Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Delay testing and characterization of interposer wires in a 2.5-D stacked IC is essential for yield learning and silicon debug.  addresses this problem by proposing a data analysis flow for perturbation-based oscillation test method to cope with the various wire-lengths of the interposer wires. With the proposed method, one can not only detect small delay faults but also characterize the delay across each fault-free interposer wire.
['Shi-Yu Huang', 'Li-Ren Huang', 'Kun-Han Tsai', 'Wu-Tung Cheng']
I am writing a research paper on a idea Delay testing and characterization of post-bond interposer wires in 2.5-D ICs
[{"from": "human", "value": "I am writing a research paper on a idea Delay testing and characterization of post-bond interposer wires in 2.5-D ICs"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Delay testing and characterization of interposer wires in a 2.5-D stacked IC is essential for yield learning and silicon debug.  addresses this problem by proposing a data analysis flow for perturbation-based oscillation test method to cope with the various wire-lengths of the interposer wires. With the proposed method, one can not only detect small delay faults but also characterize the delay across each fault-free interposer wire."}]