Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A previous hierarchical fault tracing method for combinational circuits which requires only CAD layout data in the CAD-linked electron beam test system is expanded as applicable to sequential circuits. The characteristics in the method remain unchanged that allow us to trace a fault hierarchically from the top level cell to the lost primitive cell and from the primitive cell to the transistor-level circuit in a consistent manner independently of circuit functions. The applied results of the CAD layouts of some sequential CMOS benchmark circuits show its superiority to the guided-probe method where circuit logical functions are first extracted from the CAD layout data and then the guided-probe testing is executed.
['Katsuyoshi Miura', 'Koji Nakamae', 'Hiromu Fujioka']
I am writing a research paper on a idea Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system
[{"from": "human", "value": "I am writing a research paper on a idea Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A previous hierarchical fault tracing method for combinational circuits which requires only CAD layout data in the CAD-linked electron beam test system is expanded as applicable to sequential circuits. The characteristics in the method remain unchanged that allow us to trace a fault hierarchically from the top level cell to the lost primitive cell and from the primitive cell to the transistor-level circuit in a consistent manner independently of circuit functions. The applied results of the CAD layouts of some sequential CMOS benchmark circuits show its superiority to the guided-probe method where circuit logical functions are first extracted from the CAD layout data and then the guided-probe testing is executed."}]