An approach to modular and hierarchical sequential circuit test generation, which exploits a top-down design methodology, uses high level test knowledge and constraint driven module test generation to target faults at the structural level, is introduced in this paper. Results obtained for several designs are provided to demonstrate the effectiveness of our approach and the need for high level knowledge along with global constraints while deriving sequential circuit tests. >
['Praveen Vishakantaiah', 'Jacob A. Abraham', 'Daniel G. Saab']
CHEETA: Composition of hierarchical sequential tests using ATKET