19051554
BIST test pattern generators for stuck-open and delay testing
Testing for delay and CMOS stuck-open faults requires two pattern tests and test sets are usually large. Built-in self-test (BIST) schemes are attractive for such comprehensive testing. The BIST test pattern generators (TPGs) for such testing should be designed to ensure high pattern-pair coverage. In this paper, necessary and sufficient conditions to ensure complete/maximal pattern-pair coverage for linear feedback shift register (LFSR) and cellular automata (CA) have been derived. The theory developed here identifies all LFSR/CA TPGs which maximize pattern-pair coverage under any given TPG size constraints. It is shown that LFSRs with primitive feedback polynomials with large number of terms are better for two-pattern testing. Also, CA are shown to be better TPGs than LFSRs for two-pattern testing. Results derived in this paper provide practical algorithms for the design of optimal TPGs for two-pattern testing. Experiments on some benchmark circuits indicate the TPGs designed using the procedures outlined in this paper provide much higher delay fault coverage than other TPGs.<<ETX>>
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
40067645
A BIST methodology for comprehensive testing of RAM with reduced heat dissipation
The severity of excessive heat dissipation during concurrent BIST of memory modules has been documented previously (1993). In this paper, the authors present new versions of several memory tests that reduce heat dissipation during testing. Each proposed test has the same fault coverage and time complexity as the original version but it reduces heat dissipation by a factor of two or more. For three of the tests, the heat dissipation is reduced by factors of four to sixteen. The design of BIST circuitry required to implement the proposed tests are presented and it is shown that additional area overhead incurred is very small.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
2431223
Switch-level delay test
Gate-level models are usually used to generate tests for circuits containing non-primitive CMOS gates. It is shown that tests generated using these models and classical conditions for robust path delay testing can fail to detect delay faults in such circuits. A new delay-independent, switch-level delay test methodology, called /spl tau/-robust testing, is proposed that defines new entities called targets and proposes conditions to generate tests for each target. It is proven that, under the assumed delay model, a circuit that passes a test set containing a /spl tau/-robust test for every target is guaranteed to operate correctly at the desired speed. The effectiveness of the proposed methodology is demonstrated by (a) illustrating the difference between the delays excited by classical robust and /spl tau/-robust tests via circuit simulation, and (b) generation of /spl tau/-robust tests for benchmark circuits and comparison of /spl tau/-robust coverage of classical robust and /spl tau/-robust test sets.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
17496994
On finding optimal registrations in presence of overlapping registration areas
Personal Communication Services (PCS) standards such as IS-41 and GSM use a location management scheme which is based on registration areas (RA). Overlapping of registration areas has been proposed to reduce the overhead of location updates in such systems (4]. Overlapping RAs form regions in which a mobile has a choice in selecting which RA to register to. The choice of current RA has implication on the number of registrations a mobile may require in the future. In this paper we investigate the problem of finding the best (or optimal) registration for a user in a cellular PCS environment with overlapping Registration Areas (RAs). We study two versions of the problem: (i) the deterministic version, where the entire trajectory of the mobile is known a-priori, and (ii) the stochastic version, where the trajectory of the mobile is not known a-priori but the system has the knowledge of mobility pattern of the mobile. The mobility pattern is modeled as a stochastic random walk across regions. In the deterministic case the method presented computes an optimal solution to the registration problem. In the stochastic case we present a method which determines the registration which minimizes the expected number of registrations by looking ahead at the probable paths which may be traversed by the mobile in future. The paper also proposes a preemptive and a non-preemptive version of the stochastic method which incur different numbers of hard and soft registration operations.
18442431
Understanding the Balanced Effects of Belief and Feeling on Information Systems Continuance
There are innumerable studies on technology adoption as well as continuance of usage. A review of previous research shows that cognitive factors are considered prominently in information technology adoption and continuance while the affective feelings of users are not. Although attitude and user satisfaction are common factors considered in information systems research, these factors only involve partial aspects of feelings. Researchers in the marketing areas, as well as the psychology area, begin to note the importance of feelings in understanding and predicting human and customer behavior. In many modern applications, such as mobile Internet services, user feelings are expected to be important, since users are not just technology users but also service consumers. Drawing upon the support of consumer research, social psychology, and computer science, this study proposes a balanced belief–feeling model of IS continuance. In the process of developing this model, the concepts of attitude, belief, and feelings are further articulated, defined, and distinguished. The balanced model is tested in a survey of mobile Internet users. The results established the validity of the model. A comparison with the IS continuance model shows that the new model can explain significantly more variance in continuance intention, taking into account that the new model has more factors. We offer theoretical reasoning for the balanced effects of belief and feeling on IS continuance and discuss the theoretical and practical implications of this study.
16361691
Cost-efficient soft error protection for embedded microprocessors
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety critical applications, ranging from automobiles to pacemakers, compounds the importance of addressing the soft error problem. Historically, soft error tolerance techniques have been targeted mainly at high-end server markets, leading to solutions such as coarse-grained modular redundancy and redundant multithreading. However, these techniques tend to be prohibitively expensive to implement in the embedded design space. To address this problem, we first present a thorough analysis of the effects of soft errors on a production-grade, fully synthesized implementation of an ARM926EJ-S embedded microprocessor. We then leverage this analysis in the design of two orthogonal low-costs of terror protection techniques that can be tuned to achieve variable levels of fault coverage as a function of area and power constraints. The first technique uses a small cache of live register values in order to provide nearly twice the fault coverage of a register file protected using traditional error correcting codes at little or no additional area cost. The second technique is a statistical method used to significantly reduce the overhead of deploying time-delayed shadow latches for low-latency fault detection.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
9848460
Geometric algorithms for automated design of rotary-platen multi-shot molds
This paper describes algorithms for automated design of rotary-platen type of multi-shot molds for manufacturing multi-material objects. The approach behind our algorithms works in the following manner. First, we classify the given multi-material object into several basic types based on the relationships among different components in the object. For every basic type, we find a molding sequence based on the precedence constraints resulting due to accessibility and disassembly requirements. Then, starting from the last mold stage, we generate the mold pieces for every mold stage. We expect that algorithms described in this paper will provide the necessary foundations for automating the design of rotary-platen molds.