A note on a lifetime model
Abstract In a paper by G. Bosch, Microelectr. Rel. Vol. 19, the lifetime of an electronic device is described by the degradation of a quality parameter p. The description of the degradation of p depending on the time allows the determination of the lifetime distribution. The mentioned paper is interesting although there the expression hazard rate is used for density. In the present note a method for inference with the help of the mentioned model is given and shown how it can be used for accelerated lifetests.