Topological Approach to Increase Reliability of DICE Flip-Flop Triggers to Single Event Effects
The up-to-date systems of space communications, navigation, etc require the development of the electronic component base. The application of the reliability increase methods results in degradation of the efficiency, power consumption and area. The heavy charged particles, passing through the semiconductor material, ionize it, generating huge volume of electron-hole pairs. Further, the particles can be captured by the electric field and can induce a voltage pulse on the information lines. In this study this pulse can lead to the data distortion and the functioning failures. To reduce the impact of single events the specialized cells, permitting to keep the data, even under a heavy ion hit, are used. Such cells are based on multiplying the data for their further recovery after the impact. The major problem is the simultaneous impact of the heavy charged particles upon several copies of the data. The analysis of the sensing modes of the DICE based latch with an asynchronous reset signal has been performed. The method for selection of the sets of sensitive nodes, the mutual position of which affects the reliability of the latch to a single ion hit, has been shown. Based on this method a topological view of the trigger cell has been developed. The minimum distance between the sensitive nodes of the produced cell is more than 4.5 times longer than that one of its standard analog. An increase in the area of obtained DICE based flip-flop trigger with an asynchronous reset was only 8%.