Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power
Total ionizing dose experiments showed an increase in operating frequency (and therefore, power consumption) in bulk CMOS ring oscillators when operated at ultra-low power supply voltages. Combined-environment experiments showed the single-event susceptibility of ULP circuits increases with total dose exposure. To operate ULP circuits in a total dose environment and ensure there is little change in their circuit characteristics, the supply voltage should be greater than 400 mV.