Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A novel method to detect a defective IDDQ on top of highbackground current is proposed. Instead of the conventionalapproach that measures the quiescent current drawn by thecircuit-under-test (CUT), the proposed method is based on themeasurement of the voltage drop in a resistor spatially laid-outalong the CUT. Resistive shorts with a defective current of 2.14 mAon top of 83.11 mA of leakage current have been detected in a65nm CMOS test chip with controllable leakage. The proposedmethod also provides facilities to locate the defect in addition to detect it.
['J.M. Rius', 'Luis Elvira Villagra', 'Maurice Meijer']
I am writing a research paper on a idea A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits
[{"from": "human", "value": "I am writing a research paper on a idea A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A novel method to detect a defective IDDQ on top of highbackground current is proposed. Instead of the conventionalapproach that measures the quiescent current drawn by thecircuit-under-test (CUT), the proposed method is based on themeasurement of the voltage drop in a resistor spatially laid-outalong the CUT. Resistive shorts with a defective current of 2.14 mAon top of 83.11 mA of leakage current have been detected in a65nm CMOS test chip with controllable leakage. The proposedmethod also provides facilities to locate the defect in addition to detect it."}]