Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A novel test pattern generation method for asynchronous circuits is described and evaluated in detail. The method combines conventional pattern generation with hazard-free state initialization. Any type of asynchronous circuit can be processed, and all stuck-at faults, even those inside state-holding elements, such as C-elements, are considered. The results on some of the largest benchmarks ever used for asynchronous circuit testing show fault coverage on the order of 99% with no area overhead for (quasi-)delay-insensitive datapath circuits.
['Aristides Efthymiou']
I am writing a research paper on a idea Initialization-Based Test Pattern Generation for Asynchronous Circuits
[{"from": "human", "value": "I am writing a research paper on a idea Initialization-Based Test Pattern Generation for Asynchronous Circuits"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: A novel test pattern generation method for asynchronous circuits is described and evaluated in detail. The method combines conventional pattern generation with hazard-free state initialization. Any type of asynchronous circuit can be processed, and all stuck-at faults, even those inside state-holding elements, such as C-elements, are considered. The results on some of the largest benchmarks ever used for asynchronous circuit testing show fault coverage on the order of 99% with no area overhead for (quasi-)delay-insensitive datapath circuits."}]