atomic force microscopy
14326655
Atomic Force Microscopy: A Powerful Tool to Address Scaffold Design in Tissue Engineering
Functional polymers currently represent a basic component of a large range of biological and biomedical applications including molecular release, tissue engineering, bio sensing and medical imaging. Advancements in these fields are driven by the use of a wide set of biodegradable polymers with controlled physical and bio interactive properties. In this context, microscopy techniques such as Atomic Force Microscopy (AFM) are emerging as fundamental tools to deeply investigate morphology and structural properties at micro and sub micrometric scale, in order to evaluate the in time relationship between physicochemical properties of biomaterials and biological response. In particular, AFM is not only a mere tool for screening surface topography, but may offer a significant contribution to understand surface and interface properties, thus concurring to the optimization of biomaterials performance, processes, physical and chemical properties at the micro and nanoscale. This is possible by capitalizing the recent discoveries in nanotechnologies applied to soft matter such as atomic force spectroscopy to measure surface forces through force curves. By tip sample local interactions, several information can be collected such as elasticity, viscoelasticity, surface charge densities and wettability. This paper overviews recent developments in AFM technology and imaging techniques by remarking differences in operational modes, the implementation of advanced tools and their current application in biomaterials science, in terms of characterization of polymeric devices in different forms (i.e. fibres, films or particles)
Journal of functional biomaterials
Marica Marrese Vincenzo Guarino Luigi Ambrosio
126342629
The limit of time resolution in frequency modulation atomic force microscopy by a pump probe approach
Atomic force microscopy (AFM) routinely achieves structural information in the sub nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general analysis of the lower limit for time resolution in AFM. Our finding suggests that the time resolution in AFM is ultimately limited by the well known thermal limit of AFM and not as often proposed by the mechanical response time of the force sensing cantilever. We demonstrate a general pump probe approach using the cantilever as a detector responding to the averaged signal. This method can be applied to any excitation signal such as electrical, thermal, magnetic or optical. Experimental implementation of this method allows us to measure a photocarrier decay time of ~1 ps in low temperature grown GaAs using a cantilever with a resonant frequency of 280 kHz.
Zeno Schumacher Andreas Spielhofer Yoichi Miyahara Peter Grutter
53195174
Custom Designed Glassy Carbon Tips for Atomic Force Microscopy
Glassy carbon is a graphenic form of elemental carbon obtained from pyrolysis of carbon rich precursor polymers that can be patterned using various lithographic techniques. It is electrically and thermally conductive, mechanically strong, light, corrosion resistant and easy to functionalize. These properties render it very suitable for Carbon microelectromechanical systems (Carbon MEMS) and nanoelectromechanical systems (Carbon NEMS) applications. Here we report on the fabrication and characterization of fully operational, microfabricated glassy carbon nano tips for Atomic Force Microscopy (AFM) These tips are 3D printed on to micro machined silicon cantilevers by Two Photon Polymerization (2PP) of acrylate based photopolymers (commercially known as IP series resists) followed by their carbonization employing controlled pyrolysis, which shrinks the patterned structure by =98% in volume. Tip performance and robustness during contact and dynamic AFM modes are validated by morphology and wear tests. The design and pyrolysis process optimization performed for this work indicate which parameters require special attention when IP series polymers are used for the fabrication of Carbon MEMS and NEMS. Microstructural characterization of the resulting material confirms that it features a frozen percolated network of graphene sheets accompanied by disordered carbon and voids, similar to typical glassy carbons. The presented facile fabrication method can be employed for obtaining a variety of 3D glassy carbon nanostructures starting from the stereolithographic designs provided by the user.
Micromachines
Anna Zakhurdaeva Philipp-Immanuel Dietrich Hendrik Holscher Christian Koos Jan G Korvink Swati Sharma
19592669
A review of demodulation techniques for amplitude modulation atomic force microscopy
In this review paper, traditional and novel demodulation methods applicable to amplitude modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth limiting component in the z axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high speed tapping mode atomic force microscopy experiments in constant height mode.
Beilstein journal of nanotechnology
Michael G Ruppert David M Harcombe Michael R P Ragazzon S O Reza Moheimani Andrew J Fleming
13070424
Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized molecular groups and has many shortcomings in the aspects of determining the mechanism of the interactions and the elaborate structure due to the limitations of the technology, itself, such as non specificity and low imaging speed. To overcome the technical limitations, it is necessary to combine AFM with other complementary techniques, such as fluorescence microscopy. The combination of several complementary techniques in one instrument has increasingly become a vital approach to investigate the details of the interactions among molecules and molecular dynamics. In this review, we reported the principles of AFM and optical microscopy, such as confocal microscopy and single molecule localization microscopy, and focused on the development and use of correlative AFM and optical microscopy.
Sensors
Lulu Zhou Mingjun Cai Ti Tong Hongda Wang
11389301
Imaging and Force Recognition of Single Molecular Behaviors Using Atomic Force Microscopy
The advent of atomic force microscopy (AFM) has provided a powerful tool for investigating the behaviors of single native biological molecules under physiological conditions. AFM can not only image the conformational changes of single biological molecules at work with sub nanometer resolution, but also sense the specific interactions of individual molecular pair with piconewton force sensitivity. In the past decade, the performance of AFM has been greatly improved, which makes it widely used in biology to address diverse biomedical issues. Characterizing the behaviors of single molecules by AFM provides considerable novel insights into the underlying mechanisms guiding life activities, contributing much to cell and molecular biology. In this article, we review the recent developments of AFM studies in single molecule assay. The related techniques involved in AFM single molecule assay were firstly presented, and then the progress in several aspects (including molecular imaging, molecular mechanics, molecular recognition, and molecular activities on cell surface) was summarized. The challenges and future directions were also discussed.
Sensors
Mi Li Dan Dang Lianqing Liu Ning Xi Yuechao Wang
102423916
Chemical bond imaging using higher eigenmodes of tuning fork sensors in atomic force microscopy
We demonstrate the ability of resolving the chemical structure of single organic molecules using non contact atomic force microscopy with higher normal eigenmodes of quartz tuning fork sensors. In order to achieve submolecular resolution, CO functionalized tips at low temperatures are used. The tuning fork sensors are operated in ultrahigh vacuum in the frequency modulation mode by exciting either their first or second eigenmode. Despite the high effective spring constant of the second eigenmode (on the order of several tens of kN/m) the force sensitivity is sufficiently high to achieve atomic resolution above the organic molecules. This is observed for two different tuning fork sensors with different tip geometries (small tip vs. large tip) These results represent an important step towards resolving the chemical structure of single molecules with multifrequency atomic force microscopy techniques where two or more eigenmodes are driven simultaneously.
Daniel Ebeling Qigang Zhong Sebastian Ahles Lifeng Chi Hermann A Wegner Andre Schirmeisen
7774302
Characterization of Cell Scaffolds by Atomic Force Microscopy
This review reports on the use of the atomic force microscopy (AFM) in the investigation of cell scaffolds in recent years. It is shown how the technique is able to deliver information about the scaffold surface properties (e.g. topography) as well as about its mechanical behavior (Young's modulus, viscosity, and adhesion) In addition, this short review also points out the utilization of the atomic force microscope technique beyond its usual employment in order to investigate another type of basic questions related to materials physics, chemistry, and biology. The final section discusses in detail the novel uses that those alternative measuring modes can bring to this field in the future.
Polymers
Jagoba Iturri Jose Luis Toca-Herrera
205906878
The structure and function of cell membranes examined by atomic force microscopy and single molecule force spectroscopy.
The cell membrane is one of the most complicated biological complexes, and long term fierce debates regarding the cell membrane persist because of technical hurdles. With the rapid development of nanotechnology and single molecule techniques, our understanding of cell membranes has substantially increased. Atomic force microscopy (AFM) has provided several unprecedented advances (e.g. high resolution, three dimensional and in situ measurements) in the study of cell membranes and has been used to systematically dissect the membrane structure in situ from both sides of membranes; as a result, novel models of cell membranes have recently been proposed. This review summarizes the new progress regarding membrane structure using in situ AFM and single molecule force spectroscopy (SMFS) which may shed light on the study of the structure and functions of cell membranes.
Chemical Society reviews
Yuping Shan Hongda Wang
8796339
High bandwidth multimode self sensing in bimodal atomic force microscopy
Using standard microelectromechanical system (MEMS) processes to coat a microcantilever with a piezoelectric layer results in a versatile transducer with inherent self sensing capabilities. For applications in multifrequency atomic force microscopy (MF AFM) we illustrate that a single piezoelectric layer can be simultaneously used for multimode excitation and detection of the cantilever deflection. This is achieved by a charge sensor with a bandwidth of 10 MHz and dual feedthrough cancellation to recover the resonant modes that are heavily buried in feedthrough originating from the piezoelectric capacitance. The setup enables the omission of the commonly used piezoelectric stack actuator and optical beam deflection sensor, alleviating limitations due to distorted frequency responses and instrumentation cost, respectively. The proposed method benefits from a more than two orders of magnitude increase in deflection to strain sensitivity on the fifth eigenmode leading to a remarkable signal to noise ratio. Experimental results using bimodal AFM imaging on a two component polymer sample validate that the self sensing scheme can therefore be used to provide both the feedback signal, for topography imaging on the fundamental mode, and phase imaging on the higher eigenmode.
Beilstein journal of nanotechnology
Michael G Ruppert S O Reza Moheimani