Phase Analysis of Electrodeposited Cu-Zn-Sn Precursors for Solar Cells Based Cu<sub>2</sub>ZnSnSe<sub>4</sub>
Cu-Zn-Sn (CZТ) precursors films on the substrates of Mo and Ta foil were electrochemically deposited. X-ray diffraction analysis was used to determine the phase composition of the as-deposited precursors films. It has been determined that in both cases as-deposited CZT films contains the following phases: -Cu5Zn8, -CuZn5, Cu, Sn and Zn.The hexagonal -Cu6.26Sn5 phase was detected in CZT precursor deposited on the Ta substrate.