Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  describes a program which generates test patterns for scan design circuits with tri-state modules and bidirectional terminals. The test generation procedure uses a path sensitization technique with 14 signal values. The principal features of this program are test generation with automatic decision of I/O mode of bidirectional terminals, generation of test sets for high impedance state, and generation of test sets for system clock control circuits of shift register latches (SRLs) by using shift-in function of SRLs.
['Takuji Ogihara', 'Shinichi Murai', 'Yuzo Takamatsu', 'Kozo Kinoshita', 'Hideo Fujiwara']
I am writing a research paper on a idea Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals
[{"from": "human", "value": "I am writing a research paper on a idea Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  describes a program which generates test patterns for scan design circuits with tri-state modules and bidirectional terminals. The test generation procedure uses a path sensitization technique with 14 signal values. The principal features of this program are test generation with automatic decision of I/O mode of bidirectional terminals, generation of test sets for high impedance state, and generation of test sets for system clock control circuits of shift register latches (SRLs) by using shift-in function of SRLs."}]