206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
12850641
Fault-oriented Test Generation for Multicast Routing Protocol Design
We present a new algorithm for automatic test generation for multicast routing. Our algorithm processes a finite state machine (FSM) model of the protocol and uses a mix of forward and backward search techniques to generate the tests. The output tests include a set of topologies, protocol events and network failures, that lead to violation of protocol correctness and behavioral requirements. We target protocol robustness in specific, and do not attempt to verify other properties in this paper. We apply our method to a multicast routing protocol; PIM-DM, and investigate its behavior in the presence of selective packet loss on LANs and router crashes. Our study unveils several robustness violations in PIM-DM, for which we suggest fixes with the aid of the presented algorithm.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
40067645
A BIST methodology for comprehensive testing of RAM with reduced heat dissipation
The severity of excessive heat dissipation during concurrent BIST of memory modules has been documented previously (1993). In this paper, the authors present new versions of several memory tests that reduce heat dissipation during testing. Each proposed test has the same fault coverage and time complexity as the original version but it reduces heat dissipation by a factor of two or more. For three of the tests, the heat dissipation is reduced by factors of four to sixteen. The design of BIST circuitry required to implement the proposed tests are presented and it is shown that additional area overhead incurred is very small.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
2580676
Adaptive Distributed Dynamic Channel Allocation for Wireless Networks
Channel allocation schemes in a mobile computing (wireless) environment can be either static or dynamic. Static allocation offers negligible channel acquisition time and zero message complexity and works well at a low system load; the performance steadily decreases as system load increases since many calls are dropped. In the case of even temporary hot spots many calls may be dropped by a heavily loaded switching station even when there are enough idle channels in the interference region of that station. On the other hand, dynamic schemes provide better utilization of the channels at higher loads albeit at the cost of higher channel acquisition time and some additional control messages. Our purpose in the present paper is to propose a combined channel allocation scheme so that each switching station can tune to its own load independent of other stations in its interference region; the objective is to minimize the call drop rate and at the same time maintain a minimum average channel acquisition time and minimum control message complexity.
15600368
Dynamically adapting registration areas to user mobility and call patterns for efficient location management in PCS networks
In this paper, we propose an extension to the personal communication services (PCS) location management protocol which uses dynamically overlapped registration areas. The scheme is based on monitoring the aggregate mobility and call pattern of the users during each reconfiguration period and adapting to the mobility and call patterns by either expanding or shrinking registration areas at the end of each reconfiguration period. We analytically characterize the trade-off resulting from the inclusion or exclusion of a cell in a registration area in terms of expected change in aggregate database access cost and signaling overhead. This characterization is used to guide the registration area adaption in a manner in which the signaling and database access load on any given location register (LR) does not exceed a specified limit. Our simulation results show that it is useful to dynamically adapt the registration areas to the aggregate mobility and call patterns of the mobile units when the mobility pattern exhibits locality. For such mobility and call patterns, the proposed scheme can greatly reduce the average signaling and database access load on LRs. Further, the cost of adapting the registration areas is shown to be low in terms of memory and communication requirements.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
18442431
Understanding the Balanced Effects of Belief and Feeling on Information Systems Continuance
There are innumerable studies on technology adoption as well as continuance of usage. A review of previous research shows that cognitive factors are considered prominently in information technology adoption and continuance while the affective feelings of users are not. Although attitude and user satisfaction are common factors considered in information systems research, these factors only involve partial aspects of feelings. Researchers in the marketing areas, as well as the psychology area, begin to note the importance of feelings in understanding and predicting human and customer behavior. In many modern applications, such as mobile Internet services, user feelings are expected to be important, since users are not just technology users but also service consumers. Drawing upon the support of consumer research, social psychology, and computer science, this study proposes a balanced belief–feeling model of IS continuance. In the process of developing this model, the concepts of attitude, belief, and feelings are further articulated, defined, and distinguished. The balanced model is tested in a survey of mobile Internet users. The results established the validity of the model. A comparison with the IS continuance model shows that the new model can explain significantly more variance in continuance intention, taking into account that the new model has more factors. We offer theoretical reasoning for the balanced effects of belief and feeling on IS continuance and discuss the theoretical and practical implications of this study.
118731
A theoretical study of optimization techniques used in registration area based location management: models and online algorithms
We describe a study of optimization techniques which have been proposed in the literature for registration area based location management from the perspective of optimal on-line algorithms. We show that most of these optimization techniques such as forwarding pointers and overlapped registration areas can be modeled using metrical task systems. Some of these models are simple while others are somewhat intricate. These representations directly imply the applicability of existing results on metrical task systems to algorithm design for location management. However, this also means that general lower bounds known for online metrical task systems carry over to our formulations of location management. We also discuss some restricted models in which much better (and simpler) algorithms are possible.