Surface Effects of the HgI(2) Crystal Characterized by Spectroscopic Ellipsometry.
We report on determination of the surface effects of mercuric iodide (HgI(2)) uniaxial HgI(2) optical parameters with a fixed-polarizer, rotating-polarizer, and fixed-analyzer spectroscopic ellipsometer (PRPSE) after chemical polishing. The characteristics of the chemical complex [KHgI(3), H(2)O] that forms on the HgI(2) surface during KI etching have been investigated over the spectral range from 400 to 800 nm. Surface roughness and effects of the ellipsometric parameters of HgI(2) were treated, and the thickness of the layer formed on the surface was determined and analyzed by PRPSE. The surface roughness was modeled with the Bruggeman effective medium approximation.