Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  proposes an efficient method to predict the worst case of voltage violation by multi-domain clock gating in a three-dimensional (3D) on-chip por network considering leakage current.  first describe the 3D Por Distribution Network (PDN) structure which includes on-chip inductance and through-silicon-vias (TSV). The analysis flow using a superposition technique will be introduced later on. Then,  propose a general model to identify the worst-case gating pattern and the maximum variation area with arbitrary leakage current. For low por wireless chips,  introduce another simplified model, which treats the leakage to be a DC current.  formulate these two models with integer linear programming (ILP). The ILP based method is significantly faster than a conventional method based on enumeration. The experimental results also show that the noise contributed by leakage current is not negligible.
['Wanping Zhang', 'Wenjian Yu', 'Xiang Hu', 'Amirali Shayan', 'A. Ege Engin', 'Chung-Kuan Cheng']
I am writing a research paper on a idea Predicting the worst-case voltage violation in a 3D power network
[{"from": "human", "value": "I am writing a research paper on a idea Predicting the worst-case voltage violation in a 3D power network"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely:  proposes an efficient method to predict the worst case of voltage violation by multi-domain clock gating in a three-dimensional (3D) on-chip por network considering leakage current.  first describe the 3D Por Distribution Network (PDN) structure which includes on-chip inductance and through-silicon-vias (TSV). The analysis flow using a superposition technique will be introduced later on. Then,  propose a general model to identify the worst-case gating pattern and the maximum variation area with arbitrary leakage current. For low por wireless chips,  introduce another simplified model, which treats the leakage to be a DC current.  formulate these two models with integer linear programming (ILP). The ILP based method is significantly faster than a conventional method based on enumeration. The experimental results also show that the noise contributed by leakage current is not negligible."}]