30665466
ATPG for Heat Dissipation Minimization During Test Application
A automatic test pattern generator (ATPG) algorithm is proposed that reduces switching activity (between successive test vectors) during test application. The main objective is to permit safe and inexpensive testing of low power circuits and bare die that might otherwise require expensive heat removal equipment for testing at high speeds, Three new cost functions, namely transition controllability, observability, and test generation costs, have been defined. It has been shown, for a fanout free circuit under test, that the transition test generation cost for a fault is the minimum number of transitions required to test a given stuck-at fault. The proposed algorithm has been implemented and the generated tests are compared with those generated by a standard PODEM implementation for the larger ISCAS85 benchmark circuits. The results clearly demonstrate that the tests generated using the proposed ATPG can decrease the average number of (weighted) transitions between successive test vectors by a factor of 2 to 23.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
611810
G-REMiT: An algorithm for building energy efficient multicast trees in wireless ad hoc networks
In this paper, we propose a distributed algorithm called G-REMiT for building an energy efficient multicast tree in a wireless ad hoc network (WANET). G-REMiT employs a more realistic energy consumption model for wireless communication which takes into account not only the energy losses due to radio propagation but also the energy losses in the transceiver electronics. We evaluate the performance of the protocol using two energy consumption model: long range radio and short range radio. We show that for long range radio model, G-REMiT algorithm can achieve better performance than other proposals such as MLU, MLiMST and MIP, and the energy overhead of for executing G-REMiT is negligible compared with the total energy consumption for the multicast communication. For short range radio, we find that existing energy saving scheme by adjusting node's transmission power is not suitable.
1246119
Interface synthesis using memory mapping for an FPGA platform
Several system-on-chip (SoC) platforms have recently emerged that use reconfigurable logic (FPGAs) as a programmable coprocessor to reduce the computational load on the main processor core. We present an interface synthesis approach that forms part of our hardware-software codesign methodology for such an FPGA-based platform. The approach is based on a novel memory mapping algorithm that maps data used by both the hardware and the software to shared memories on the reconfigurable fabric. The memory mapping algorithm couples with a high-level synthesis tool and uses scheduling information to map variables, arrays and complex data structures to the shared memories in a way that minimizes the number of registers and multiplexers used in the hardware interface. We also present three software schemes that enable the application software to communicate with this hardware interface. We demonstrate the utility of our approach and study the trade-offs involved using a case study of the codesign of a computationally expensive portion of the MPEG-1 multimedia application on to the Altera Nios platform.
2930416
Towards multiprocessor feature recognition
Abstract The availability of low-cost computational power is enabling the development of increasingly sophisticated cad software. Automation of design and manufacturing activities poses many difficult computational problems—significant among them is how to develop interactive systems that enable designers to explore and experiment with alternative ideas. As more downstream manufacturing activities are considered during the design phase, computational costs become problematic. Creating working software-based solutions requires a sophisticated allocation of computational resources in order to perform realistic design analyses and generate feedback. This paper presents our initial efforts to employ multiprocessor algorithms to recognize machining features from solid models of parts with large numbers of features and many geometric and topological entities. Our goal is to outline how improvements in computation time can be obtained by migrating existing software tools to multiprocessor architectures. An implementation of our approach is discussed.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
7585766
Extending the Lifetime of Multicast Trees in WANETs
This paper presents a distributed algorithm called L-REMiT for enhancing the lifetime of a source-based multicast tree in wireless ad hoc networks (WANET). The lifetime of a multicast tree is the duration from the formation of the tree to the time when the first node fails due to battery energy exhaustion. L-REMiT assumes that the energy consumed to forward a packet is proportional to the forwarding distance and channel characteristics, and that WANET nodes can dynamically adjust their transmission power. The task of extending the lifetime of a multicast tree is formulated as the task of extending the lifetime of bottleneck nodes in the tree. The number of multicast packets that a bottleneck node can forward, as determined by its residual battery energy and the distance of its farthest child node, is the minimum over all the nodes in the multicast tree. The lifetime of a bottleneck node is improved by reassigning its farthest children to other nodes in the tree with the goal of improving the lifetime of the multicast tree. Nodes only require information from their neighbors for refining the tree in a distributed manner. Simulation results show that L-REMiT has low overhead and performs better than the BIP/MIP and EWMA algorithms.