Magnetic force microscopy study of domain structures in magnetic films
Magnetic force microscopy is used to investigate two different types of samples: thin metal films and ferrite garnet films. It is pointed out for garnet films that magnetic force microscopy allows us only to judge the domain structure of surface layers. Problems associated with conducting measurements in external magnetic fields, the effect of the magnetic field of the probe on the investigated domain structure, and using magneto-polarized optics in combination with magnetic force microscopy are considered.