34697973
Novel test pattern generators for pseudo-exhaustive testing
Pseudo-exhaustive testing involves applying all possible input patterns to individual output cones of a circuit. The testing ensures detection of all combinational faults within individual cones. Test pattern generators based on coding theory principles are not tailored for circuit-under-test and generate inefficient pseudo-exhaustive test sets. We shall describe novel hardware efficient test pattern generators that employ knowledge of the circuit output cone structures for generating minimal test sets. Using our techniques, we have designed generators that generate minimum test sets for partitioned versions of the combinational benchmark circuits.<<ETX>>
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
1246119
Interface synthesis using memory mapping for an FPGA platform
Several system-on-chip (SoC) platforms have recently emerged that use reconfigurable logic (FPGAs) as a programmable coprocessor to reduce the computational load on the main processor core. We present an interface synthesis approach that forms part of our hardware-software codesign methodology for such an FPGA-based platform. The approach is based on a novel memory mapping algorithm that maps data used by both the hardware and the software to shared memories on the reconfigurable fabric. The memory mapping algorithm couples with a high-level synthesis tool and uses scheduling information to map variables, arrays and complex data structures to the shared memories in a way that minimizes the number of registers and multiplexers used in the hardware interface. We also present three software schemes that enable the application software to communicate with this hardware interface. We demonstrate the utility of our approach and study the trade-offs involved using a case study of the codesign of a computationally expensive portion of the MPEG-1 multimedia application on to the Altera Nios platform.
8454699
An Efficient Geometric Algorithm For Extracting Structural Elements to Facilitate Automated MEMS Extraction
Micro-electro-mechanical systems (MEMS) are very small devices that contain both mechanical and electrical elements with sizes in the order of microns. Design cycle time is an important consideration in the development and introduction of MEMS devices in the market. To develop extraction tools for MEMS designs, we need geometric algorithms to analyze the spatial layout of the mechanical portion of the MEMS device and extract a net-list of mechanical components. Such extracted net-list of mechanical components can be combined with the electronic component net-list to provide the complete device schematic. A key step in the extraction of mechanical elements is classification of various portions of the layout into structural elements. Because MEMS designs consist of a large number of elements, computational efficiency of the underlying extraction algorithm is very important for it to work on complex devices. This paper describes an efficient geometric algorithm for extracting structural elements from spatial layout of MEMS designs.
13998462
Geometric algorithms for computing cutter engagement functions in 2.5D milling operations
Cutter engagement is a measure that describes what portion of the cutter is involved in machining at a given instant of time. During profile milling of complex geometries, cutter engagement varies significantly along the cutter path. Cutter engagement information helps in determining the efficiency of the cutter path and also helps in improving it by adjusting the feed rate. This paper describes geometric algorithms for computing piece-wise continuous closed-form cutter engagement functions for 2.5D milling operations. The results produced by our algorithm are compared with the results obtained by discrete simulations of the cutting process and appear to match very well.
6938010
Flip-flop chaining architecture for power-efficient scan during test application
Power dissipation in CMOS circuits during test time poses a crucial bottleneck for circuit performance and robustness. The power consumption due to switching activity while scan-in of test vectors and scan-out of responses is of particular concern. In this paper a methodology for scan chain modification and test vector adaptation is proposed to effectively reduce the scan test power consumption by controlling this switching activity. Proposed approach, unlike the many in published literature, does not incorporate reordering of scan cells; thus avoiding timing and routing overheads. ATPG software ATALANTA was used for test vector generation. The algorithm was verified for ISCAS’89 benchmark circuits, where it showed as much as 27.3% of reduction in switching activity during scan operations.
2580676
Adaptive Distributed Dynamic Channel Allocation for Wireless Networks
Channel allocation schemes in a mobile computing (wireless) environment can be either static or dynamic. Static allocation offers negligible channel acquisition time and zero message complexity and works well at a low system load; the performance steadily decreases as system load increases since many calls are dropped. In the case of even temporary hot spots many calls may be dropped by a heavily loaded switching station even when there are enough idle channels in the interference region of that station. On the other hand, dynamic schemes provide better utilization of the channels at higher loads albeit at the cost of higher channel acquisition time and some additional control messages. Our purpose in the present paper is to propose a combined channel allocation scheme so that each switching station can tune to its own load independent of other stations in its interference region; the objective is to minimize the call drop rate and at the same time maintain a minimum average channel acquisition time and minimum control message complexity.