The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., to support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. The increasing adoption of this standard requires the availability of algorithms and tools to automate its usage. The resulting networks might be affected by defects preventing their correct operation. This necessitates the availability of solutions which allow not only to test against defects, but also to identify the location of possible faults via diagnosis. This paper for the first time addresses the problem of the diagnosis of IEEE 1687 networks. Experimental results gathered on a set of benchmark networks show the feasibility of the solution and provide a first idea about the length of the required input stimuli.
['Riccardo Cantoro', 'Mehrdad Montazeri', 'M. Sonza Reorda', 'F. Ghani Zadegan', 'Elna-Marie Larsson']
On the diagnostic analysis of IEEE 1687 networks