62707609
BIST TPG for faults in system backplanes
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in each of its constituent boards is presented. Since the configurations of systems change frequently, at the system level, the proposed methodology employs a simple test schedule which can be easily changed whenever the system configuration is changed. Since the boards used in such systems are designed for use in a wide variety of systems, the proposed methodology defines the test objectives to be achieved by a board's BIST circuit in terms of the board's edge pin connections, independent of the configurations of the systems in which the board may be used. It is shown that the combination of the proposed test schedule and the availability, on each board in the system, of any BIST circuit that satisfies the proposed test objectives, guarantees safe testing of faults in backplanes. A programmable test architecture and an algorithm to program the architecture to obtain BIST that satisfies the test objectives is also presented. Finally, the applicability and effectiveness of the methodology is demonstrated via its application to multiple configurations of an example system that uses a VME backplane.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
14208903
A Survey of Shape Similarity Assessment Algorithms for Product Design and Manufacturing Applications
Shape similarity assessment is a fundamental geometric reasoning problem that finds application in several different product design and manufacturing applications. A computationally efficient way to assess shape similarity is to first abstract 3D object shapes into shape signatures and use shape signatures to perform similarity assessment. Several different types of shape signatures have been developed in the past. This paper provides a survey of existing algorithms for computing and comparing shape signatures. Our survey consists of a description of the desired properties of shape signatures, a scheme for classifying different types of shape signatures, and descriptions of representative algorithms for computing and comparing shape signatures. This survey concludes by identifying directions for future research. 1 Corresponding Author
1246119
Interface synthesis using memory mapping for an FPGA platform
Several system-on-chip (SoC) platforms have recently emerged that use reconfigurable logic (FPGAs) as a programmable coprocessor to reduce the computational load on the main processor core. We present an interface synthesis approach that forms part of our hardware-software codesign methodology for such an FPGA-based platform. The approach is based on a novel memory mapping algorithm that maps data used by both the hardware and the software to shared memories on the reconfigurable fabric. The memory mapping algorithm couples with a high-level synthesis tool and uses scheduling information to map variables, arrays and complex data structures to the shared memories in a way that minimizes the number of registers and multiplexers used in the hardware interface. We also present three software schemes that enable the application software to communicate with this hardware interface. We demonstrate the utility of our approach and study the trade-offs involved using a case study of the codesign of a computationally expensive portion of the MPEG-1 multimedia application on to the Altera Nios platform.
15204415
Dynamic conditional branch balancing during the high-level synthesis of control-intensive designs
We present two novel strategies to increase the scope for application of speculative code motions: (1) Adding scheduling steps dynamically during scheduling to conditional branches with fewer scheduling steps. This increases the opportunities to apply code motions, such as conditional speculation that duplicate operations into the branches of a conditional block. (2) Determining if an operation can be conditionally speculated into multiple basic blocks either by using existing idle resources or by creating new scheduling steps. These strategies lead to balancing of the number of steps in the conditional branches without increasing the longest path through the conditional block. Algorithms for these strategies have been implemented within the Spark high-level synthesis framework that accepts a behavioral description in ANSI-C as input and produces synthesizable register-transfer level VHDL. Experiments on two moderately complex industrial-strength applications, namely, MPEG-1 and the GIMP image processing tool, demonstrate that conditional speculation is ineffective without using these strategies.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
1183946
Geometric algorithms for automated design of multi-piece permanent molds
Abstract Multi-piece molds, which consist of more than two mold pieces, are capable of producing very complex parts—parts that cannot be produced by the traditional molds. The tooling cost is also low for multi-piece molds, which makes it a candidate for pre-production prototyping and bridge tooling. However, designing multi-piece molds is a time-consuming task. This article describes geometric algorithms for automated design of multi-piece molds. A multi-piece mold design algorithm has been developed to automate several important mold-design steps: finding parting directions, locating parting lines, creating parting surfaces, and constructing mold pieces. This algorithm constructs mold pieces based on global accessibility analysis results of the part and therefore guarantees the disassembly of the mold pieces. A software system has been developed, which has been successfully tested on several complex industrial parts.