Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Highly reliable embedded systems have been widely applied in the fields of aerospace, nuclear por, high-speed rail, etc., which are related to security and economic development. The reliability of the por supply directly influences the security of the embedded system, and has been the research focus of numerous electronic information and energy studies. The degradation of por modules occupies a dominant position among the key factors affecting the por supply reliability. How to dynamically determine the degradation state and forecast the remaining useful life of working por modules is critical. Therefore, an online non-intrusive method of obtaining the degradation state of MOSFETs based on the Volterra series is proposed. It uses the self-driving signal of MOSFETs as a non-intrusive incentive, and extracts the degradation characteristics of MOSFETs by the frequency-domain kernel of the Volterra series. Experimental results show that the identification achieved by the method agrees ll with the theoretical analysis.
['Lifeng Wu', 'Yu Zheng', 'Yong Guan', 'Guohui Wang', 'Xiaojuan Li']
I am writing a research paper on a idea A Non-Intrusive Method for Monitoring the Degradation of MOSFETs
[{"from": "human", "value": "I am writing a research paper on a idea A Non-Intrusive Method for Monitoring the Degradation of MOSFETs"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Highly reliable embedded systems have been widely applied in the fields of aerospace, nuclear por, high-speed rail, etc., which are related to security and economic development. The reliability of the por supply directly influences the security of the embedded system, and has been the research focus of numerous electronic information and energy studies. The degradation of por modules occupies a dominant position among the key factors affecting the por supply reliability. How to dynamically determine the degradation state and forecast the remaining useful life of working por modules is critical. Therefore, an online non-intrusive method of obtaining the degradation state of MOSFETs based on the Volterra series is proposed. It uses the self-driving signal of MOSFETs as a non-intrusive incentive, and extracts the degradation characteristics of MOSFETs by the frequency-domain kernel of the Volterra series. Experimental results show that the identification achieved by the method agrees ll with the theoretical analysis."}]