Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Effects of built-in current sensors on IDDQ measurement as ll as on the performance of circuit under test are considered. Most of the Built-In Current Sensor designs transform the ground terminal of the circuit under test to a virtual ground. This causes increase in both propagation delay as ll as IDDQ sampling time with the increase in the number of gates, affecting both test as ll as operational performance. The effect that current sensor has on the operational and test performance are considered. Circuit partitioning may be used for overcoming the eflects of BICS on IDDQ measurements as ll as on the performance of the circuit under test.
['Sankaran M. Menon', 'Yashwant K. Malaiya', 'Anura P. Jayasumana', 'Carol Q. Tong']
I am writing a research paper on a idea The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance*
[{"from": "human", "value": "I am writing a research paper on a idea The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance*"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Effects of built-in current sensors on IDDQ measurement as ll as on the performance of circuit under test are considered. Most of the Built-In Current Sensor designs transform the ground terminal of the circuit under test to a virtual ground. This causes increase in both propagation delay as ll as IDDQ sampling time with the increase in the number of gates, affecting both test as ll as operational performance. The effect that current sensor has on the operational and test performance are considered. Circuit partitioning may be used for overcoming the eflects of BICS on IDDQ measurements as ll as on the performance of the circuit under test."}]