Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  presents a mixed approach for sequential circuit test pattern generation employing the accuracy of structural algorithms and the speed of a pattern generator working at the functional level. The new strategy selects from the State Transition Graph of a Finite State Machine the appropriate edges that allow a functional test pattern generator (FSMTest) to build test sequences covering 100% of the detectable single stuck-at and gate-delay faults. Experiments and comparisons are presented to justify the proposed test strategy.
['Franco Fummi', 'Donatella Sciuto', 'Micaela Serra']
I am writing a research paper on a idea Test generation for stuck-at and gate-delay faults in sequential circuits: a mixed functional/structural method
[{"from": "human", "value": "I am writing a research paper on a idea Test generation for stuck-at and gate-delay faults in sequential circuits: a mixed functional/structural method"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  presents a mixed approach for sequential circuit test pattern generation employing the accuracy of structural algorithms and the speed of a pattern generator working at the functional level. The new strategy selects from the State Transition Graph of a Finite State Machine the appropriate edges that allow a functional test pattern generator (FSMTest) to build test sequences covering 100% of the detectable single stuck-at and gate-delay faults. Experiments and comparisons are presented to justify the proposed test strategy."}]