Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Development of nanometer technologies increases demands to logical circuit testability. It is not enough to test stuck-at faults at gate poles of a circuit it is necessary to test multiple stuck-at faults at gate poles along with delay faults of a logical circuit.   show that it is possible to derive the sequential circuit from a transition table of a finite state machine (FSM) which has the short test detecting all multiple stuck-at faults at the gate poles of the sequential circuit, and a delay of each circuit path is detectable. Some structural and test simplifications are suggested.
['Anzhela Matrosova', 'V. V. Andreeva', 'V. Tomkov']
I am writing a research paper on a idea Fully delay and multiple stuck-at faults testable FSM design
[{"from": "human", "value": "I am writing a research paper on a idea Fully delay and multiple stuck-at faults testable FSM design"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Development of nanometer technologies increases demands to logical circuit testability. It is not enough to test stuck-at faults at gate poles of a circuit it is necessary to test multiple stuck-at faults at gate poles along with delay faults of a logical circuit.   show that it is possible to derive the sequential circuit from a transition table of a finite state machine (FSM) which has the short test detecting all multiple stuck-at faults at the gate poles of the sequential circuit, and a delay of each circuit path is detectable. Some structural and test simplifications are suggested."}]