ELECTRONICS RELIABILITY FORECASTING ON THE BASIS OF THERMOPHYSICAL MODELING
The article draws the attention to the fact that one of the most important factors defining electronics reliability is the temperature. Rather frequently, for thermal conditions calculating lumped parameter mathematical models are used which provide low accuracy. Now there are many multidimensional mathematical models, with a greater degree of adequacy describing thermal transfer processes in electronics. The paper analyzes electronics elements reliability with the use of the modern theory of reliability and methods of multidimensional mathematical temperature fields modelling. It presents a comparison of reliability parameters of the typical received on the basis of extensional temperature fields and average temperature range of fuel elements.