Fractal geometry application for quality control of afm operation
Methods of atom-force microscopy (AFM) gain the increasing application in research problems of nanoobjects and nanostructures. Used approaches allow to obtain a map of properties of a surface with the high permission. For many measurements a question of principle about redundancy of spent measurements and possibility quality management of the obtained information. In the given work on the basis of methods fractal geometry, on an example of one-dimensional dependences, control methods quality and accuracy of a obtained information file on the basis of АСМ measurements are offered.