Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Transient signal analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. , the por supply transient signals from simulation experiments on an 8-bit multiplier are analyzed at multiple test points in both the time and frequency domain. Linear regression analysis is used to separate and identify the signal variations introduced by defects and those introduced by process variation. Defects re introduced into the simulation model by adding material (shorts) or removing material (opens) from the layout. 246 circuit models re created and 1440 simulations performed on defect-free, bridging defective and open defective circuits in which process variation was modeled by varying circuit and transistor parameters within a range of /spl plusmn/25% of the nominal parameters. The results of the analysis show that it is possible to distinguish beten defect-free and defective devices with injected process variation.
['Amy Germida', 'James F. Plusquellic']
I am writing a research paper on a idea Detection of CMOS defects under variable processing conditions
[{"from": "human", "value": "I am writing a research paper on a idea Detection of CMOS defects under variable processing conditions"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: Transient signal analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. , the por supply transient signals from simulation experiments on an 8-bit multiplier are analyzed at multiple test points in both the time and frequency domain. Linear regression analysis is used to separate and identify the signal variations introduced by defects and those introduced by process variation. Defects re introduced into the simulation model by adding material (shorts) or removing material (opens) from the layout. 246 circuit models re created and 1440 simulations performed on defect-free, bridging defective and open defective circuits in which process variation was modeled by varying circuit and transistor parameters within a range of /spl plusmn/25% of the nominal parameters. The results of the analysis show that it is possible to distinguish beten defect-free and defective devices with injected process variation."}]