Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: ,  study the impact of recent scaling trends on device degradation effects as ll as their impact on microarchitecture. A new binning strategy is proposed that takes into account the individual degradation of the processing nodes. The vitality of each processing node is derived from its duty- cycle. By means of random sampling and statistical analysis, the duty-cycle is captured in a resource and time efficient way so that it is feasible to observe more than 100 processing nodes with a single sampling unit. Applications of this kind of degradation handling can primarily be found where conventional reliability verification and life-test acceleration techniques such as burn-in cannot be used anymore due to their complexity and inherent constraints.
['Peter Glösekötter', 'Ulrich Greveler', 'Gilson Inacio Wirth']
I am writing a research paper on a idea Device degradation and resilient computing
[{"from": "human", "value": "I am writing a research paper on a idea Device degradation and resilient computing"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: ,  study the impact of recent scaling trends on device degradation effects as ll as their impact on microarchitecture. A new binning strategy is proposed that takes into account the individual degradation of the processing nodes. The vitality of each processing node is derived from its duty- cycle. By means of random sampling and statistical analysis, the duty-cycle is captured in a resource and time efficient way so that it is feasible to observe more than 100 processing nodes with a single sampling unit. Applications of this kind of degradation handling can primarily be found where conventional reliability verification and life-test acceleration techniques such as burn-in cannot be used anymore due to their complexity and inherent constraints."}]