This paper evaluates the severity of negative bias temperature instability (NBTI) degradation in two major circuit applications: random logic and memory array. For improved lifetime stability, we propose/select an efficient reliability-aware circuit design methodologies. Simulation results obtained from 65nm PTM node shows that NBTI induced degradation in random logic is considerably lower than that of a single transistor. As a result, simple delay guard-banding can efficiently mitigate the impact of NBTI in random logic. On the other hand, NBTI degradation in memory shows much severe effect especially when combined with the impact of random process variation, NBTI can dramatically reduce the READ stability of memory cells. Hence, aggressive design techniques such as stand-by V DD  scaling or adaptive body biasing (ABB) are required in memory application to minimize the impact of NBTI.
['Kunhyuk Kang', 'Saakshi Gangwal', 'Sang Phill Park', 'Kaushik Roy']
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?