Metalorganic vapor phase epitaxial growth, characterization and annealing experiments on InP doping superlattices
InP doping superlattices (DSLs) were grown by atmospheric pressure metalorganic vapor phase epitaxy (MOVPE) and their stability was examined by annealing at high temperatures. Diethylzinc (DEZ) and H2S were used asp- andn-type doping sources, respectively. Photoluminescence (PL) measurements performed on as grown layers show a shift of the main emission peak with increasing excitation power in very good agreement with theoretical models. A comparison of the PL results between these structures and the annealed samples show that even at very high temperatures (up to 850° C) the tunability of the effective bandgap of the annealed superlattices is possible, although less pronounced than for the as grown layers. This is due to diffusion of the dopants, into adjacent layers and partial compensation of each other. Secondary ion mass spectrometry (SIMS) done on the as grown and annealed samples shows that only the Zn atoms diffuse. Diffusion coefficients obtained from the SIMS profiles give values in the range 1 × 10−14 <D < 9 × 10−14 cm2/s, still smaller than other published values estimated on layers, which did not suffer any treatment. This shows the high quality and stability of our layers even at high temperatures.