Procedure for modeling the distribution of doping components using data from X-ray diffraction experiments
An X-ray diffraction procedure is proposed for modeling the distribution of components in the depth of an alloy by analyzing the integral intensity, shape, and width of diffraction peaks of two orders of reflection. The procedure is used to refine data on the phase composition and distribution of indium atoms in the depth of hydrogenised Pd-In-Ru alloy after its long-term relaxation.