7211906
Manufacturing feature instances: which ones to recognize?
Manufacturing features and feature-based representations have become an integral part of research on manufacturing systems, largely due to their ability to model correspondences between design information and manufacturing operations. However, several research challenges still must be addressed in order to place feature technologies into a solid scientific and mathematical framework. One challenge is the issue of alternatives in feature-based planning. Even after one has decided upon an abstract set of features to use for representing manufacturing operations, the set of feature instances used to represent a part is by no means unique. For a complex part, many (sometimes infinitely many) different manufacturing operations can potentially be used to manufacture various portions of the part. Some of these feature instances will appear in useful manufacturing plans, and others will not. In order to reduce the number of alternative manufacturing plans that must be examined, we require a systematic means of specifying which feature instances are of interest. This paper addresses the issue of alternatives by introducing the notion of primary feature instances, which we contend are sufficient to generate all manufacturing plans of interest. To substantiate our argument, we describe how various instances in the primary feature set can be used to produce the desired plans. Furthermore, we discuss how this formulation overcomes computational difficulties faced by previous work, and present some complexity results for this approach in the domain of machined parts. “Also with: Nationaf Institute of Standards and Technology, Manufacturing Systems Integration Division Building 220, Room A-127, Gaithersburg, MD 20899. Permission to copy without fee all or part of this material is granted provided that the copies are not made or distributed for direct commercial advanta$e, the ACM copyright notice and the title of the publication and Its date appear, and notice is given that copying is by permission of the Association of Computing Machinery.To copy otherwise, or to republish, requires a fee and/or specific permission. Solid Modeling ’95, Salt Lake City, Utah USA
7232623
Finding Mold-Piece Regions Using Computer Graphics Hardware
An important step in the mold design process that ensures disassembly of mold pieces consists of identifying various regions on the part that will be formed by different mold pieces. This paper presents an efficient and robust algorithm to find and highlight the mold-piece regions on a part. The algorithm can be executed on current-generation computer graphics hardware. The complexity of the algorithm solely depends on the time to render the given part. By using a system that can quickly find various mold-piece regions on a part, designers can easily optimize the part and mold design and if needed make appropriate corrections upfront, streamlining the subsequent design steps.
34697973
Novel test pattern generators for pseudo-exhaustive testing
Pseudo-exhaustive testing involves applying all possible input patterns to individual output cones of a circuit. The testing ensures detection of all combinational faults within individual cones. Test pattern generators based on coding theory principles are not tailored for circuit-under-test and generate inefficient pseudo-exhaustive test sets. We shall describe novel hardware efficient test pattern generators that employ knowledge of the circuit output cone structures for generating minimal test sets. Using our techniques, we have designed generators that generate minimum test sets for partitioned versions of the combinational benchmark circuits.<<ETX>>
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
1246119
Interface synthesis using memory mapping for an FPGA platform
Several system-on-chip (SoC) platforms have recently emerged that use reconfigurable logic (FPGAs) as a programmable coprocessor to reduce the computational load on the main processor core. We present an interface synthesis approach that forms part of our hardware-software codesign methodology for such an FPGA-based platform. The approach is based on a novel memory mapping algorithm that maps data used by both the hardware and the software to shared memories on the reconfigurable fabric. The memory mapping algorithm couples with a high-level synthesis tool and uses scheduling information to map variables, arrays and complex data structures to the shared memories in a way that minimizes the number of registers and multiplexers used in the hardware interface. We also present three software schemes that enable the application software to communicate with this hardware interface. We demonstrate the utility of our approach and study the trade-offs involved using a case study of the codesign of a computationally expensive portion of the MPEG-1 multimedia application on to the Altera Nios platform.
16361691
Cost-efficient soft error protection for embedded microprocessors
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety critical applications, ranging from automobiles to pacemakers, compounds the importance of addressing the soft error problem. Historically, soft error tolerance techniques have been targeted mainly at high-end server markets, leading to solutions such as coarse-grained modular redundancy and redundant multithreading. However, these techniques tend to be prohibitively expensive to implement in the embedded design space. To address this problem, we first present a thorough analysis of the effects of soft errors on a production-grade, fully synthesized implementation of an ARM926EJ-S embedded microprocessor. We then leverage this analysis in the design of two orthogonal low-costs of terror protection techniques that can be tuned to achieve variable levels of fault coverage as a function of area and power constraints. The first technique uses a small cache of live register values in order to provide nearly twice the fault coverage of a register file protected using traditional error correcting codes at little or no additional area cost. The second technique is a statistical method used to significantly reduce the overhead of deploying time-delayed shadow latches for low-latency fault detection.
1533259
Coordinated transformations for high-level synthesis of high performance microprocessor blocks
High performance microprocessor designs are partially characterized by functional blocks consisting of a large number of operations that are packed into very few cycles (often single-cycle) with little or no resource constraints but tight bounds on the cycle time. Extreme parallelization, conditional and speculative execution of operations is essential to meet the processor performance goals. However, this is a tedious task for which classical high-level synthesis (HLS) formulations are inadequate and thus rarely used. In this paper, we present a new methodology for application of HLS targeted to such microprocessor functional blocks that can potentially speed up the design space exploration for microprocessor designs. Our methodology consists of a coordinated set of source-level and fine-grain parallelizing compiler transformations that targets these behavioral descriptions, specifically loop constructs in them and enables efficient chaining of operations and high-level synthesis of the functional blocks. As a case study in understanding the complexity and challenges in the use of HLS, we walk the reader through the detailed design of an instruction length decoder drawn from the Pentium®-family of processors. The chief contribution of this paper is formulation of a domain-specific methodology for application of high-level synthesis techniques to a domain that rarely, if ever, finds use for it.