In this paper we discuss the need to consider Crosstalk and Process Variation effects for test power reduction during Launch-on-Capture scheme for at-speed delay test. We show that consideration of these effects can have significant effect on capture power reduction technique. This effect is a manifestation of increased IR drops in the presence of crosstalk and process variation. Thus both these factors should be taken into account during the design as well as the test phase of nanometer technologies. Our experimental results on two significantly sized industrial designs in 28nm show that when these effects are considered the number of high capture power patterns selected for post-processing are impacted by 13% and 30% respectively. Thus not considering these effects might lead to some high power consuming patterns left untouched or over processing of the patterns.
['Surya Piplani', 'G.S. Visweswaran', 'Anshul Kumar']
Impact of crosstalk and process variation on capture power reduction for at-speed test