6948566
Process variations and their impact on circuit operation
The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using data obtained from a 0.8 /spl mu/m CMOS process. The impact of these variations and correlations on circuit operation is illustrated. Examples show that circuit delay can increase from the mean by about 100% due to crosstalk effects aggravated by process variations. Case studies emphasize the need for a tighter coupling between fabrication and circuit design and the need for new design corners based on process information.
206516479
BIST TPG for SRAM cluster interconnect testing at board level
A Built-In Self-Test (BIST) methodology and a test pattern generation (TPG) architecture for testing static random access memory (SRAM) interconnect at board level via IEEE 1149.1 Boundary Scan (BS) Architecture are presented. Due to the expense and complexity of BS circuitry the widely-used SRAMs on most modern telecommunication circuit boards seldom contain BS architecture. (We call such non-boundary scan ICs cluster-ICs.) Hence, a methodology that tests the large numbers of board-level interconnects at the control, address, and data lines of cluster SRAMs is necessary. This is especially essential for board-level interconnect BIST which is used not only for manufacturing testing but also for system testing after integration. Newly identified prohibited conditions, which enable re-arrangement and merger of tests, are incorporated into test conditions for SRAM cluster interconnects. These improvements have been exploited to develop an efficient test procedure that is suitable for BIST. The proposed BIST methodology generates TPGs that (i) guarantee the avoidance of multi-driver conflicts when testing via BSA, (ii) guarantee the detection of all testable SRAM cluster interconnect faults, (iii) have low area overhead, and (iv) have short test lengths.
5347587
Process aggravated noise (PAN): new validation and test problems
How the trends in circuit design are increasing the significance of noise effects, such as crosstalk and ground bounce, is demonstrated. Further aggravated by process variations, these process aggravated noise (PAN) effects must be considered as an integral part of the design validation methodology. It is shown that the validation of a design in the presence of PAN effects requires simulation at new design corners that are not typically considered during the validation of digital CMOS circuits. Furthermore, it is shown that the choice of a new design corner depends not only on the particular PAN effect under consideration, but also on the nature of the circuit. We demonstrate the need for automating the process of selecting design corners as well as test sequences for validation and outline strategies for their automation.
206766191
Accurate and efficient static timing analysis with crosstalk
We have developed an accurate and efficient methodology to perform static timing analysis (STA) in combinational logic blocks in the presence of multiple crosstalk-induced noise effects. The crosstalk model used is more accurate because it considers skew, input transition times, and driver strengths. This crosstalk model is enhanced to handle timing ranges for performing STA. The methodology also uses more accurate delay models for gates. The presence of one or more coupling capacitances can create cyclic timing dependencies, even in an otherwise acyclic circuit. We have developed an approach to partition the circuit into minimal timing-iterative subcircuits (TISs) that encapsulate the cyclic timing dependencies. When used in conjunction with our levelization procedure, iterative timing analysis is confined within individual TISs. We have demonstrated that the maximum arrival time values computed by the proposed STA using integrated delay models are much closer to detailed circuit simulation results than an STA that uses the 3C/sub c/ delay model.
45533435
BIST TPG for combinational cluster (glue logic) interconnect testing at board level
Due to the expense and complexity of boundary scan architecture (BSA) circuitry, non-boundary scan ICs (cluster ICs) are still used in modern circuit boards. A novel BIST architecture and a TPG design methodology to program this architecture are presented for testing inter-IC interconnects among combinational cluster ICs via IEEE 1149.1 BSA at board level. The two main issues that are tackled are: (1) safe testing, i.e., avoidance of conflicts at all multi-driver nets; and (2) obtaining complete coverage of all detectable faults in the interconnect. We have proposed a realistic model of interconnects that contain combinational cluster ICs, identified test requirements that must be satisfied by the TPG to achieve the above objectives, and developed a new TPG architecture that satisfies these test requirements. We have theoretically proven that the proposed technique guarantees safe and comprehensive testing of cluster interconnects and also demonstrated this fact via its applications to a few example circuits.
5894578
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that detect the faults of interest. Usually a linear feedback shift register (LFSR) is used to generate test patterns. We first analyze the probability that an arbitrary pseudo-random test sequence of short length detects all faults. The term short is relative to the probability of detecting the fault having the fewest test patterns. We then show how to guide the search for an initial state (seed) for a LFSR with a given primitive feedback polynomial so that all the faults of interest are detected by a minimum length test sequence. Our algorithm is based on finding the location of test patterns in the sequence generated by this LPSR. This is accomplished using, the theory of discrete logarithms. We then select the shortest subsequence that includes test patterns for all the faults of interest, hence resulting in 100% fault coverage. >
6821018
Concurrent evaluation of machinability during product design
An approach to evaluating the machinability of a part during the design stage, which performs systematic generation and evaluation of machining alternatives, is discussed. The results of the analysis provide feedback to the designer about problems that might arise with the machining and information to the manufacturing engineer about which machining processes and process parameters are most desirable.<<ETX>>
6284071
Algorithms for Computing Global Accessibility Cones
This paper describes algorithms for computing global accessibility cones for each face (i.e., the set of directions from which faces are accessible) on a polyhedral object. We describe exact mathematical conditions and the associated algorithm for determining the set of directions from which a planar face with triangular boundary is inaccessible due to another face on the object. By utilizing the algorithm to compute the exact inaccessibility region for a face, we present algorithms for computing global accessibility cones for each face on the object. These global accessibility cones are represented as a matrix structure and can be used to support a wide variety of accessibility queries for the object.
8312479
Using global code motions to improve the quality of results for high-level synthesis
The quality of synthesis results for most high-level synthesis approaches is strongly affected by the choice of control flow (through conditions and loops) in the input description. This leads to a need for high-level and compiler transformations that overcome the effects of programming style on the quality of generated circuits. To address this issue, we have developed a set of speculative code-motion transformations that enable movement of operations through, beyond, and into conditionals with the objective of maximizing performance. We have implemented these code transformations, along with supporting code-motion techniques and variable renaming techniques, in a high-level synthesis research framework called Spark. Spark takes a behavioral description in ANSI-C as input and generates synthesizable register-transfer level VHDL. We present results for experiments on designs derived from three real-life multimedia and image processing applications, namely, the MPEG-1 and -2 and GNU image manipulation program applications. We find that the speculative-code motions lead to reductions between 36% and 59% in the number of states in the finite-state machine (controller complexity) and the cycles on the longest path (performance) compared with the case when only nonspeculative code motions are employed. Also, logic synthesis results show fairly constant critical path lengths (clock period) and a marginal increase in area.
12878004
Criticality aware access control model for pervasive applications
Access control policies define the rules for accessing system resources. Traditionally, these are designed to take a reactive view for providing access, based on explicit user request. This methodology may not be sufficient in the case of critical events (emergencies) where automatic and timely access to resources may be required to facilitate corrective actions. This paper introduces the novel concept of criticality which measures the level of responsiveness for taking such actions. The paper further incorporates criticality in an access control framework for facilitating the management of critical situations. Specific properties and requirements for such criticality aware access control are identified and a sample model is provided along with its verification
9848460
Geometric algorithms for automated design of rotary-platen multi-shot molds
This paper describes algorithms for automated design of rotary-platen type of multi-shot molds for manufacturing multi-material objects. The approach behind our algorithms works in the following manner. First, we classify the given multi-material object into several basic types based on the relationships among different components in the object. For every basic type, we find a molding sequence based on the precedence constraints resulting due to accessibility and disassembly requirements. Then, starting from the last mold stage, we generate the mold pieces for every mold stage. We expect that algorithms described in this paper will provide the necessary foundations for automating the design of rotary-platen molds.