SEU Cross Sections of Hardened and Unhardened SiGe Circuits
Several simple circuits, implemented in both soft and hardened versions, were designed using IBM's SiGe 5 HP technology. Heavy-ion and proton single event upset tests showed that the hardened circuits typically had a lower cross section, higher threshold LET and shorter upset duration. The increased threshold LET proved especially significant since it resulted in a decrease in proton cross section of an order of magnitude