Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: The thermal step method is a non destructive electric charge measurement technique, based on the acquisition of a capacitive current appearing when an insulating structure is crossed by a low amplitude thermal wave. Elements concerning the electrostatic behavior of a metal-oxide-semiconductor structure while crossed by a thermal wave are addressed in the present paper in view of the analysis of data obtained using the thermal step method in MOS capacitors. Applications to experimental data obtained from MOS samples with 120 nm-thick oxides are presented.
['Ludovic Boyer', 'Olivier Fruchier', 'P. Notingher', 'S. Agnel', 'Alain Toureille', 'Bernard Rousset', 'Jean-Louis Sanchez']
I am writing a research paper on a idea Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach
[{"from": "human", "value": "I am writing a research paper on a idea Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: The thermal step method is a non destructive electric charge measurement technique, based on the acquisition of a capacitive current appearing when an insulating structure is crossed by a low amplitude thermal wave. Elements concerning the electrostatic behavior of a metal-oxide-semiconductor structure while crossed by a thermal wave are addressed in the present paper in view of the analysis of data obtained using the thermal step method in MOS capacitors. Applications to experimental data obtained from MOS samples with 120 nm-thick oxides are presented."}]