14513
Time - of - flight secondary ion mass spectrometry ( TOF - SIMS ) and atomic force microscopy ( AFM ) are employed to characterize a wedge - shaped crater eroded by a 40 keV C ( 60 ) ( + ) cluster ion beam on an organic thin film of 402 nm of barium arachidate ( AA ) multilayers prepared by the Langmuir - Blodgett ( LB ) technique .
 Chemical: C ( 60 ) ( + ); Chemical: barium arachidate
Please list all entity words in the text that fit the category.Output format is "type1: word1; type2: word2". 
Option: Chemical 
Text: {0} 
Answer:
 Chemical: C ( 60 ) ( + ); Chemical: barium arachidate