3339305
Can concurrent checkers help BIST?
Concurrent checkers are commonly used in computer systems to detect computational errors on-line, which enhances reliability. Using the coding theory framework developed earlier by the authors, concurrent checkers already available within the circuit are shown to be significant help to off-line testing. Specifically, test time can be reduced while improving the fault escape probability. The proposed combined scheme can be implemented with simple modification of existing hardware. Specifically proposed is a novel, dual use of concurrent checkers and BIST hardware, yielding mutual advantage.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
8312479
Using global code motions to improve the quality of results for high-level synthesis
The quality of synthesis results for most high-level synthesis approaches is strongly affected by the choice of control flow (through conditions and loops) in the input description. This leads to a need for high-level and compiler transformations that overcome the effects of programming style on the quality of generated circuits. To address this issue, we have developed a set of speculative code-motion transformations that enable movement of operations through, beyond, and into conditionals with the objective of maximizing performance. We have implemented these code transformations, along with supporting code-motion techniques and variable renaming techniques, in a high-level synthesis research framework called Spark. Spark takes a behavioral description in ANSI-C as input and generates synthesizable register-transfer level VHDL. We present results for experiments on designs derived from three real-life multimedia and image processing applications, namely, the MPEG-1 and -2 and GNU image manipulation program applications. We find that the speculative-code motions lead to reductions between 36% and 59% in the number of states in the finite-state machine (controller complexity) and the cycles on the longest path (performance) compared with the case when only nonspeculative code motions are employed. Also, logic synthesis results show fairly constant critical path lengths (clock period) and a marginal increase in area.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
118731
A theoretical study of optimization techniques used in registration area based location management: models and online algorithms
We describe a study of optimization techniques which have been proposed in the literature for registration area based location management from the perspective of optimal on-line algorithms. We show that most of these optimization techniques such as forwarding pointers and overlapped registration areas can be modeled using metrical task systems. Some of these models are simple while others are somewhat intricate. These representations directly imply the applicability of existing results on metrical task systems to algorithm design for location management. However, this also means that general lower bounds known for online metrical task systems carry over to our formulations of location management. We also discuss some restricted models in which much better (and simpler) algorithms are possible.
46153664
Design Validation Using Probe Mechanism
1183946
Geometric algorithms for automated design of multi-piece permanent molds
Abstract Multi-piece molds, which consist of more than two mold pieces, are capable of producing very complex parts—parts that cannot be produced by the traditional molds. The tooling cost is also low for multi-piece molds, which makes it a candidate for pre-production prototyping and bridge tooling. However, designing multi-piece molds is a time-consuming task. This article describes geometric algorithms for automated design of multi-piece molds. A multi-piece mold design algorithm has been developed to automate several important mold-design steps: finding parting directions, locating parting lines, creating parting surfaces, and constructing mold pieces. This algorithm constructs mold pieces based on global accessibility analysis results of the part and therefore guarantees the disassembly of the mold pieces. A software system has been developed, which has been successfully tested on several complex industrial parts.