Impedance measurements on Au microelectrodes using controlled atmosphere high temperature scanning probe microscope
Abstract High temperature impedance measurements on Au microelectrodes deposited on polished yttria stabilized zirconia (YSZ) pellets were demonstrated using a newly designed controlled atmosphere high temperature scanning probe microscope (CAHT-SPM). Probes based on Pt 0.8 Ir 0.2 were fabricated and employed in all the investigations. The electrical properties of the Au microelectrodes were investigated using CAHT-SPM at various temperatures in air. The influences of the tip-sample force and of the size of the microelectrode on the electrical properties of the Au microelectrodes were also studied. The impedance spectra of circular Au microelectrodes down to 8 μm in diameter at different temperatures were successfully obtained. The CAHT-SPM presented in this paper is capable of obtaining topography images, conductivity images and impedance spectra in-situ in a temperature range from room temperature to at least 650 °C.