Using of matrix or surface assisted laser desorption/ionization mass spectrometry in combination with thin layer chromatography for the analysis g- and п-telluranes
The aim of this work is to study the possibility of using matrix or surface assisted laser desorption/ionization mass spectrometry for analysis of σ- and π-telluranes in combination with thin layer chromatography. We present mass spectra of some organic tellurium compounds. It is shown that organic tellurium fragments can be easily determined, due to the characteristic isotopic distributions of an atom of tellurium, even against the backdrop of high-intensity spectrum plates for TLC and the products of transformation.