A fourth-generation analog in-circuit program generator (APG) is described. A custom hybrid behavioral/nodal simulator using Monte Carlo statistical analysis is shown to provide high-quality tests that require a minimum of debug and long-term maintenance while maximizing test portability. After over a year of use, this APG has shown, on many occasions, to give analog turn-on rates of 98% to 100%. This is a significant improvement over previous generations. This high turn-on has reduced the amount of debug and maintenance time significantly. The validity of the model was demonstrated when its results were major input in setting the tester specifications. Those results were confirmed by extensive environmental and performance verification. The need for accurate test limits for analog in-circuit tests is shown. >
['David T. Crook']
A fourth generation analog incircuit program generator