29303565
Delay Fault Testing: How Robust are Our Models?
This panel will debate fundamental concepts in delay fault testing. A basic assumption in delay fault testing is that for a given transition propagated along a path, the path delay does not depend on values and transitions at circuit nodes that do not belong to the path. Is this assumption justified? If not, as some panelists will argue, then our current test procedures may miss some of the faults they target, and a lot of the current work in robust delay fault testing and in the synthesis of robust-testable circuits may be unreliable. A related question to be debated by the panel is whether a circuit passing a complete set of robust path delay tests at clock period T is guaranteed to perform its intended function at any clock period >= T. What are the delay models for which the answer is always true? What are the limitations of these models? Do we need to change the way we test circuits for delay faults? Other important questions deal with the hardware generating the tests: Can the response to the test be measured in a meaningful way (from a timing point of view)? Is the generating hardware capable of applying all two-pattern tests ? What delay model should be use to have a reasonable trade-off between accuracy and practicality? 502 O-8186-7304-4/96 $05.00
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
8584813
Generation of alternative feature-based models and precedence orderings for machining applications
Incre=ing global competition is challenging the U.S. manufacturing industry to bring competitively-priced, well-designed and well-manufactured products to market in a timely fashion. Since decisions made during the design stage can have significant effects on product cost, quality, and lead time, increasing research attention is being given to integrating engineering design and manufacturing, with a focus on design for manufacturability. Consider the task of designing and manufacturing machined parts. Often there can be several different ways to machine a part. Which way is best depends on several factors, including dimensions, tolerances, surface finishes, availability of machine tools and cutting tools, fixturability, and optimization criteria. Thus, to evaluate the manufacturability of the proposed design, we may need to consider more than one way to machine it. This paper outlines our approach for generating and evaluating alternative ways to machine a part. For additional details, see [1]; for other related work, see [2, 3].
1183946
Geometric algorithms for automated design of multi-piece permanent molds
Abstract Multi-piece molds, which consist of more than two mold pieces, are capable of producing very complex parts—parts that cannot be produced by the traditional molds. The tooling cost is also low for multi-piece molds, which makes it a candidate for pre-production prototyping and bridge tooling. However, designing multi-piece molds is a time-consuming task. This article describes geometric algorithms for automated design of multi-piece molds. A multi-piece mold design algorithm has been developed to automate several important mold-design steps: finding parting directions, locating parting lines, creating parting surfaces, and constructing mold pieces. This algorithm constructs mold pieces based on global accessibility analysis results of the part and therefore guarantees the disassembly of the mold pieces. A software system has been developed, which has been successfully tested on several complex industrial parts.
14782550
Algorithms for selecting cutters in multi-part milling problems
This paper describes geometric algorithms for automatically selecting an optimal sequence of cutters for machining a set of 2.5-D parts. In milling operations, cutter size affects the machining time significantly. Meanwhile, if the batch size is small, it is also important to shorten the time spent on loading tools into the tool magazine and establishing z-length compensation values. Therefore, in small-batch manufacturing, if we can select a set of milling tools that will produce good machining time on more than one type of parts, then several unnecessary machine-tool reconfiguration operations can be eliminated. In selecting milling cutters we consider both the tool loading time and the machining time and generate solutions that allow us to minimize the total machining time. In this paper we first present algorithms for finding the area that can be cut by a given cutter. Then we describe a graph search formulation for the tool selection problem. Finally, the optimal sequence of cutters is selected by using Dijkstra's shortest path planning algorithm.
29287365
Duality relations for queues with arrival and service control
We consider finite buffered queues with service or arrival control. In the case of service control, service may be stopped and restarted depending on the queue length. In the case of arrival control, the arrival stream can be turned off and on or arrivals may be rejected depending on the queue length. We give duality relations for various systems with arrival and service control that enables us to relate their stationary queue length distributions. We use physical coupling arguments which imply the stochastic coupling necessary to relate the queue lengths. We also discuss special cases for which queue length relationships can be obtained by analyzing the underlying Markov process. Two examples are provided to demonstrate the application of the duality property. The first example is a case where the existing queue length distribution for a given model can be used to obtain the queue length distribution of another model. In the second example, we obtain the previously unknown queue length distributions for two related models at once.
7232623
Finding Mold-Piece Regions Using Computer Graphics Hardware
An important step in the mold design process that ensures disassembly of mold pieces consists of identifying various regions on the part that will be formed by different mold pieces. This paper presents an efficient and robust algorithm to find and highlight the mold-piece regions on a part. The algorithm can be executed on current-generation computer graphics hardware. The complexity of the algorithm solely depends on the time to render the given part. By using a system that can quickly find various mold-piece regions on a part, designers can easily optimize the part and mold design and if needed make appropriate corrections upfront, streamlining the subsequent design steps.