7585766
Extending the Lifetime of Multicast Trees in WANETs
This paper presents a distributed algorithm called L-REMiT for enhancing the lifetime of a source-based multicast tree in wireless ad hoc networks (WANET). The lifetime of a multicast tree is the duration from the formation of the tree to the time when the first node fails due to battery energy exhaustion. L-REMiT assumes that the energy consumed to forward a packet is proportional to the forwarding distance and channel characteristics, and that WANET nodes can dynamically adjust their transmission power. The task of extending the lifetime of a multicast tree is formulated as the task of extending the lifetime of bottleneck nodes in the tree. The number of multicast packets that a bottleneck node can forward, as determined by its residual battery energy and the distance of its farthest child node, is the minimum over all the nodes in the multicast tree. The lifetime of a bottleneck node is improved by reassigning its farthest children to other nodes in the tree with the goal of improving the lifetime of the multicast tree. Nodes only require information from their neighbors for refining the tree in a distributed manner. Simulation results show that L-REMiT has low overhead and performs better than the BIP/MIP and EWMA algorithms.
12873659
TARA: Thermal-Aware Routing Algorithm for Implanted Sensor Networks
Implanted biological sensors are a special class of wireless sensor networks that are used in-vivo for various medical applications. One of the major challenges of continuous in-vivo sensing is the heat generated by the implanted sensors due to communication radiation and circuitry power consumption. This paper addresses the issues of routing in implanted sensor networks. We propose a thermal-aware routing protocol that routes the data away from high temperature areas (hot spots). With this protocol each node estimates temperature change of its neighbors and routes packets around the hot spot area by a withdraw strategy. The proposed protocol can achieve a better balance of temperature rise and only experience a modest increased delay compared with shortest hop, but thermal-awareness also indicates the capability of load balance, which leads to less packet loss in high load situations.
1274772
Supporting persistent social groups in ubiquitous computing environments using context-aware ephemeral group service
We analyze the role of the social group in a ubiquitous computing (Ubicomp) environment as a source of contextual information. A model is presented to address the social group member's perceptions of how devices in a ubicomp environment should aid them in collaboration. Based on the model a distributed context-aware group membership management scheme is developed. We then present a prototype implementation for a context-aware ephemeral group membership management scheme, along with a sample application, and experimental results that demonstrate the feasibility of our system.
2580676
Adaptive Distributed Dynamic Channel Allocation for Wireless Networks
Channel allocation schemes in a mobile computing (wireless) environment can be either static or dynamic. Static allocation offers negligible channel acquisition time and zero message complexity and works well at a low system load; the performance steadily decreases as system load increases since many calls are dropped. In the case of even temporary hot spots many calls may be dropped by a heavily loaded switching station even when there are enough idle channels in the interference region of that station. On the other hand, dynamic schemes provide better utilization of the channels at higher loads albeit at the cost of higher channel acquisition time and some additional control messages. Our purpose in the present paper is to propose a combined channel allocation scheme so that each switching station can tune to its own load independent of other stations in its interference region; the objective is to minimize the call drop rate and at the same time maintain a minimum average channel acquisition time and minimum control message complexity.
3266186
e3D: an energy-efficient routing algorithm for wireless sensor networks
One of the limitations of wireless sensor nodes is their inherent limited energy resource. Besides maximizing the lifetime of the sensor node, it is preferable to distribute the energy dissipated throughout the wireless sensor network in order to minimize maintenance and maximize overall system performance. Any communication protocol that involves synchronization of peer nodes incurs some overhead for setting up the communication. We introduce a new algorithm, e3D (energy-efficient distributed dynamic diffusion routing algorithm), and compare it to two other algorithms, namely directed, and random clustering communication. We take into account the setup costs and analyze the energy-efficiency and the useful lifetime of the system. We compare the algorithms in terms of system lifetime, power dissipation distribution, cost of synchronization, and simplicity of the algorithm. Our simulation results show that e3D performs comparable to its optimal counterpart while having significantly less overhead.
384064
Proximity based access control in smart-emergency departments
In this paper, we propose a proximity based automated access control (PBAC) model for smart-ED environments which improves the existing ED work-flow by automating mundane administrative procedure for secure information access, allowing caregivers to focus on the treatment of patients. The proposed access model builds on the traditional role-based access control model and extends it by including multiple authentication levels for preventing unauthorized access. We also provide a semi-formal specification for the PBAC model. We further validate it using ultra-wide-band (UWB) based prototype which was tested in ED
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
12850641
Fault-oriented Test Generation for Multicast Routing Protocol Design
We present a new algorithm for automatic test generation for multicast routing. Our algorithm processes a finite state machine (FSM) model of the protocol and uses a mix of forward and backward search techniques to generate the tests. The output tests include a set of topologies, protocol events and network failures, that lead to violation of protocol correctness and behavioral requirements. We target protocol robustness in specific, and do not attempt to verify other properties in this paper. We apply our method to a multicast routing protocol; PIM-DM, and investigate its behavior in the presence of selective packet loss on LANs and router crashes. Our study unveils several robustness violations in PIM-DM, for which we suggest fixes with the aid of the presented algorithm.
37175673
A methodology to design efficient BIST test pattern generators
This paper describes a new technique to design efficient test pattern generators (TPGs) for built-in self-test (BIST). The proposed technique identifies compatible circuit inputs that can be connected to the same TPG stage in the test mode. Compatibility between circuit inputs is determined by analyzing the circuit function to guarantee coverage of all faults in a given target fault set. Unlike pseudo-exhaustive testing, circuit inputs that fanout to the same output can be compatible, provided that connecting them to the same TPG stage does not cause any loss of fault coverage. Experimental results show that TPGs designed by the proposed technique achieve 100% stuck-at fault coverage in practical test length (/spl les/2/sup 28/) with low hardware overhead and performance penalty for a wide range of benchmark circuits.
15811522
DS-LFSR: a BIST TPG for low switching activity
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS-LFSR), consists of two linear feedback shift registers (LFSRs), a slow LFSR and a normal-speed LFSR. The slow LFSR is driven by a slow clock whose speed is 1/dth that of the normal clock, which drives the normal-speed LFSR. The use of DS-LFSR reduces the frequency of transitions at the circuit inputs driven by the slow LFSR, leading to a reduction in switching activity during test application. A procedure is presented to design a DS-LFSR so as to achieve high fault coverage by ensuring that patterns generated by it are unique and uniformly distributed. A new gain function and a method to compute its value for each circuit input are proposed to select inputs to be driven by the slow LFSR. Also, a procedure to increase the number of inputs driven by the slow LFSR by combining compatible inputs is presented to further decrease the switching activity. Finally, DS-LFSRs are designed for the ISCAS85 and ISCAS89 benchmark circuits and shown to provide a 13% to 70% reduction in the numbers of load-capacitance weighted transitions with no loss of fault coverage (for stuck-at as well as transition delay faults) and at very slight area overheads.
10510913
Lower bounds on test resources for scheduled data flow graphs
Lower bound estimations of resources at various stages of high-level synthesis are essential to guide synthesis algorithms towards optimal solutions. In this paper we present lower bounds on the number of test resources (i.e. test pattern generators, signature analyzers and CBILBO registers) required to test a synthesized data path using built-in self-test (BIST). The estimations are performed on scheduled data flow graphs and provide a practical way of selecting or modifying module assignments and schedules such that the resulting synthesized data path requires a small number of test resources to test itself.