Analytic SEU rate calculation compared to space data
A method is described for deriving analytic expressions for single-event-upset rates in space. The method is applicable to semiconductor devices with sensitive volumes approximating a thin lamina. The approximation applies to a large majority of devices in use today. The method replaces more complicated calculations involving chord distributions without any loss in rigor. The results agree with satellite data for the 93L422, the 54L78, and an NMOS RAM used in the Global Positioning Satellite. >