A challenging case study resolved by using the Dynamic Laser Stimulation technique
Abstract The case study device shows an abnormal electrical behavior after a few years of operation whereas new devices are normal. This abnormal behavior is proved to be related to power supply and temperature, the worst combination being “low” temperature (under 20 °C) and low voltage. We will use the Dynamic Laser Stimulation to identify and localize the specific device structures involved in the defect.