Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: In nanotechnology domain, reliability is a fundamental concern in the design and manufacturing process of VLSI circuits. Thus, this paper presents a tool developed to evaluate the reliability of logic cells in order to provide a set of information to improve design robustness. The tool is able to evaluate logic cells under Single Event Transient (SET) faults and, also, permanent faults such as Stuck-On (SOnF) and Stuck-Open (SOF). The information produced by this tool help designers to choose the most reliable cells to be adopted in their designs.
['Y. Q. de Aguiar', 'Alexandra L. Zimpeck', 'Cristina Meinhardt', 'Ricardo Reis']
I am writing a research paper on a idea Permanent and single event transient faults reliability evaluation EDA tool
[{"from": "human", "value": "I am writing a research paper on a idea Permanent and single event transient faults reliability evaluation EDA tool"}, {"from": "gpt", "value": "Thats a unique idea.You should consider the following idea to enhance your idea so that it would impact uniquely: In nanotechnology domain, reliability is a fundamental concern in the design and manufacturing process of VLSI circuits. Thus, this paper presents a tool developed to evaluate the reliability of logic cells in order to provide a set of information to improve design robustness. The tool is able to evaluate logic cells under Single Event Transient (SET) faults and, also, permanent faults such as Stuck-On (SOnF) and Stuck-Open (SOF). The information produced by this tool help designers to choose the most reliable cells to be adopted in their designs."}]