Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction beten scan operations and application of primary input vectors. Under this approach, the scan-in, scan-select and scan-out lines are treated as conventional primary inputs or primary outputs of the circuit. As a result, limited scan operations, where scan chains are shifted a number of times smaller than their lengths, are incorporated naturally into the test sequences generated by this approach. This leads to very aggressive compaction, resulting in test sequences with the lost known test application times for benchmark circuits.
['Irith Pomeranz', 'Sudhakar M. Reddy']
I am writing a research paper on a idea A New Approach to Test Generation and Test Compaction for Scan Circuits
[{"from": "human", "value": "I am writing a research paper on a idea A New Approach to Test Generation and Test Compaction for Scan Circuits"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction beten scan operations and application of primary input vectors. Under this approach, the scan-in, scan-select and scan-out lines are treated as conventional primary inputs or primary outputs of the circuit. As a result, limited scan operations, where scan chains are shifted a number of times smaller than their lengths, are incorporated naturally into the test sequences generated by this approach. This leads to very aggressive compaction, resulting in test sequences with the lost known test application times for benchmark circuits."}]