Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Full scan is a widely accepted design for testability technique for sequential circuits. Hover, the test application time required by full scan could be high because of the necessity to scan in and scan out test vectors. , a hybrid scheme is presented that aims to reduce test application time in circuits with full scan. The proposed scheme exploits the inherent sequential nature of the circuit in conjunction with the additional controllability and observability available through full scan. Also, it is shown that the hybrid scheme has an additional advantage of being suited for testing transition faults. >
['Dhiraj K. Pradhan', 'Jayashree Saxena']
I am writing a research paper on a idea A design for testability scheme to reduce test application time in full scan
[{"from": "human", "value": "I am writing a research paper on a idea A design for testability scheme to reduce test application time in full scan"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Full scan is a widely accepted design for testability technique for sequential circuits. Hover, the test application time required by full scan could be high because of the necessity to scan in and scan out test vectors. , a hybrid scheme is presented that aims to reduce test application time in circuits with full scan. The proposed scheme exploits the inherent sequential nature of the circuit in conjunction with the additional controllability and observability available through full scan. Also, it is shown that the hybrid scheme has an additional advantage of being suited for testing transition faults. >"}]