Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: With processors and system-on-chips using nano-meter technologies, several design and test efforts have been recently developed to eliminate and test for many emerging DSM (deep sub-micron) noise effects. ,  show the emergence of multi-source noise effects, where multiple DSM noise sources combine to produce functional and timing errors even when each separate noise source itself does not.  show the dynamic nature of multi-source noise, and the need for on-line testing to detect such noise errors.  propose a double-sampling data checking based low-cost on-line error detection circuit to test for such noise effects in on-chip buses. Based on the proposed circuit, an effective and efficient testing methodology has been developed to facilitate online testing for generic on-chip buses. The applicability of this methodology is demonstrated through embedding the on-line detection circuit in a bus design. The validated design shows the effectiveness of the proposed testing methodology for multi-source noise-induced errors in global interconnects and buses.
['Yi Zhao', 'Li Chen', 'Sujit Dey']
I am writing a research paper on a idea On-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips
[{"from": "human", "value": "I am writing a research paper on a idea On-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: With processors and system-on-chips using nano-meter technologies, several design and test efforts have been recently developed to eliminate and test for many emerging DSM (deep sub-micron) noise effects. ,  show the emergence of multi-source noise effects, where multiple DSM noise sources combine to produce functional and timing errors even when each separate noise source itself does not.  show the dynamic nature of multi-source noise, and the need for on-line testing to detect such noise errors.  propose a double-sampling data checking based low-cost on-line error detection circuit to test for such noise effects in on-chip buses. Based on the proposed circuit, an effective and efficient testing methodology has been developed to facilitate online testing for generic on-chip buses. The applicability of this methodology is demonstrated through embedding the on-line detection circuit in a bus design. The validated design shows the effectiveness of the proposed testing methodology for multi-source noise-induced errors in global interconnects and buses."}]