This is the second paper of a series describing theories and experiments of a new analysis technique able to accurately characterize the time-varying noise of A/D converters (ADC). In the previous work, the effects of the quantization and nonlinearities on the jitter measurement were considered, and an efficient solution to this problem was demonstrated. This paper presents a dual channel measurement technique that is still independent of quantization and nonlinearities, and that allows one to separate from the ADC noise the noise contribution of the test setup. The method, based on the measurement of the cross-correlated noise between the two channels, provides more accurate measurements of the ADC noise than may be possible with traditional test equipment.
['Giovanni Chiorboli', 'Massimo Fontanili']
Cross-correlation noise measurements in A/D converters