Since 2004, Texas Instruments and Portland State University have collaborated to develop and deploy test data analytical methods for use in a variety of applications, including quality screening, burn-in minimization, high cost test replacement and/or removal, and operations monitoring. In this paper, key findings amassed during this time are summarized.
['Kenneth M. Butler', 'Amit Nahar', 'W. Robert Daasch']
What we know after twelve years developing and deploying test data analytics solutions