MEMORY DEVICE AUTOMATED DISCRETE DIAGNOSTIC TEST DESIGN
The methods and tools of high-performance memory device automated diagnostic test are suggested. The device program model is required for designing the algorithms and test program to reduce work. The scientific foundation of mathematical tools for designing high-performance memory device diagnostic tools are presented as well. The set of code address microoperations is defined for multiprocessor testing tools. Oriented graphs’ incidence matrix transformation, executed by program Transfor.exe, is used to parallelize the code address microoperations for reducing work of designing tests and error frequency. The new symbol notation of algorithm operations is suggested to eliminate verbal description of operations. Code address microoperations paralleling for four address drivers testing tool is done. The example of using the suggested method for designing testing algorithm march_Y is presented.