The paper describes a high-level pseudodeterministic ATPG that explores the DUT state space by exploiting an easy-to-traverse extended FSM model. Testing of hard-to-detect faults is thus improved. Generated test sequences are very effective in detecting both high-level faults and gate-level stuck-at faults. Thus, the reuse of test sequences generated by the proposed ATPG allows to improve the stuck-at fault coverage and to reduce the execution time of commercial gate-level ATPGs.
['G. Di Guglielmo', 'Franco Fummi', 'Cristina Marconcini', 'Graziano Pravadelli']
Improving gate-level ATPG by traversing concurrent EFSMs