2431223
Switch-level delay test
Gate-level models are usually used to generate tests for circuits containing non-primitive CMOS gates. It is shown that tests generated using these models and classical conditions for robust path delay testing can fail to detect delay faults in such circuits. A new delay-independent, switch-level delay test methodology, called /spl tau/-robust testing, is proposed that defines new entities called targets and proposes conditions to generate tests for each target. It is proven that, under the assumed delay model, a circuit that passes a test set containing a /spl tau/-robust test for every target is guaranteed to operate correctly at the desired speed. The effectiveness of the proposed methodology is demonstrated by (a) illustrating the difference between the delays excited by classical robust and /spl tau/-robust tests via circuit simulation, and (b) generation of /spl tau/-robust tests for benchmark circuits and comparison of /spl tau/-robust coverage of classical robust and /spl tau/-robust test sets.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
16013811
A comprehensive fault macromodel for opamps
In this paper, a comprehensive macromodel for transistor level faults in an operational amplifier is developed. With the observation that faulty behavior at output may result from interfacing error in addition to the faulty component, parameters associated with input and output characteristics are incorporated. Test generation and fault classification are addressed for stand-alone opamps. A high fault coverage is achieved by a proposed testing strategy. Transistor level short/bridging faults are analyzed and classified into catastrophic faults and parametric faults. Based on the macromodels for parametric faults, faults simulation is performed for an active filter. We found many parametric faults in the active filter cannot be detected by traditional functional testing. A DFT scheme alone with a current testing strategy to improve fault coverage is proposed.
40067645
A BIST methodology for comprehensive testing of RAM with reduced heat dissipation
The severity of excessive heat dissipation during concurrent BIST of memory modules has been documented previously (1993). In this paper, the authors present new versions of several memory tests that reduce heat dissipation during testing. Each proposed test has the same fault coverage and time complexity as the original version but it reduces heat dissipation by a factor of two or more. For three of the tests, the heat dissipation is reduced by factors of four to sixteen. The design of BIST circuitry required to implement the proposed tests are presented and it is shown that additional area overhead incurred is very small.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
7232623
Finding Mold-Piece Regions Using Computer Graphics Hardware
An important step in the mold design process that ensures disassembly of mold pieces consists of identifying various regions on the part that will be formed by different mold pieces. This paper presents an efficient and robust algorithm to find and highlight the mold-piece regions on a part. The algorithm can be executed on current-generation computer graphics hardware. The complexity of the algorithm solely depends on the time to render the given part. By using a system that can quickly find various mold-piece regions on a part, designers can easily optimize the part and mold design and if needed make appropriate corrections upfront, streamlining the subsequent design steps.
5173214
Dynamic common sub-expression elimination during scheduling in high-level synthesis
We introduce a new approach, "Dynamic Common Sub-expression Elimination (CSE)", that dynamically eliminates common sub-expressions based on new opportunities created during scheduling of control-intensive designs. Classical CSE techniques fail to eliminate several common sub-expressions in control-intensive designs due to the presence of a complex mix of control and data-flow. Aggressive speculative code motions employed to schedule control-intensive designs often re-order, speculate and duplicate operations, hence changing the control flow between the operations with common sub-expressions. This leads to new opportunities for applying CSE dynamically. We have implemented dynamic CSE in a high-level synthesis framework called Spark and present results for experiments performed using various combinations of CSE and dynamic CSE. The benchmarks used consist of four functional blocks derived from two moderately complex industrial-strength applications, namely, MPEG-1 and the GIMP image processing tool. Our dynamic CSE techniques result in improvements of up to 22% in the controller size and up to 31% in performance; easily surpassing the improvements obtained by the traditional CSE approach. We also observe an unexpected (and significant) reduction in the number of registers using our approach.
15929474
Optimal offline and online registration techniques for location management with overlapping registration areas
Personal communication services (PCS) standards such as the IS-41 and the GSM use a location management scheme, which is based on registration areas (RA). Overlapping of registration areas has been proposed to reduce the overhead of location updates in such systems. Overlapping provides multiple choices for the selection of a registration area, a feature that does not appear in environments of nonoverlapping RAs. In this paper, we demonstrate how the choice of a registration area affects the number of subsequent registrations and define the problem of optimal choice based on minimization of subsequent registrations. We study two versions of the problem: 1) the deterministic (or offline) version, in which the entire trajectory of the mobile unit is known a priori, and 2) the stochastic (or online) version, in which the trajectory of the mobile unit is not known a priori, but the system has the knowledge of the mobility pattern of the mobile. The mobility pattern is modeled as a random walk across coverage area. In the deterministic case, the method presented computes an optimal solution to the registration problem. In the stochastic case, we present a method that determines the registration that minimizes the expected number of registrations by looking ahead in the probable future paths of the mobile unit. The algorithm's time complexity has exponential dependence on the length of the look-ahead. The cost of search is independent of the choice, therefore the algorithm does not increase the search cost. We also consider an alternative cost model for the stochastic case and propose a preemptive and a nonpreemptive approach each of which incurs different numbers of hard and soft registration operations. Simulation results show a reduction of 25-30 percent in number of registrations over a random-choice scheme. This can be translated to 5-20 percent effective location management load reduction for most cases, subject to the call-to-mobility ratio (CMR) of a mobile unit and search-cost-to-update-cost ratio (CCR) in the network.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
611810
G-REMiT: An algorithm for building energy efficient multicast trees in wireless ad hoc networks
In this paper, we propose a distributed algorithm called G-REMiT for building an energy efficient multicast tree in a wireless ad hoc network (WANET). G-REMiT employs a more realistic energy consumption model for wireless communication which takes into account not only the energy losses due to radio propagation but also the energy losses in the transceiver electronics. We evaluate the performance of the protocol using two energy consumption model: long range radio and short range radio. We show that for long range radio model, G-REMiT algorithm can achieve better performance than other proposals such as MLU, MLiMST and MIP, and the energy overhead of for executing G-REMiT is negligible compared with the total energy consumption for the multicast communication. For short range radio, we find that existing energy saving scheme by adjusting node's transmission power is not suitable.