Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic por consumption. The dynamic por consumed during scan shift operation is much more higher than that of normal mode operation.
['Jaynarayan T. Tudu', 'Erik G. Larsson', 'Virendra Singh', 'Hideo Fujiwara']
I am writing a research paper on a idea Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach
[{"from": "human", "value": "I am writing a research paper on a idea Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic por consumption. The dynamic por consumed during scan shift operation is much more higher than that of normal mode operation."}]