INCREASE A ACCURACY OF THE NANOOBJECTS IMAGES COORDINATE BINDING BY MEANS OF SIZE AND ROTATION ANGLE DESCRIPTORS OF SPECIAL POINTS
The usage of the surface curvature detector for a coordinate binding of the overlapped images is considered in the article. the mutual shift and turn of images are chosen as parameters of a coordinate binding. The coordinate binding is carried out by method of images statistical differentiation with use of special points similar couples. It is offered to use surface convex areas (areas with high curvature) as special points. Processing of the image by the surface curvature detector and allocation of images special points is described. In the article the spherical detector is used for this purpose. The sliding detector-sphere cuts out a certain volume of the surface relief. The curvature at a surface point was defined by the radius of the sphere approximating a cut-out relief. The algorithm of images coordinate binding based on calculation of shift and an angle of rotation of similar segment, formed by special points on overlapped images, is presented. It is shown that segment similarity definition based only lengths equality can lead to error of images coordinate binding. The reason and method of this error detection are described. It is established that with high density of special points the main contribution to the error is made by similar short segments with nonzero rotation angles. It is offered to increase informational content of the special points segments description by means of surface curvature indicator at the segments terminal points. Besides, it is offered to exclude from consideration segments with nonzero rotation angles, if images are received after the sample orthogonal shift of microscope. Results of image coordinate binding algorithm with the increased informational description of special points are presented. It is shown that additional parameters: special points sizes and rotation angles of points segments allow to eliminate the errors brought by short couples of special points. Additional parameters of a descriptor can be entered both separately, and together. At the same time the rotation angles parameter is applied, when sample is shifted by means of a orthogonally - located drive.