Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  presents a method using only the rank of the measurements to separate a part's elevated response to parametric tests from its non-elevated response. The effectiveness of the proposed method is verified on the 130nm ASIC. Good die responses are correlated for same parametric tests at different conditions such as temperature, voltage and or other stress. Nonparametric correlation methods are used to calculate the intra-die correlation. When intra-die correlation is found to be low the elevated vectors that lor correlation are extracted and input to IDDQ-based diagnostic tools. Monte-Carlo simulations are described to obtain confidence bounds of the correlation for good die test response.
['R. Gudavalli', 'W.R. Daasch', 'Phil Nigh', 'Doug Heaberlin']
I am writing a research paper on a idea Application of non-parametric statistics of the parametric response for defect diagnosis
[{"from": "human", "value": "I am writing a research paper on a idea Application of non-parametric statistics of the parametric response for defect diagnosis"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  presents a method using only the rank of the measurements to separate a part's elevated response to parametric tests from its non-elevated response. The effectiveness of the proposed method is verified on the 130nm ASIC. Good die responses are correlated for same parametric tests at different conditions such as temperature, voltage and or other stress. Nonparametric correlation methods are used to calculate the intra-die correlation. When intra-die correlation is found to be low the elevated vectors that lor correlation are extracted and input to IDDQ-based diagnostic tools. Monte-Carlo simulations are described to obtain confidence bounds of the correlation for good die test response."}]