Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode $0.18~\mu\hbox{m}$  CMOS Image Sensors
The radiation tolerance of a 0.18 μm technology CMOS commercial image sensor has been evaluated with Co60 and proton irradiations. The effects of protons on the hot pixels and dynamic bias and duty cycle conditions during gamma irradiations are studied.