Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  present a new approach for Field Programmable Gate Array (FPGA) testing that exploits the reprogrammability of FPGAs to create Built-In Self-Test (BIST) logic only during off-line test. As a result, BIST is achieved without any area overhead or performance penalties to the system function implemented by the FPGA. Our approach is applicable to all levels of testing, achieves maximal fault coverage, and all tests are applied at-speed.  describe the BIST architecture used to test all the programmable logic blocks in an FPGA and the configurations required to implement our approach using a commercial FPGA.  also discuss implementation problems caused by CAD tool limitations and limited architectural resources, and  describe techniques which overcome these limitations.
['Charles E. Stroud', 'Srinivasa Konala', 'Ping Chen', 'Miron Abramovici']
I am writing a research paper on a idea Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)
[{"from": "human", "value": "I am writing a research paper on a idea Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  present a new approach for Field Programmable Gate Array (FPGA) testing that exploits the reprogrammability of FPGAs to create Built-In Self-Test (BIST) logic only during off-line test. As a result, BIST is achieved without any area overhead or performance penalties to the system function implemented by the FPGA. Our approach is applicable to all levels of testing, achieves maximal fault coverage, and all tests are applied at-speed.  describe the BIST architecture used to test all the programmable logic blocks in an FPGA and the configurations required to implement our approach using a commercial FPGA.  also discuss implementation problems caused by CAD tool limitations and limited architectural resources, and  describe techniques which overcome these limitations."}]