33983442
Test generation for ground bounce in internal logic circuitry
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is proposed. Based on this model an algorithm for generating test patterns that maximize ground bounce in combinational logic is presented. Our algorithm is also applicable to other test problems such as delay testing in the presence of excessive ground bounce.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
5689615
Generating sacrificial multi-piece molds using accessibility driven spatial partitioning
This paper describes an algorithm based on accessibility-driven partitioning approach to automate the design of sacrificial multi-piece molds. Sacrificial multi-piece molds are used for producing geometrically complex gelcast ceramic parts. The algorithm presented in this paper analyzes the accessibility of the gross mold shape and partitions using accessibility information. Each partitioning step improves accessibility of decomposed mold pieces. By performing successive decomposition, this algorithm finally produces a set of mold components that are accessible and therefore can be manufactured using milling and drilling operations. Using the algorithm presented in this paper, mold design steps can be significantly automated for making geometrically complex parts and facilitating the creation of physical part from the CAD model in a matter of hours.
8368503
Synthesis of testable RTL designs
With several commercial tools becoming available, the high-level synthesis of application-specific integrated circuits is finding wide spread acceptance in VLSI industry today. Existing tools for synthesis focus on optimizing cost while meeting performance constraints or vice versa. Yet, verification and testing have emerged as major concerns of IC vendors since the repercussions of chips being recalled are far-reaching. In this paper, we concentrate on the synthesis of testable RTL designs using techniques from Artificial Intelligence. We present an adaptive version of the well known Simulated Annealing algorithm and describe its application to a combinatorial optimization problem arising in the high-level synthesis of digital systems. The conventional annealing algorithm was conceived with a single perturb operator which applies a small modification to the existing solution to derive a new solution. The Metropolis criterion is then used to accept or reject the new solution. In some of the complex optimization problems arising in VLSI design, a set of perturb functions become necessary, leading to the question of how to select a particular function for modifying the current system configuration. The adaptive algorithm described here uses the concept of reward and penalty from the theory of learning automata to "learn" to apply the appropriate perturb function. We have applied both the conventional simulated annealing algorithm and the adaptive simulated annealing algorithm to the problem of testability-oriented datapath synthesis for signal processing applications. Our experimental results indicate that the adaptive algorithm can yield better solutions in shorter time.
8584813
Generation of alternative feature-based models and precedence orderings for machining applications
Incre=ing global competition is challenging the U.S. manufacturing industry to bring competitively-priced, well-designed and well-manufactured products to market in a timely fashion. Since decisions made during the design stage can have significant effects on product cost, quality, and lead time, increasing research attention is being given to integrating engineering design and manufacturing, with a focus on design for manufacturability. Consider the task of designing and manufacturing machined parts. Often there can be several different ways to machine a part. Which way is best depends on several factors, including dimensions, tolerances, surface finishes, availability of machine tools and cutting tools, fixturability, and optimization criteria. Thus, to evaluate the manufacturability of the proposed design, we may need to consider more than one way to machine it. This paper outlines our approach for generating and evaluating alternative ways to machine a part. For additional details, see [1]; for other related work, see [2, 3].
17496994
On finding optimal registrations in presence of overlapping registration areas
Personal Communication Services (PCS) standards such as IS-41 and GSM use a location management scheme which is based on registration areas (RA). Overlapping of registration areas has been proposed to reduce the overhead of location updates in such systems (4]. Overlapping RAs form regions in which a mobile has a choice in selecting which RA to register to. The choice of current RA has implication on the number of registrations a mobile may require in the future. In this paper we investigate the problem of finding the best (or optimal) registration for a user in a cellular PCS environment with overlapping Registration Areas (RAs). We study two versions of the problem: (i) the deterministic version, where the entire trajectory of the mobile is known a-priori, and (ii) the stochastic version, where the trajectory of the mobile is not known a-priori but the system has the knowledge of mobility pattern of the mobile. The mobility pattern is modeled as a stochastic random walk across regions. In the deterministic case the method presented computes an optimal solution to the registration problem. In the stochastic case we present a method which determines the registration which minimizes the expected number of registrations by looking ahead at the probable paths which may be traversed by the mobile in future. The paper also proposes a preemptive and a non-preemptive version of the stochastic method which incur different numbers of hard and soft registration operations.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.