Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  present a complete top-down design of a low-por multi-channel clock recovery circuit based on gated current-controlled oscillators. The flow includes several tools and methods used to specify block constraints, to design and verify the topology down to the transistor level, as ll as to achieve a por consumption as low as 5 mW/Gbit/s. Statistical simulation is used to estimate the achievable bit error rate in the presence of phase and frequency errors and to prove the feasibility of the concept. VHDL modeling provides extensive verification of the topology. Thermal noise modeling based on ll-known concepts delivers design parameters for the device sizing and biasing.  present two practical examples of possible design improvements analyzed and implemented with this methodology.
['Paul Muller', 'Armin Tajalli', 'M. Atarodi', 'Yusuf Leblebici']
I am writing a research paper on a idea Top-Down Design of a Low-Power Multi-Channel 2.5-Gbit/s/Channel Gated Oscillator Clock-Recovery Circuit
[{"from": "human", "value": "I am writing a research paper on a idea Top-Down Design of a Low-Power Multi-Channel 2.5-Gbit/s/Channel Gated Oscillator Clock-Recovery Circuit"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  present a complete top-down design of a low-por multi-channel clock recovery circuit based on gated current-controlled oscillators. The flow includes several tools and methods used to specify block constraints, to design and verify the topology down to the transistor level, as ll as to achieve a por consumption as low as 5 mW/Gbit/s. Statistical simulation is used to estimate the achievable bit error rate in the presence of phase and frequency errors and to prove the feasibility of the concept. VHDL modeling provides extensive verification of the topology. Thermal noise modeling based on ll-known concepts delivers design parameters for the device sizing and biasing.  present two practical examples of possible design improvements analyzed and implemented with this methodology."}]