Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: , a general solution of calibrating a microwave test fixture for a symmetric device is deduced from the cascading network relation, and it exposes the probability and condition of calibrating an arbitrary test fixture for a symmetric device by three measurements, which is less than the times of measurements in the thru-reflect-line (TRL) method. The scattering parameters of the test fixture and the embedded symmetric device can be determined by measurements of a thru, a line, and the symmetric device. Furthermore, the method is analyzed and verified by simulation and measurement. The analysis indicates that the presented method is suitable for determining the calibrated  S -parameters of a symmetric device under test (DUT).
['Runbo Ma', 'Guorui Han', 'Xinwei Chen', 'Wenmei Zhang']
I am writing a research paper on a idea Calibrating an Arbitrary Test Fixture for a Symmetric Device by Three Measurements
[{"from": "human", "value": "I am writing a research paper on a idea Calibrating an Arbitrary Test Fixture for a Symmetric Device by Three Measurements"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: , a general solution of calibrating a microwave test fixture for a symmetric device is deduced from the cascading network relation, and it exposes the probability and condition of calibrating an arbitrary test fixture for a symmetric device by three measurements, which is less than the times of measurements in the thru-reflect-line (TRL) method. The scattering parameters of the test fixture and the embedded symmetric device can be determined by measurements of a thru, a line, and the symmetric device. Furthermore, the method is analyzed and verified by simulation and measurement. The analysis indicates that the presented method is suitable for determining the calibrated  S -parameters of a symmetric device under test (DUT)."}]