Optical characterization of (GaIn)(NAs)/GaAs MQW structures
Abstract(GaIn)(NAs)/GaAs multiple quantum well (MQW) structures with high structural perfection as determined from high-resolution x-ray diffraction (XRD) analysis have been deposited by low-temperature metal organic vapor phase epitaxy (MOVPE) at 525°C using triethylgallium (TEGa) and trimethylindium (TMIn) in combination with 1,1-dimethylhydrazine (UDMHy) and tertiarybutylarsine (TBAs). The optical characteristics of as-grown MQW structures as a function of quaternary composition and of well width are established by PL spectroscopy at 300 K. With increasing N-content a reduction in PL efficiency and an increase in PL linewidth is observed. This behavior might be correlated to an increase in defect density with increasing N-content and/or to a bandstructure effect in this novel material system. For an increase in Inconcentration the tendency for a reduction in the extreme bowing of the band gap is detected. Strong quantization effects are observed for well widths below 5 nm only in this novel MQW system, which indicates significantly larger electron masses as compared to N-free (GaIn)As.