Power saving modes in modern microcontroller design, diagnostics and reliability
Abstract This paper is targeting some of the most important problems in modern microcontroller-on-chip design: low power consumption, efficient chip diagnostics and design reliability. A case study of a microcontroller device is presented. Applied system-level techniques for dynamic power saving are described. Chip diagnostic methods are developed that are based on measuring of the supply current in different power saving modes. Special attention is also paid to design reliability issues. The device reliability limits are tested on both manufacturing and electrical stress failure mechanisms.