Fine structure of faces and imperfection of surface layers of shaped sapphire crystals
The development of faces on cylindrical and ribbon-shaped sapphire single crystals grown from a melt using the Stepanov method is investigated by optical and electronic microscopy. The crystallographic indices on the detected faces are established, and the microstructure of the growth layers is studied. The X-ray spectral microanalysis of foreign particles on the sapphire surface confirms the presence of molybdenum single crystals on it. Cathodoluminescence spectra of surface layers of sapphire single crystals are obtained.