Local structures of (Ge4/Si4)5 monolayer strained-layer supperlattice probed by fluorescence XAFS.
a Electrotechnical Laboratory, 1-1-4 Umezono, Tsukuba, Ibaraki 305, Japan. b Department of Materials Science & Engineering, Nagoya University, Nagoya 464-01, Japan. c AT & T Be# Laboratories, Murray Hill, New Jersey 07733, U.S.A. (Present address: University of Washington, Seattle, Washington 98195, U.S.A.). E-mail: sqwei@etLgo.jp. * Permanent address: Center for Fundamental Physics, University of Science & Technology of China, Hefei 230026, P.R. China.