Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  describes the scan test challenges and techniques used in the Godson-3 microprocessor, which is a scalable multicore processor based on the SMOC (Scalable Mesh of Crossbar) on-chip network and targets high-end applications. Advanced techniques are adopted to achieve the scalable, low-por and low-cost scan architecture at the challenge of limited I/O resources and large scale of transistors. To achieve a scalable and flexible test access, a highly elaborate TAM (Test Access Mechanism) is implemented with supporting multiple test instructions and test modes. Taking advantage of multiple cores embedding in the processor, scan partitions are employed to reduce test por and test time, and test compression with more than 10X compression ratio are utilized to decrease the scan chain length. To further decrease test time, a Data-Synchronous-Comparator (DSC) is proposed for comparing the scan responses of the identical cores.
['Zichu Qi', 'Hui Liu', 'Xiangku Li', 'Wang D', 'Yinhe Han', 'Huawei Li', 'Weiwu Hu']
I am writing a research paper on a idea A Scalable Scan Architecture for Godson-3 Multicore Microprocessor
[{"from": "human", "value": "I am writing a research paper on a idea A Scalable Scan Architecture for Godson-3 Multicore Microprocessor"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  describes the scan test challenges and techniques used in the Godson-3 microprocessor, which is a scalable multicore processor based on the SMOC (Scalable Mesh of Crossbar) on-chip network and targets high-end applications. Advanced techniques are adopted to achieve the scalable, low-por and low-cost scan architecture at the challenge of limited I/O resources and large scale of transistors. To achieve a scalable and flexible test access, a highly elaborate TAM (Test Access Mechanism) is implemented with supporting multiple test instructions and test modes. Taking advantage of multiple cores embedding in the processor, scan partitions are employed to reduce test por and test time, and test compression with more than 10X compression ratio are utilized to decrease the scan chain length. To further decrease test time, a Data-Synchronous-Comparator (DSC) is proposed for comparing the scan responses of the identical cores."}]