subsurface scattering