Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test vector information and enables location identification of single stuck-at faults to a neighborhood of a few gates through set operations on small pass/fail dictionaries. The proposed scheme is applicable to multiple stuck-at faults and bridging faults as ll. The practical applicability of the suggested ideas is confirmed through numerous experimental runs on all three fault models.
['Ismet Bayraktaroglu', 'Alex Orailoglu']
I am writing a research paper on a idea Gate Level Fault Diagnosis in Scan-Based BIST
[{"from": "human", "value": "I am writing a research paper on a idea Gate Level Fault Diagnosis in Scan-Based BIST"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test vector information and enables location identification of single stuck-at faults to a neighborhood of a few gates through set operations on small pass/fail dictionaries. The proposed scheme is applicable to multiple stuck-at faults and bridging faults as ll. The practical applicability of the suggested ideas is confirmed through numerous experimental runs on all three fault models."}]