5825110
Debating the Future of Burn-In
2705949
Logic soft errors in sub-65nm technologies design and CAD challenges
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technologies require designs with built-in logic soft error protection. Effective logic soft error protection requires solutions to the following three problems: (1) accurate soft error rate estimation for combinational logic networks; (2) automated estimation of system effects of logic soft errors, and identification of regions in a design that must be protected; and, (3) new cost-effective techniques for logic soft error protection, because classical fault-tolerance techniques are very expensive.
15807495
Application-independent testing of FPGA interconnects
We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-access-memory-based field programmable gate arrays (FPGAs). This technique targets detection of open and bridging faults in the wiring channels and programmable switches in the interconnects. Experimental results on Xilinx Virtex FPGAs show that very few test configurations are required to cover stuck-open, stuck-closed, open, and bridging faults in the interconnects.
2397835
Speed clustering of integrated circuits
Experimental data on 0.18 /spl mu/ test chips shows strong evidence of clustering of speeds of neighboring dies on a wafer. This clustering phenomenon is utilized to develop techniques for predicting the speed of a part from the speeds of three or more of its neighbors. On-chip processor monitors are used to further improve the prediction accuracy of these techniques. Experimental data demonstrates both the effectiveness of these prediction schemes and the possibility of applying of them to reduce the cost of speed binning.
900289
Techniques and algorithms for fault grading of FPGA interconnect test configurations
Conventional fault simulation techniques for field programmable gate arrays (FPGAs) are very complicated and time consuming. The alternative, FPGA fault emulation technique, is incomplete and can be used only after the FPGA chip is manufactured. In this paper, we present efficient algorithms for computing the fault coverage of a given FPGA test configuration. The faults considered are opens and shorts in FPGA interconnects. The presented technique is able to report all detectable and undetectable faults and, compared with conventional methods, is orders of magnitude faster.
42903241
Test vector compression using EDA-ATE synergies
This paper presents a new test vector compression technique, which utilizes synergies between Automatic Test Pattern Generation (ATPG) tools provided by EDA (Electronic Design Automation) vendors and Automatic Test Equipment (ATE). The basic approach is to achieve significant compression by agreeing between ATE and ATPG on how to fill don't care values in the test vectors such that these bits need not be stored on ATE and also possibly not communicated to DUT if decompression is done on chip. Our new technique allows sub-vector level fine grained mixing of pseudo-randomly generated bits and ATPG generated bits. Experimental results, on an actual industrial network processor design, show a compression ratio of about 17x.
10906898
The Role of Statistical Models in Biometric Authentication
The current paper demonstrates the role of statistical models in authentication tasks – both in system development and in performance evaluation. We first introduce a model-based face authentication system based on the Fourier domain phase using Gaussian Mixture Models (GMM) which yields verification error rates as low as 0.3% on a face database of 65 individuals with extreme illumination variations. We then present a statistical framework for predicting authentication error rates for future populations in a rigorous way. This is in contrast to most evaluation protocols used today that are based on observational studies and valid only for the databases at hand. Applications establish that our model-based approach has better predictive performance than an existing state-of-the-art authentication technique.
45280262
Leveraging information in multi-echelon inventory systems
Abstract Decision-making in multi-echelon inventory systems is often facilitated by the availability of information. In this paper, we examine the effect of utilising demand information in a one-warehouse two-retailer system operating under periodic-review. A common and fixed replenishment interval is assumed for all stages. The lead times are deterministic, and are small compared to the replenishment interval. The warehouse does not maintain any cycle stock, i.e., as soon as replenishment arrives at the warehouse, retailers’ demands are fulfilled from the available stock. In the event of a shortage at the warehouse, two cases have been considered––emergency shipment and allocation. For both the cases, expected total cost (ETC) models have been developed, and it has been shown through numerical examples that the optimal ETC in the presence of demand information is always lower than that in the absence of demand information. It is also noted that the order-up-to level at the warehouse has to be dynamic to reap the benefits of availability of demand information.
62742629
Local facial asymmetry for expression classification
We explore a novel application of facial asymmetry: expression classification. Using 2D facial expression images, we show the effectiveness of automatically selected local facial asymmetry for expression recognition. Quantitative evaluations of expression classification using local asymmetry demonstrate statistically significant improvements over expression classification results on the same data set without explicit representation of facial asymmetry. A comparison of discriminative local facial asymmetry features for expression classification versus human identification is given.
6745026
Translating Timed I/O Automata Specifications for Theorem Proving in PVS
Timed Input/Output Automaton (TIOA) is a mathematical framework for specification and analysis of systems that involve discrete and continuous evolution. In order to employ an interactive theorem prover in deducing properties of a TIOA, its state-transition based description has to be translated to the language of the theorem prover. In this paper, we describe a tool for translating TIOA to the language of the Prototype Verification System (PVS)—a specification system with an integrated interactive theorem prover. We describe the translation scheme, discuss the design decisions, and briefly present three case studies to illustrate the application of the translator in the verification process.
13253511
Verifying Average Dwell Time by Solving Optimization Problems
A switched system is a hybrid system whose discrete mechanisms are abstracted away in terms of an exogenous switching signal which brings about the mode switches. For switched systems, the Average Dwell time (ADT) property defines restricted classes of switching signals which can be used for proving stability. In this paper, we develop optimization-based methods for automatically verifying ADT properties of hybrid systems. This enables us to prove stability of hybrid systems, provided the individual modes of the system are stable. For two special classes of hybrid systems, we show that the resulting optimization problems can indeed be solved efficiently using standard mathematical programming techniques. We also present simulation relation-based proof methods for establishing equivalence of hybrid systems with respect to ADT. The proposed methods are applied to verify ADT properties of a linear hysteresis switch and a nondeterministic thermostat.