A physical strength-stress interference model explaining infant and random mortalit
Abstract Understanding and measuring random mortality of electronic components Is of upmost importance because the reliability estimation of electronic boards, hence systems, is based on the knowledge on the individual component failure rate. Field failure return experts explain the failures by a stressing environment characterized by random overstresses. If this explanation is validated the classical reliability measurement methods (e.g. life test) must be reconsidered. The purpose of this study is to establish failure model starting from a physical stress strength interference model. The obtained result is quite surprising because it also supplies an alternate explanation for a observed s infant mortality phenomena.