Sample chamber for synchrotron based in-situ X-ray diffraction experiments under electric fields and temperatures between 100 K and 1250 K
A custom sample chamber developed for synchrotron X-ray experiments conducted at varying temperatures combined with the application of electric fields is presented. The chamber features an exchangeable hemispherical dome and an xyz manipulator for electric contacting of the sample. The article describes heating and cooling capabilities, exemplary experiments and plans for future upgrades of the chamber.