Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve additional compaction, without compromising fault coverage, beyond what may already be achieved using on-chip response compactors. The method does not add additional logic or modify the circuit under test or require additional tests and thus can be used with any design including legacy designs. In this work,  enhance this method so that the level of diagnostic resolution achieved without it can be maintained. Experimental results on larger ISCAS-89 show that additional test response compaction can be achieved while diagnostic resolution for single and double stuck-at faults is not adversely impacted by the procedure.
['Jeanne Howard', 'Sudhakar M. Reddy', 'Irith Pomeranz', 'Bernd Becker']
I am writing a research paper on a idea Fault diagnosis aware ATE assisted test response compaction
[{"from": "human", "value": "I am writing a research paper on a idea Fault diagnosis aware ATE assisted test response compaction"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve additional compaction, without compromising fault coverage, beyond what may already be achieved using on-chip response compactors. The method does not add additional logic or modify the circuit under test or require additional tests and thus can be used with any design including legacy designs. In this work,  enhance this method so that the level of diagnostic resolution achieved without it can be maintained. Experimental results on larger ISCAS-89 show that additional test response compaction can be achieved while diagnostic resolution for single and double stuck-at faults is not adversely impacted by the procedure."}]