6621319
Test generation for crosstalk-induced delay in integrated circuits
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper shows how crosstalk coupling between lines can affect the propagation delay of signals in integrated circuits. A model is presented to evaluate the effect of parasitic coupling crosstalk. Conditions for the creation of the worst-case coupling and propagation of a delayed signal are presented. A test pattern generation algorithm utilizing the above conditions is presented and applied to several example circuits.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
8584813
Generation of alternative feature-based models and precedence orderings for machining applications
Incre=ing global competition is challenging the U.S. manufacturing industry to bring competitively-priced, well-designed and well-manufactured products to market in a timely fashion. Since decisions made during the design stage can have significant effects on product cost, quality, and lead time, increasing research attention is being given to integrating engineering design and manufacturing, with a focus on design for manufacturability. Consider the task of designing and manufacturing machined parts. Often there can be several different ways to machine a part. Which way is best depends on several factors, including dimensions, tolerances, surface finishes, availability of machine tools and cutting tools, fixturability, and optimization criteria. Thus, to evaluate the manufacturability of the proposed design, we may need to consider more than one way to machine it. This paper outlines our approach for generating and evaluating alternative ways to machine a part. For additional details, see [1]; for other related work, see [2, 3].
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
76622
Machining feature-based similarity assessment algorithms for prismatic machined parts
Abstract This paper presents algorithms for identifying machined parts in a database that are similar to a given query part based on machining features. In this paper we only consider parts that are machined on 3-axis machining centers. We utilize reduced feature vectors consisting of machining feature access directions, feature types, feature volumes, feature dimensional tolerances and feature group cardinality as a basis for assessing shape similarity. We have defined a distance function between two sets of reduced feature vectors to assess the similarity between them from the machining effort point of view. To assess the similarity between the two parts, one set of reduced feature vectors is transformed in space using rigid body transformations with respect to the other set such that the distance between them is minimized. The distance between the two sets of aligned reduced feature vectors is used as a measure of similarity between the two parts. The existing machined parts are rank ordered based on the value of the distance with respect to the query part. The cost of previously machined parts that have a very small distance from the query part can be used as a basis for estimating the cost of machining the new part.
15204415
Dynamic conditional branch balancing during the high-level synthesis of control-intensive designs
We present two novel strategies to increase the scope for application of speculative code motions: (1) Adding scheduling steps dynamically during scheduling to conditional branches with fewer scheduling steps. This increases the opportunities to apply code motions, such as conditional speculation that duplicate operations into the branches of a conditional block. (2) Determining if an operation can be conditionally speculated into multiple basic blocks either by using existing idle resources or by creating new scheduling steps. These strategies lead to balancing of the number of steps in the conditional branches without increasing the longest path through the conditional block. Algorithms for these strategies have been implemented within the Spark high-level synthesis framework that accepts a behavioral description in ANSI-C as input and produces synthesizable register-transfer level VHDL. Experiments on two moderately complex industrial-strength applications, namely, MPEG-1 and the GIMP image processing tool, demonstrate that conditional speculation is ineffective without using these strategies.
1533259
Coordinated transformations for high-level synthesis of high performance microprocessor blocks
High performance microprocessor designs are partially characterized by functional blocks consisting of a large number of operations that are packed into very few cycles (often single-cycle) with little or no resource constraints but tight bounds on the cycle time. Extreme parallelization, conditional and speculative execution of operations is essential to meet the processor performance goals. However, this is a tedious task for which classical high-level synthesis (HLS) formulations are inadequate and thus rarely used. In this paper, we present a new methodology for application of HLS targeted to such microprocessor functional blocks that can potentially speed up the design space exploration for microprocessor designs. Our methodology consists of a coordinated set of source-level and fine-grain parallelizing compiler transformations that targets these behavioral descriptions, specifically loop constructs in them and enables efficient chaining of operations and high-level synthesis of the functional blocks. As a case study in understanding the complexity and challenges in the use of HLS, we walk the reader through the detailed design of an instruction length decoder drawn from the Pentium®-family of processors. The chief contribution of this paper is formulation of a domain-specific methodology for application of high-level synthesis techniques to a domain that rarely, if ever, finds use for it.