Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: First-in First-Out memories are becoming increasingly popular as buffer storage beten subsystems operating at different data rates. One common way to implement a FIFO is to use a dual-port SRAM memory with a ring-address mechanism consisting of an n-bit shift register (n is the number of words in the FIFO). This saves the address decoder circuitry and allows for higher speed operation, which makes this type of FIFO very popular, especially for embedded applications. The ll known functional tests for SRAMs can not be applied to FIFOs because of their built-in access restrictions. Functional fault models and functional tests for Ring-Address Type FIFOs have not been studied and reported before; this paper aims at filling in this gap. It introduces functional fault models and presents a set of tests for Ring-Address Type FIFOs. >
['A. J. van de Goor', 'Ivo Schanstra', 'Y. Zorian']
I am writing a research paper on a idea Fault models and tests for Ring Address Type FIFOs
[{"from": "human", "value": "I am writing a research paper on a idea Fault models and tests for Ring Address Type FIFOs"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: First-in First-Out memories are becoming increasingly popular as buffer storage beten subsystems operating at different data rates. One common way to implement a FIFO is to use a dual-port SRAM memory with a ring-address mechanism consisting of an n-bit shift register (n is the number of words in the FIFO). This saves the address decoder circuitry and allows for higher speed operation, which makes this type of FIFO very popular, especially for embedded applications. The ll known functional tests for SRAMs can not be applied to FIFOs because of their built-in access restrictions. Functional fault models and functional tests for Ring-Address Type FIFOs have not been studied and reported before; this paper aims at filling in this gap. It introduces functional fault models and presents a set of tests for Ring-Address Type FIFOs. >"}]