Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  propose a new test generation method for F-scan delay fault testing that uses standard full scan delay fault automatic test pattern generation (ATPG). This method shows that it is possible to generate test patterns fast for F-scannable register-transfer level (RTL) circuits by using currently ll-developed and high-performance commercial ATPG tools for gate-level scan circuits.
['Marie Engelene J. Obien', 'Satoshi Ohtake', 'Hideo Fujiwara']
I am writing a research paper on a idea F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG
[{"from": "human", "value": "I am writing a research paper on a idea F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  propose a new test generation method for F-scan delay fault testing that uses standard full scan delay fault automatic test pattern generation (ATPG). This method shows that it is possible to generate test patterns fast for F-scannable register-transfer level (RTL) circuits by using currently ll-developed and high-performance commercial ATPG tools for gate-level scan circuits."}]