45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
12850641
Fault-oriented Test Generation for Multicast Routing Protocol Design
We present a new algorithm for automatic test generation for multicast routing. Our algorithm processes a finite state machine (FSM) model of the protocol and uses a mix of forward and backward search techniques to generate the tests. The output tests include a set of topologies, protocol events and network failures, that lead to violation of protocol correctness and behavioral requirements. We target protocol robustness in specific, and do not attempt to verify other properties in this paper. We apply our method to a multicast routing protocol; PIM-DM, and investigate its behavior in the presence of selective packet loss on LANs and router crashes. Our study unveils several robustness violations in PIM-DM, for which we suggest fixes with the aid of the presented algorithm.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
2431223
Switch-level delay test
Gate-level models are usually used to generate tests for circuits containing non-primitive CMOS gates. It is shown that tests generated using these models and classical conditions for robust path delay testing can fail to detect delay faults in such circuits. A new delay-independent, switch-level delay test methodology, called /spl tau/-robust testing, is proposed that defines new entities called targets and proposes conditions to generate tests for each target. It is proven that, under the assumed delay model, a circuit that passes a test set containing a /spl tau/-robust test for every target is guaranteed to operate correctly at the desired speed. The effectiveness of the proposed methodology is demonstrated by (a) illustrating the difference between the delays excited by classical robust and /spl tau/-robust tests via circuit simulation, and (b) generation of /spl tau/-robust tests for benchmark circuits and comparison of /spl tau/-robust coverage of classical robust and /spl tau/-robust test sets.
19051554
BIST test pattern generators for stuck-open and delay testing
Testing for delay and CMOS stuck-open faults requires two pattern tests and test sets are usually large. Built-in self-test (BIST) schemes are attractive for such comprehensive testing. The BIST test pattern generators (TPGs) for such testing should be designed to ensure high pattern-pair coverage. In this paper, necessary and sufficient conditions to ensure complete/maximal pattern-pair coverage for linear feedback shift register (LFSR) and cellular automata (CA) have been derived. The theory developed here identifies all LFSR/CA TPGs which maximize pattern-pair coverage under any given TPG size constraints. It is shown that LFSRs with primitive feedback polynomials with large number of terms are better for two-pattern testing. Also, CA are shown to be better TPGs than LFSRs for two-pattern testing. Results derived in this paper provide practical algorithms for the design of optimal TPGs for two-pattern testing. Experiments on some benchmark circuits indicate the TPGs designed using the procedures outlined in this paper provide much higher delay fault coverage than other TPGs.<<ETX>>
12219775
Geometric algorithms for containment analysis of rotational parts
Abstract This paper describes a system and underlying algorithms to perform geometric containment analysis to determine if a newly designed rotational part can be manufactured from a part in an existing database of rotational parts. Only material removal of the database part is considered in order to obtain the newly designed part from the database part. The system uses a three-step algorithm to test for containment. The first step analyzes feasibility of containment using bounding cylinders. If the bounding cylinder of the query part is bigger than the part in the database, then the database part cannot contain the query part and it is eliminated from consideration. The second step analyzes feasibility of containment by ignoring off-axis features. Any part that fails to satisfy containment at this stage is eliminated from consideration. The third step analyzes the remaining parts from the database for feasibility of containment by including the off-axis features. Finally, the system rank-orders all the database parts that can contain the query part based on their volume differences with the query part. The system described in this paper can be used by designers and process planners to find an existing part that can be used as a stock to manufacture a newly designed part. This capability is expected to significantly reduce proliferation of parts, to improve manufacturing responsiveness, and to reduce the cost of new products.
15600368
Dynamically adapting registration areas to user mobility and call patterns for efficient location management in PCS networks
In this paper, we propose an extension to the personal communication services (PCS) location management protocol which uses dynamically overlapped registration areas. The scheme is based on monitoring the aggregate mobility and call pattern of the users during each reconfiguration period and adapting to the mobility and call patterns by either expanding or shrinking registration areas at the end of each reconfiguration period. We analytically characterize the trade-off resulting from the inclusion or exclusion of a cell in a registration area in terms of expected change in aggregate database access cost and signaling overhead. This characterization is used to guide the registration area adaption in a manner in which the signaling and database access load on any given location register (LR) does not exceed a specified limit. Our simulation results show that it is useful to dynamically adapt the registration areas to the aggregate mobility and call patterns of the mobile units when the mobility pattern exhibits locality. For such mobility and call patterns, the proposed scheme can greatly reduce the average signaling and database access load on LRs. Further, the cost of adapting the registration areas is shown to be low in terms of memory and communication requirements.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
12878004
Criticality aware access control model for pervasive applications
Access control policies define the rules for accessing system resources. Traditionally, these are designed to take a reactive view for providing access, based on explicit user request. This methodology may not be sufficient in the case of critical events (emergencies) where automatic and timely access to resources may be required to facilitate corrective actions. This paper introduces the novel concept of criticality which measures the level of responsiveness for taking such actions. The paper further incorporates criticality in an access control framework for facilitating the management of critical situations. Specific properties and requirements for such criticality aware access control are identified and a sample model is provided along with its verification
532672
IMACS: A Case Study in Real-World Planning
This article discusses the complexities of real-world planning and how to create planning systems to address them. IMACS (Interactive Manufacturability Analysis and Critiquing System), an automated designer's aid, evaluates machined parts and suggests design modifications to improve their manufacturability, offering advantages over the planning techniques used in classical planning systems.