Determination of the stress level for voltage screen of integrated circuits
Abstract Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (focusing on one specific mechanism) without taking into account the particularities and the knowledge of the specific process. This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification.