Simulation of random processes to improve the reliability of measuring instruments
Changes and quantitative growth in the characteristics and number of measuring devices forces changes in environmental control methods. Building new models for measuring de-vices changes the nature of the work performed on measurement to a simpler one. In this paper, we consider an approach for obtaining new instrument models in the framework of complex instrument systems. The approach is based on the use ofIto processes, which are used for statistical evaluation of the descriptive characteristics of measuring devices.