Design and characterization of thick InxGa1-xAs metamorphic buffer layers grown by hydride vapor phase epitaxy
Thick InxGa1-xAs metamorphic buffer layers (MBLs) grown by hydride vapor phase epitaxy (HVPE) were studied. Relationships between MBL properties and growth parameters such as grading rate, cap layer thickness, final xInAs, and deposition temperature (TD) were explored. The MBLs were characterized by measurement of in-plane residual strain (???), surface etch pit density (EPD), and surface roughness. Capping layer thickness had a strong effect on strain relaxation, with thickly capped samples exhibiting the lowest ???. EPD was higher in samples with thicker caps, reflecting their increased relaxation through dislocation generation. ??? and EPD were weakly affected by the grading rate, making capping layer thickness the primary structural parameter which controls these properties. MBLs graded in discrete steps had similar properties to MBLs with continuous grading. In samples with identical thickness and 10-step grading style, ??? increased almost linearly with final xInAs, while total relaxation stayed relatively constant. Relaxation as a function of xInAs?could be described by an equilibrium model in which dislocation nucleation is impeded by the energy of the existing dislocation array. EPD was constant from xInAs?= 0 to 0.24 then increased exponentially, which is related to the increased dislocation interaction and blocking seen at higher dislocation densities. RMS roughness increased with xInAs?above a certain strain rate (0.15%/?m); samples grown below this level possessed large surface hillocks and high roughness values. The elimination of hillocks at higher values of xInAs?is attributed to increased density of surface steps and is related to the out-of-plane component of the burgers vector of the dominant type of 60? dislocation. TD?did not affect ??? for samples with a given xInAs. EPD tended to increase with TD, indicating dislocation glide likely is impeded at higher temperatures.