Traditional scan design techniques such as level-sensitive scan design, scan path, and random-access scan suffer from the drawback that the extra test application effort (which includes both time and memory) required is directly proportional to the number of latches and can become quite significant. A scan design technique termed partial parallel scan which reduces test application effort by one to two orders of magnitude is presented. Theoretical and practical aspects of the design method are discussed. The practical use of the partial parallel scan technique has been demonstrated with an LSI circuit and a VLSI circuit designed using silicon compiler tools. >
['Sunggu Lee', 'Kang G. Shin']
Design for test using partial parallel scan