37175673
A methodology to design efficient BIST test pattern generators
This paper describes a new technique to design efficient test pattern generators (TPGs) for built-in self-test (BIST). The proposed technique identifies compatible circuit inputs that can be connected to the same TPG stage in the test mode. Compatibility between circuit inputs is determined by analyzing the circuit function to guarantee coverage of all faults in a given target fault set. Unlike pseudo-exhaustive testing, circuit inputs that fanout to the same output can be compatible, provided that connecting them to the same TPG stage does not cause any loss of fault coverage. Experimental results show that TPGs designed by the proposed technique achieve 100% stuck-at fault coverage in practical test length (/spl les/2/sup 28/) with low hardware overhead and performance penalty for a wide range of benchmark circuits.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
2580676
Adaptive Distributed Dynamic Channel Allocation for Wireless Networks
Channel allocation schemes in a mobile computing (wireless) environment can be either static or dynamic. Static allocation offers negligible channel acquisition time and zero message complexity and works well at a low system load; the performance steadily decreases as system load increases since many calls are dropped. In the case of even temporary hot spots many calls may be dropped by a heavily loaded switching station even when there are enough idle channels in the interference region of that station. On the other hand, dynamic schemes provide better utilization of the channels at higher loads albeit at the cost of higher channel acquisition time and some additional control messages. Our purpose in the present paper is to propose a combined channel allocation scheme so that each switching station can tune to its own load independent of other stations in its interference region; the objective is to minimize the call drop rate and at the same time maintain a minimum average channel acquisition time and minimum control message complexity.
14208903
A Survey of Shape Similarity Assessment Algorithms for Product Design and Manufacturing Applications
Shape similarity assessment is a fundamental geometric reasoning problem that finds application in several different product design and manufacturing applications. A computationally efficient way to assess shape similarity is to first abstract 3D object shapes into shape signatures and use shape signatures to perform similarity assessment. Several different types of shape signatures have been developed in the past. This paper provides a survey of existing algorithms for computing and comparing shape signatures. Our survey consists of a description of the desired properties of shape signatures, a scheme for classifying different types of shape signatures, and descriptions of representative algorithms for computing and comparing shape signatures. This survey concludes by identifying directions for future research. 1 Corresponding Author
7232623
Finding Mold-Piece Regions Using Computer Graphics Hardware
An important step in the mold design process that ensures disassembly of mold pieces consists of identifying various regions on the part that will be formed by different mold pieces. This paper presents an efficient and robust algorithm to find and highlight the mold-piece regions on a part. The algorithm can be executed on current-generation computer graphics hardware. The complexity of the algorithm solely depends on the time to render the given part. By using a system that can quickly find various mold-piece regions on a part, designers can easily optimize the part and mold design and if needed make appropriate corrections upfront, streamlining the subsequent design steps.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
2930416
Towards multiprocessor feature recognition
Abstract The availability of low-cost computational power is enabling the development of increasingly sophisticated cad software. Automation of design and manufacturing activities poses many difficult computational problems—significant among them is how to develop interactive systems that enable designers to explore and experiment with alternative ideas. As more downstream manufacturing activities are considered during the design phase, computational costs become problematic. Creating working software-based solutions requires a sophisticated allocation of computational resources in order to perform realistic design analyses and generate feedback. This paper presents our initial efforts to employ multiprocessor algorithms to recognize machining features from solid models of parts with large numbers of features and many geometric and topological entities. Our goal is to outline how improvements in computation time can be obtained by migrating existing software tools to multiprocessor architectures. An implementation of our approach is discussed.