Technological centering—An experimental approach to VLSI ICs yield maximization
Abstract One of the basic goals of IC design is the production yield maximization. A yield optimization problem by technological parameters centering is analyzed assuming the real conditions of an IC production line. The problem is called technological centering. A heuristic-experimental solution of the above mentioned problem is proposed. The method presented here can be useful for practical verification of an analytical project or as an improvement of this kind of design. An example of technological centering application fully confirms its effectiveness, besides its heuristic character.