9949265
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These effects are becoming more prevalent due to short signal switching times and deep submicron circuitry. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We first present a new way for predicting the output waveform produced by an inverter due to a non-square wave pulse at its input. Our modeling technique captures such properties as the amplitude of a pulse and its rise/fall times and the delay through a device. To expedite the computation of the response of a logic gate to an input pulse, we have developed a novel way of modeling such gates by an equivalent inverter. We have developed a mixed-signal test generator that incorporates classical PODEM-like static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. We also present a new analog cost function that is used to guide the search process. Comparison of results with SPICE simulations confirms the accuracy of this approach. This paper focuses primarily on crosstalk induced pulses, but these results have been extended to deal with speedup and slowdown effects.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
8584813
Generation of alternative feature-based models and precedence orderings for machining applications
Incre=ing global competition is challenging the U.S. manufacturing industry to bring competitively-priced, well-designed and well-manufactured products to market in a timely fashion. Since decisions made during the design stage can have significant effects on product cost, quality, and lead time, increasing research attention is being given to integrating engineering design and manufacturing, with a focus on design for manufacturability. Consider the task of designing and manufacturing machined parts. Often there can be several different ways to machine a part. Which way is best depends on several factors, including dimensions, tolerances, surface finishes, availability of machine tools and cutting tools, fixturability, and optimization criteria. Thus, to evaluate the manufacturability of the proposed design, we may need to consider more than one way to machine it. This paper outlines our approach for generating and evaluating alternative ways to machine a part. For additional details, see [1]; for other related work, see [2, 3].
18759063
The Software Concordance: using a uniform document model to integrate program analysis and hypermedia
Since the source code is only one of many types of documents that must be maintained as a software system evolves, modern software development could be improved by better interoperability between source code and other software documents. The Software Concordance is a prototype programming environment that uses hypermedia services and a uniform document model to achieve this interoperability. The Software Concordance editor allows developers to enhance their inline documentation with multimedia objects and hyperlinks, while still supporting advanced program analysis including lexing, parsing and type checking. We motivate the need for environments like the Software Concordance, describe the design and implementation of its program editor, and discuss lessons learned while creating it. The system is based on a uniform, Web compatible document model for both program source code and nonprogram software documents and a corresponding API. Important technical problems addressed by this research include creating a persistent representation of program lexemes that the analysis suite considers to be ephemeral (such as keywords), providing a simple incremental parsing system, and embedding multimedia in source code without disrupting program analysis. Based on insight gained in the process of implementing the document API, a new approach to the design of a more suitable program analysis infrastructure is suggested.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
5173214
Dynamic common sub-expression elimination during scheduling in high-level synthesis
We introduce a new approach, "Dynamic Common Sub-expression Elimination (CSE)", that dynamically eliminates common sub-expressions based on new opportunities created during scheduling of control-intensive designs. Classical CSE techniques fail to eliminate several common sub-expressions in control-intensive designs due to the presence of a complex mix of control and data-flow. Aggressive speculative code motions employed to schedule control-intensive designs often re-order, speculate and duplicate operations, hence changing the control flow between the operations with common sub-expressions. This leads to new opportunities for applying CSE dynamically. We have implemented dynamic CSE in a high-level synthesis framework called Spark and present results for experiments performed using various combinations of CSE and dynamic CSE. The benchmarks used consist of four functional blocks derived from two moderately complex industrial-strength applications, namely, MPEG-1 and the GIMP image processing tool. Our dynamic CSE techniques result in improvements of up to 22% in the controller size and up to 31% in performance; easily surpassing the improvements obtained by the traditional CSE approach. We also observe an unexpected (and significant) reduction in the number of registers using our approach.
15600368
Dynamically adapting registration areas to user mobility and call patterns for efficient location management in PCS networks
In this paper, we propose an extension to the personal communication services (PCS) location management protocol which uses dynamically overlapped registration areas. The scheme is based on monitoring the aggregate mobility and call pattern of the users during each reconfiguration period and adapting to the mobility and call patterns by either expanding or shrinking registration areas at the end of each reconfiguration period. We analytically characterize the trade-off resulting from the inclusion or exclusion of a cell in a registration area in terms of expected change in aggregate database access cost and signaling overhead. This characterization is used to guide the registration area adaption in a manner in which the signaling and database access load on any given location register (LR) does not exceed a specified limit. Our simulation results show that it is useful to dynamically adapt the registration areas to the aggregate mobility and call patterns of the mobile units when the mobility pattern exhibits locality. For such mobility and call patterns, the proposed scheme can greatly reduce the average signaling and database access load on LRs. Further, the cost of adapting the registration areas is shown to be low in terms of memory and communication requirements.