4457
Subsequent FFF over the post-IPL conductive pattern causes a non-monotonic change in resistivity , surprisingly effecting a resistivity reduction down to 11.8 μΩ-cm .
 FFF, pattern, resistivity, resistivity, reduction
Please list all entity words in the text that fit the category. Output format is "word1, word2". 
Option: manufacturing standard, machanical property, manufacturing process, material, engineering feature, process parameter, machine or equipment, application, process characterization, enabling technology, biomedical, concept or principle 
Text: {0} 
Answer:
 FFF, pattern, resistivity, resistivity, reduction