39657490
Aliasing Probability for Multiple Input Signature Analyzer
Single and multiple multiple-input-signature-register (MISR) aliasing probability expressions are presented for arbitrary test lengths. A framework, based on algebraic codes, is developed for the analysis and synthesis of MISR-based test response compressors for BIST. This framework is used to develop closed-form expressions for the aliasing probability of MISR for arbitrary test length. An error model, based on q-ary symmetric channel, is proposed using more realistic assumptions. Results are presented that provide the weight distributions for q-ary codes (q=2/sup m/, where the circuit under test has m outputs). These results are used to compute the aliasing probability for the MISR compression technique for arbitrary test lengths. This result is extended to compression using two different MISRs. It is shown that significant improvements can be obtained by using two signature analyzers instead of one. The weight distribution of a class of codes of arbitrary length is also given. >
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
6284071
Algorithms for Computing Global Accessibility Cones
This paper describes algorithms for computing global accessibility cones for each face (i.e., the set of directions from which faces are accessible) on a polyhedral object. We describe exact mathematical conditions and the associated algorithm for determining the set of directions from which a planar face with triangular boundary is inaccessible due to another face on the object. By utilizing the algorithm to compute the exact inaccessibility region for a face, we present algorithms for computing global accessibility cones for each face on the object. These global accessibility cones are represented as a matrix structure and can be used to support a wide variety of accessibility queries for the object.
13998462
Geometric algorithms for computing cutter engagement functions in 2.5D milling operations
Cutter engagement is a measure that describes what portion of the cutter is involved in machining at a given instant of time. During profile milling of complex geometries, cutter engagement varies significantly along the cutter path. Cutter engagement information helps in determining the efficiency of the cutter path and also helps in improving it by adjusting the feed rate. This paper describes geometric algorithms for computing piece-wise continuous closed-form cutter engagement functions for 2.5D milling operations. The results produced by our algorithm are compared with the results obtained by discrete simulations of the cutting process and appear to match very well.
16692732
Versioned Hypermedia can improve software document management
This research was supported by the U. S. Department of Defense and by NSF CAREER award CCR-9734102. The Software Concordance project is addressing the software document management problem by providing a fine-grained version control model for software documents and their relationships using hypermedia versioning. A set of tools needed to maintain, visualize and analyze software documents is being constructed. This short paper presents research issues, initial results and a scheme for using hypermedia versioning and time stamps to automate detection of possible semantic non-conformance among software artifacts.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
7271224
Speculation techniques for high level synthesis of control intensive designs
The quality of synthesis results for most high level synthesis approaches is strongly affected by the choice of control flow (through conditions and loops) in the input description. In this paper, we explore the effectiveness of various types of code motions, such as moving operations across conditionals, out of conditionals (speculation) and into conditionals (reverse speculation), and how they can be effectively directed by heuristics so as to lead to improved synthesis results in terms of fewer execution cycles and fewer number of states in the finite state machine controller. We also study the effects of the code motions on the area and latency of the final synthesized netlist. Based on speculative code motions, we present a novel way to perform early condition execution that leads to significant improvements in highly control-intensive designs. Overall, reductions of up to 38 \% in execution cycles are obtained with all the code motions enabled.