Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Inserting scan chain into the circuit alongside the combinational automatic test pattern generation (ATPG) is the most commonly used test technique for digital circuits. Since por dissipation in test mode is generally much higher than in the functional mode, some considerations should be made during ATPG.  presents a probabilistic and constraint based approach for scan-based low por test generation. This ATPG exploits signal probability analysis to estimate fault detection probability as ll as signal transition activities to guide test generation process. The effectiveness of the proposed approach has been evaluated by applying it to ISCAS85 and ISCAS89 benchmarks with three different por constraints, including propagation, capture, and shift.
['Hossein Sabaghian-Bidgoli', 'Majid Namaki-Shoushtari', 'Zainalabedin Navabi']
I am writing a research paper on a idea A Probabilistic and Constraint Based Approach for Low Power Test Generation
[{"from": "human", "value": "I am writing a research paper on a idea A Probabilistic and Constraint Based Approach for Low Power Test Generation"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Inserting scan chain into the circuit alongside the combinational automatic test pattern generation (ATPG) is the most commonly used test technique for digital circuits. Since por dissipation in test mode is generally much higher than in the functional mode, some considerations should be made during ATPG.  presents a probabilistic and constraint based approach for scan-based low por test generation. This ATPG exploits signal probability analysis to estimate fault detection probability as ll as signal transition activities to guide test generation process. The effectiveness of the proposed approach has been evaluated by applying it to ISCAS85 and ISCAS89 benchmarks with three different por constraints, including propagation, capture, and shift."}]