To determine the temporal variation of the spectral reflectance of corn leaves, an entire life-cycle spectral dataset of live corn leaves was collected using a Spectroradiometer and an Integrating Sphere at the corn sample of Beijing Normal University, Beijing, China. After preprocessing procedure and SNR analysis, 400nm to 960nm is chosen as our discussion range and 8 characteristic wavelengths are selected to investigate the spectral variations of corn leaves. The analysis result shows that characteristic wavelengths are quite stable without any environmental stress during the whole life cycle, and the temporal variation of the reflectance of characteristic wavelengths can be well fitted by quadratic polynomial equations. Therefore, the life-cycle reflectance can be modeled as a three dimensions(time, wavelength and reflectance) surface, and it can be used to predict the reflectance of live corn leaves of any wavelength, or any stage of life cycle.
['Hao Wu', 'Suhong Liu', 'Ying Qu']
Life-cycle spectral variation analysis of corn leaves using hypertemporal and hyperspectral in situ measurement data