Local critical current measurements on (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ tape with an electromagnetic probe
The use of induced currents from a small noncontacting electromagnetic probe to determine the critical current density in a (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag tape on a local scale is described. The technique forces full field penetration into the tape locally and infers the critical current density from the Bean critical state model, accounting for the Ag overlayers. Critical current images of the tape can be obtained by scanning the probe over the tape surface with spatial resolution on the order of 1.0 mm. Results for tapes with different microstructures are discussed.<<ETX>>