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Individual grain geometric properties evaluated using electron back scatter diffraction at different points in the build were well fit by a three-parameter Weibull cumulative distribution function , yet sufficiently different from averaged values .
 concept or principle: grain; concept or principle: properties; enabling technology: electron back scatter diffraction; process parameter: build; concept or principle: fit; concept or principle: distribution
Please list all entity words in the text that fit the category.Output format is "type1: word1; type2: word2". 
Option: manufacturing standard, machanical property, manufacturing process, material, engineering feature, process parameter, machine or equipment, application, process characterization, enabling technology, biomedical, concept or principle 
Text: {0} 
Answer:
 concept or principle: grain; concept or principle: properties; enabling technology: electron back scatter diffraction; process parameter: build; concept or principle: fit; concept or principle: distribution