Evaluation of the effect of the trace elements on the reliability of the project in the field-programmable gate array basis
In this article, the evaluation of the effect of the trace elements on the reliability of the design of the combinational circuit in the field-programmable gate array (FPGA) basis is researched. An evaluation of the reliability of combinational circuits in the basis of three-input FPGA cells, as well as three-input FPGA cells, taking into account the trace elements, is given. Proposed methods for evaluate the reliability of the project at various stages of the development of fault-tolerance projects in the FPGA basis. The use of these methods allows the design of combinational circuits of increased reliability in the basis of reconfigurable integrated circuits without built-in reliability features.