6957855
Random pattern testable logic synthesis
Previous procedures for synthesis of testable logic guarantee that all faults in the synthesized circuits are detectable. However, the detectability of many faults in these circuits can be very low leading to poor random pattern testability. A new procedure to perform logic synthesis that synthesizes random pattern testable multilevel circuits is proposed. Experimental results show that the circuits synthesized by the proposed procedure tstfx are significantly more random pattern testable and smaller than those synthesized using its counterpart fast_extract (fx) in SIS. The proposed synthesis procedure design circuits that require only simple random pattern generators in built-in self-test, thereby obviating the need for complex BIST circuitry.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
5164940
An End-to-End Systems Approach to Elliptic Curve Cryptography
Since its proposal by Victor Miller [17] and Neal Koblitz [15] in the mid 1980s, Elliptic Curve Cryptography (ECC) has evolved into a mature public-key cryptosystem. Offering the smallest key size and the highest strength per bit, its computational efficiency can benefit both client devices and server machines. We have designed a programmable hardware accelerator to speed up point multiplication for elliptic curves over binary polynomial fields GF(2m). The accelerator is based on a scalable architecture capable of handling curves of arbitrary field degrees up to m = 255. In addition, it delivers optimized performance for a set of commonly used curves through hard-wired reduction logic. A prototype implementation running in a Xilinx XCV2000E FPGA at 66.4 MHz shows a performance of 6987 point multiplications per second for GF(2163). We have integrated ECC into OpenSSL, today's dominant implementation of the secure Internet protocol SSL, and tested it with the Apache web server and open-source web browsers.
6130612
Cored-Based Tree with Forwarding Regions (CBT-FR); A Protocol for Reliable Multicasting in Mobile Ad Hoc Networks
In this paper we propose a new protocol for reliable multicast in a multihop mobile radio network. The protocol is reliable, i.e., it guarantees message delivery to all multicast nodes even when the topology of the network changes during multicasting. The proposed protocol uses a core-based shared tree. The multicast tree may get fragmented due to node movements. The notion of a forwarding region is introduced which is used to glue together fragments of multicast trees. The gluing process involves flooding the forwarding region of only those nodes that witness topology change due to node mobility. Delivery of multicast messages to mobile nodes is expedited through (i) pushing the message by witness nodes in their forwarding regions and (ii) pulling messages by a mobile node during (re)joining process. Hence, the protocol conserves network bandwidth by using a combination of the push?pull approach and by restricting flooding only to the essential parts of the network that are affected by topology change. We develop a theoretical model to compute the probability of packet loss (as a function of the mobility rate) for our proposed scheme compared to the the core-based tree protocol (CBT); we also evaluate the effectiveness of forwarding regions as compared to traditional flooding. Our analysis shows that the proposed scheme significantly outperforms CBT.
8368503
Synthesis of testable RTL designs
With several commercial tools becoming available, the high-level synthesis of application-specific integrated circuits is finding wide spread acceptance in VLSI industry today. Existing tools for synthesis focus on optimizing cost while meeting performance constraints or vice versa. Yet, verification and testing have emerged as major concerns of IC vendors since the repercussions of chips being recalled are far-reaching. In this paper, we concentrate on the synthesis of testable RTL designs using techniques from Artificial Intelligence. We present an adaptive version of the well known Simulated Annealing algorithm and describe its application to a combinatorial optimization problem arising in the high-level synthesis of digital systems. The conventional annealing algorithm was conceived with a single perturb operator which applies a small modification to the existing solution to derive a new solution. The Metropolis criterion is then used to accept or reject the new solution. In some of the complex optimization problems arising in VLSI design, a set of perturb functions become necessary, leading to the question of how to select a particular function for modifying the current system configuration. The adaptive algorithm described here uses the concept of reward and penalty from the theory of learning automata to "learn" to apply the appropriate perturb function. We have applied both the conventional simulated annealing algorithm and the adaptive simulated annealing algorithm to the problem of testability-oriented datapath synthesis for signal processing applications. Our experimental results indicate that the adaptive algorithm can yield better solutions in shorter time.
1533259
Coordinated transformations for high-level synthesis of high performance microprocessor blocks
High performance microprocessor designs are partially characterized by functional blocks consisting of a large number of operations that are packed into very few cycles (often single-cycle) with little or no resource constraints but tight bounds on the cycle time. Extreme parallelization, conditional and speculative execution of operations is essential to meet the processor performance goals. However, this is a tedious task for which classical high-level synthesis (HLS) formulations are inadequate and thus rarely used. In this paper, we present a new methodology for application of HLS targeted to such microprocessor functional blocks that can potentially speed up the design space exploration for microprocessor designs. Our methodology consists of a coordinated set of source-level and fine-grain parallelizing compiler transformations that targets these behavioral descriptions, specifically loop constructs in them and enables efficient chaining of operations and high-level synthesis of the functional blocks. As a case study in understanding the complexity and challenges in the use of HLS, we walk the reader through the detailed design of an instruction length decoder drawn from the Pentium®-family of processors. The chief contribution of this paper is formulation of a domain-specific methodology for application of high-level synthesis techniques to a domain that rarely, if ever, finds use for it.
118731
A theoretical study of optimization techniques used in registration area based location management: models and online algorithms
We describe a study of optimization techniques which have been proposed in the literature for registration area based location management from the perspective of optimal on-line algorithms. We show that most of these optimization techniques such as forwarding pointers and overlapped registration areas can be modeled using metrical task systems. Some of these models are simple while others are somewhat intricate. These representations directly imply the applicability of existing results on metrical task systems to algorithm design for location management. However, this also means that general lower bounds known for online metrical task systems carry over to our formulations of location management. We also discuss some restricted models in which much better (and simpler) algorithms are possible.