Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: In many designs asynchronous inputs are used to set and/or reset flip-flops. Considering a scan cell implementation used in an industrial design  show that stuck-open faults in some transistors driven by asynchronous inputs require two new flush tests. Such faults, if left undetected, cause functional failures. The two new tests increase the overall stuck-open fault coverage of each scan cell by approximately 5%. This will significantly improve the overall test quality due to the large number of scan cells contained in large industrial designs.
['Fan Yang', 'Sreejit Chakravarty', 'Narendra Devta-Prasanna', 'Sudhakar M. Reddy', 'Irith Pomeranz']
I am writing a research paper on a idea Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells
[{"from": "human", "value": "I am writing a research paper on a idea Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: In many designs asynchronous inputs are used to set and/or reset flip-flops. Considering a scan cell implementation used in an industrial design  show that stuck-open faults in some transistors driven by asynchronous inputs require two new flush tests. Such faults, if left undetected, cause functional failures. The two new tests increase the overall stuck-open fault coverage of each scan cell by approximately 5%. This will significantly improve the overall test quality due to the large number of scan cells contained in large industrial designs."}]