2619259
A new gate delay model for simultaneous switching and its applications
<par.We present a new model to capture the delay phenomena associ-ated with simultaneous to-controlling transitions. The proposed delay model accurately captures the effect of the targeted delay phe-nomena over a wide range of transition times and skews. It also cap-tures the effects of more variables than table lookup methods can handle. The model helps improve the accuracy of static timing anal-ysis, incremental timing refinement, and timing-based ATPG.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
29287365
Duality relations for queues with arrival and service control
We consider finite buffered queues with service or arrival control. In the case of service control, service may be stopped and restarted depending on the queue length. In the case of arrival control, the arrival stream can be turned off and on or arrivals may be rejected depending on the queue length. We give duality relations for various systems with arrival and service control that enables us to relate their stationary queue length distributions. We use physical coupling arguments which imply the stochastic coupling necessary to relate the queue lengths. We also discuss special cases for which queue length relationships can be obtained by analyzing the underlying Markov process. Two examples are provided to demonstrate the application of the duality property. The first example is a case where the existing queue length distribution for a given model can be used to obtain the queue length distribution of another model. In the second example, we obtain the previously unknown queue length distributions for two related models at once.
1274772
Supporting persistent social groups in ubiquitous computing environments using context-aware ephemeral group service
We analyze the role of the social group in a ubiquitous computing (Ubicomp) environment as a source of contextual information. A model is presented to address the social group member's perceptions of how devices in a ubicomp environment should aid them in collaboration. Based on the model a distributed context-aware group membership management scheme is developed. We then present a prototype implementation for a context-aware ephemeral group membership management scheme, along with a sample application, and experimental results that demonstrate the feasibility of our system.
13275430
Synthesizing Efficient Out-of-Core Programs for Block Recursive Algorithms Using Block-Cyclic Data Distributions
In this paper, we present a framework for synthesizing I/O efficient out-of-core programs for block recursive algorithms, such as the fast Fourier transform (FFT) and block matrix transposition algorithms. Our framework uses an algebraic representation which is based on tensor products and other matrix operations. The programs are optimized for the striped Vitter and Shriver's two-level memory model in which data can be distributed using various cyclic(B) distributions in contrast to the normally used physical track distribution cyclic(B/sub d/), where B/sub d/ is the physical disk block size. We first introduce tensor bases to capture the semantics of block-cyclic data distributions of out-of-core data and also data access patterns to out-of-core data. We then present program generation techniques for tensor products and matrix transposition. We accurately represent the number of parallel I/O operations required for the synthesized programs for tensor products and matrix transposition as a function of tensor bases and data distributions. We introduce an algorithm to determine the data distribution which optimizes the performance of the synthesized programs. Further, we formalize the procedure of synthesizing efficient out-of-core programs for tensor product formulas with various block-cyclic distributions as a dynamic programming problem. We demonstrate the effectiveness of our approach through several examples. We show that the choice of an appropriate data distribution can reduce the number of passes to access out-of-core data by as large as eight times for a tensor product and the dynamic programming approach can largely reduce the number of passes to access out-of-core data for the overall tensor product formulas.
6969070
Micro planning for mechanical assembly operations
Significant advances have been made in the area of macro-planning for assembly operations (i.e.,, dividing a product into sub-assemblies, determining the sequence of assembly operations). On the contrary, the state of the art in micro-planning (i.e., tool selection, path planning for tool and part movements) is rather primitive. To generate a realizable assembly plan, both macro-planning and micro-planning problems need to be solved. Tooling considerations are an important component of the micro-planning problem. Therefore, we present a methodology for modeling assembly tools, selecting tools for assembly operations, and generating detailed tool movements. Techniques described in this paper can be combined with macro-planning techniques to result in a complete assembly planner.
8368503
Synthesis of testable RTL designs
With several commercial tools becoming available, the high-level synthesis of application-specific integrated circuits is finding wide spread acceptance in VLSI industry today. Existing tools for synthesis focus on optimizing cost while meeting performance constraints or vice versa. Yet, verification and testing have emerged as major concerns of IC vendors since the repercussions of chips being recalled are far-reaching. In this paper, we concentrate on the synthesis of testable RTL designs using techniques from Artificial Intelligence. We present an adaptive version of the well known Simulated Annealing algorithm and describe its application to a combinatorial optimization problem arising in the high-level synthesis of digital systems. The conventional annealing algorithm was conceived with a single perturb operator which applies a small modification to the existing solution to derive a new solution. The Metropolis criterion is then used to accept or reject the new solution. In some of the complex optimization problems arising in VLSI design, a set of perturb functions become necessary, leading to the question of how to select a particular function for modifying the current system configuration. The adaptive algorithm described here uses the concept of reward and penalty from the theory of learning automata to "learn" to apply the appropriate perturb function. We have applied both the conventional simulated annealing algorithm and the adaptive simulated annealing algorithm to the problem of testability-oriented datapath synthesis for signal processing applications. Our experimental results indicate that the adaptive algorithm can yield better solutions in shorter time.