Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults.  propose a novel solution that uses linear algebraic concepts to partition the vector space of tests into subspaces (clusters). A subspace is defined by a compact set of basis vectors.  give an algorithm to compute sets of basis vectors defining the clusters.  also describe a low-cost logic circuit based on Gray codes that reproduces the subspaces from these basis vectors. Experimental results are presented which show that this approach reduces on-chip hardware overhead and test application time, while also guaranteeing full fault coverage.
['R. Das', 'Igor L. Markov', 'John P. Hayes']
I am writing a research paper on a idea On-Chip Test Generation Using Linear Subspaces
[{"from": "human", "value": "I am writing a research paper on a idea On-Chip Test Generation Using Linear Subspaces"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults.  propose a novel solution that uses linear algebraic concepts to partition the vector space of tests into subspaces (clusters). A subspace is defined by a compact set of basis vectors.  give an algorithm to compute sets of basis vectors defining the clusters.  also describe a low-cost logic circuit based on Gray codes that reproduces the subspaces from these basis vectors. Experimental results are presented which show that this approach reduces on-chip hardware overhead and test application time, while also guaranteeing full fault coverage."}]