Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern generator (ATPG) and are encoded as linear feedback shift register (LFSR) initial values (seeds); one or more patterns can be encoded into a single LFSR seed. During test application, seeds are loaded into the LFSR with no cycle overhead. The method presented achieves reductions of at least 100x in test data and 10x in tester cycles compared to deterministic ATPG while maintaining complete fault coverage, as confirmed by experimental results on industrial designs.
['Peter Wohl', 'John A. Waicukauski', 'Sanjay Patel', 'Minesh B. Amin']
I am writing a research paper on a idea Efficient compression and application of deterministic patterns in a logic BIST architecture
[{"from": "human", "value": "I am writing a research paper on a idea Efficient compression and application of deterministic patterns in a logic BIST architecture"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern generator (ATPG) and are encoded as linear feedback shift register (LFSR) initial values (seeds); one or more patterns can be encoded into a single LFSR seed. During test application, seeds are loaded into the LFSR with no cycle overhead. The method presented achieves reductions of at least 100x in test data and 10x in tester cycles compared to deterministic ATPG while maintaining complete fault coverage, as confirmed by experimental results on industrial designs."}]