Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: The small delay defects testing has two challenges. One is that the longest testable path selection for every target fault in ATPG consumes much CPU time. The other is the test data volume are very large. ,  propose two strategies to resolve these two problems. A new path selection in advance scheme is proposed to accelerate ATPG. It aims to find fer paths and cover more faults in advance, which is different from the previous works. To reduce the test data volume,  propose a novel scan-based test scheme.  partition the scan flip-flops into some scan chains. The first scan flip-flop of every scan chain works in enhanced scan mode. And other scan flip-flops work in broad-side mode. This can significantly increase the don't care bits of every test pattern and provide more room for test compaction. Then the test pattern count can be reduced significantly. Experimental results show the efficiency of these techniques.
['Boxue Yin', 'Dong Xiang', 'Zhen Chen']
I am writing a research paper on a idea New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets
[{"from": "human", "value": "I am writing a research paper on a idea New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: The small delay defects testing has two challenges. One is that the longest testable path selection for every target fault in ATPG consumes much CPU time. The other is the test data volume are very large. ,  propose two strategies to resolve these two problems. A new path selection in advance scheme is proposed to accelerate ATPG. It aims to find fer paths and cover more faults in advance, which is different from the previous works. To reduce the test data volume,  propose a novel scan-based test scheme.  partition the scan flip-flops into some scan chains. The first scan flip-flop of every scan chain works in enhanced scan mode. And other scan flip-flops work in broad-side mode. This can significantly increase the don't care bits of every test pattern and provide more room for test compaction. Then the test pattern count can be reduced significantly. Experimental results show the efficiency of these techniques."}]