5937656
Complexity analysis and speedup techniques for optimal buffer insertion with minimum cost
As gate delays decrease faster than wire delays for each technology generation, buffer insertion becomes a popular method to reduce the interconnect delay. Several modern buffer insertion algorithms (e.g., [7, 6, 15]) are based on van Ginneken's dynamic programming paradigm [14]. However, van Ginneken's original algorithm does not control buffering resources and tends to over-buffering, thereby wasting area and power. It has been a major open problem whether it is possible to optimize slack and at the same time minimize the buffer usage.This paper settles this open problem by showing that for arbitrary integer cost functions, the problem is NP-complete. We also extend the pre-buffer slack technique [12] to minimize the buffer cost. This technique can significantly reduce the running time and memory in buffer cost minimization problem. The experimental results show that our algorithm can speed up the running time up to 17 times and reduces the memory to 1/30 of traditional best know algorithm. Finally, we show how to efficiently deal with multiway merge in buffer insertion.
195989392
Process variation dimension reduction based on SVD.
We propose an algorithm based on singular value decomposition (SVD) to reduce the number of process variation variables. With few process variation variables, fault simulation and timing analysis under process variation can be performed efficiently. Our algorithm reduces the number of process variation variables while preserving the delay function with respect to process variation. Compared with the principal component analysis (PCA) method, our algorithm requires less computation time and guarantees the reduced process variation variables are independent. Experimental results on ISCAS85 circuits show that the algorithm works well. 1 INTROCUTION In modern multi-layer VLSI circuits, the dimension of the process variation is large. For example, in a k-metal technology, there are 2k variables for metal width and thickness, k variables for inter-layer dielectric (ILD) thickness, a gate length variable, and some other variables. With such a large number of process variation variables, timing analysis under process variation is very time consuming, and may not find the worst-case process corner [1][2]. In this paper, we propose the novel concept of variation dimension reduction. The idea is originated from the following observation. For different nets, the underlying process variation variables are the same. Therefore, the delays of the nets are correlated. We model the delay from an input pin of a cell to an input pin of a downstream cell, also known as the buffer-to-buffer delay, as a linear function of process variation variables: d = dnominal(1 + a1x1 + a2x2 + ... + anxn), where x1, x2, ..., xn are process variation variables, a1, a2, ..., an are their corresponding coefficients, and dnominal is the nominal delay. For different nets, the coefficients are different, but the process variation variables are the same. The assumption that the delay is linear with respect to each process variation variable is supported by SPICE simulation of real circuits within reasonable ranges of the process variation [3]. There are many forms of process variation [4][5]. In this paper, we only consider systematic process variation and assume the process variation variables among different nets are fully correlated. We assume the following variation ranges: metal thickness ±20%, metal width ±10%, ILD thickness ±40%, and gate length ±10%. To obtain the delay function with respect to process variation, we first extract interconnect parasitic from the layout and compute the nominal buffer-to-buffer delay for all nets. Then for each process variation variable, we modify the layout or the technology file by varying a specified amount (for example, +10% for metal1 thickness), and perform RC extraction and delay evaluation for the modified layout. The coefficient for this process variation variable is obtained by interpolating the two delays. Recently, the principal component analysis (PCA) method was used to reduce the dimension of process variation [7]. It was shown to be effective for analyzing analog circuits under process variation. However, the PCA method is inefficient for digital circuits, because the PCA method constructs and solves a correlation matrix of size mn×mn, where n is the number of process variation variables and m is the number of nets or devices. For digital circuits, m is easily in hundreds or thousands. In this paper, we propose a new method based on singular value decomposition (SVD) [6]. Our algorithm detects the linear dependence and reduces the number of process variation variables, while minimizing the average error of the delay. Note that although the PCA method also uses SVD, their matrix is size mn×mn while ours is size m×n. To make the reduced process variables linearly/statistically independent, which is desirable for fault simulation and timing analysis, we also propose a sub-matrix SVD method. In Section 2, the SVD method and sub-matrix SVD method for dimension reduction are given. In Section 3, we show the experimental results. It shows that if we simply pick the most important process variation variables and discard the rest, then the average error of net delay is twice as much as the average error produced by our algorithm. 2 ALGORITHM 2.1 Singular Value Decomposition (SVD) The SVD method is based on the following theorems [6]. Theorem 1 If A is an m×n matrix, then there exist orthogonal m×m matrix U=[u1,...,um] and n×n matrix V=[v1,...,vn], such that U·A·V=diag(σ1,...,σp), which is an m×n matrix, p=min{m,n}, and σ1 ≥ σ2 ≥...≥ σp ≥ 0. The σi’s are the singular values of A, and vectors ui and vi are the ith left and right singular vector, respectively. The process to find U and V is called SVD. It can be done by the Golub-Reinsch algorithm of time complexity O(mn+mn+n) [6] (pp. 254). To compute U(:,1:n) =[u1,...,un], which is an m×n (m>n) matrix, the time complexity is O(mn+n) [6]. Theorem 2 Let the SVD of m×n matrix A be defined in Theorem 1. If r < rank(A) and let ∑ = = r i T i i i v u A 1 * σ , then 1 2 * 2 ) ( min + = = − = − r r B rank A A B A σ . In other words, A is the best 2-norm approximation of A among all rank r matrices. 2.2 Application to Dimension Reduction We are given the delay of m nets represented as Ax, where A is an m×n matrix, n is the number of process variation variables, x=[x1,...,xn] is the vector of process variation variables, and xi’s are independent of each other. From Theorem 2, A=U(:,1:r)·S·V(:,1:r), where S=diag(σ1,...,σr), U(:,1:r)=[u1,...,ur], and V(:,1:r) =[v1,...,vr]. Therefore, Ax≈Ax=U(:,1:r)·S·V(:,1:r)x=Bz, where B=U(:,1:r)·S is an m×r matrix and z=V(:,1:r)x is an r×1 vector. Since the dimension of B is much less than the dimension of A, we use Bz to approximate Ax. If we just want to reduce the number of process variation variables, then Bz is the resulting delay function, and z is the vector of new process variation variables. However, we often have an additional requirement from circuit simulation that the new process variation variables z1, ..., zr must be independent. For example, if z1=x1−x2+x3 and z2=x1+x2−x3, then z1 and z2 are not independent although the number of variables is reduced from 3 to 2. 2.3 Sub-Matrix SVD (SMSVD) We propose a sub-matrix SVD method (SMSVD) to ensure the independence between zi’s. The basic idea is to partition columns of A into r sub-matrices, and then use SVD on each sub-matrix. The following is the algorithm: 1) Partition A into sub-matrices A1, A2, ..., Ar, where A=[A1, A2,..., Ar]. Ai is an m×qi matrix, i=1,..., r. 2) For i=1,..., r, compute the approximation matrix Ai of Ai through SVD in which the approximation rank is 1. Define SVD of Ai as Ui·Ai·Vi=diag(σi1,...,σip), then Ai=Ui(:,1)·σi1·Vi(:,1) and ║Ai−Ai║2=σi2. 3) Construct B=[U1(:,1)σ11, U2(:,1)σ21, ..., Ur(:,1)σr1],
130258
Longest-path selection for delay test under process variation
Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay among all paths through that fault site. There are often multiple longest paths for each fault site in the circuit, due to different process conditions. To detect the smallest delay fault, it is necessary to test all longest paths through the fault site. However, previous methods are either inefficient or their results include too many paths that are not longest.This paper presents an efficient method to generate the longest path set for delay test under process variation. To capture both structural and systematic process correlation, we use linear delay functions to express path delays under process variation. A novel path-pruning technique is proposed to discard paths that are not longest, resulting in a significantly reduction in the number of paths compared with the previous best method. The new method can be applied to any process variation as long as its impact on delay is linear.
6048187
Fast video shot retrieval by trace geometry matching in principal component space
Content-based video retrieval technology holds the key to the efficient management and sharing of video content from different sources, in different scales, across different platforms, and shared over different communication channels. In this work we present a fast retrieval algorithm based on matching the geometry of video sequence traces in the principal component space. Techniques to address scale (spatial and temporal) issues, as well as, noise and other possible distortions, such as frame dropping, are discussed. Experimental results demonstrate the effectiveness of the proposed approach.
6374485
Parametric analysis for adaptive computation offloading
Many programs can be invoked under different execution options, input parameters and data files. Such different execution contexts may lead to strikingly different execution instances. The optimal code generation may be sensitive to the execution instances. In this paper, we show how to use parametric program analysis to deal with this issue for the optimization problem of computation offloading.Computation offloading has been shown to be an effective way to improve performance and energy saving on mobile devices. Optimal program partitioning for computation offloading depends on the tradeoff between the computation workload and the communication cost. The computation workload and communication requirement may change with different execution instances. Optimal decisions on program partitioning must be made at run time when sufficient information about workload and communication requirement becomes available.Our cost analysis obtains program computation workload and communication cost expressed as functions of run-time parameters, and our parametric partitioning algorithm finds the optimal program partitioning corresponding to different ranges of run-time parameters. At run time, the transformed program self-schedules its tasks on either the mobile device or the server, based on the optimal program partitioning that corresponds to the current values of run-time parameters. Experimental results on an HP IPAQ handheld device show that different run-time parameters can lead to quite different program partitioning decisions.
15936335
A divide-and-conquer 2.5-D floorplanning algorithm based on statistical wirelength estimation
An efficient and effective divide-and conquer 2.5D floorplanning algorithm is proposed for wirelength optimization. Modules are pre-partitioned into different dies with respect to the statistical wirelength estimation result. Then a floorplan is generated on each die for wirelength optimization. The new partitioning method successfully solves the conflict between wirelength minimization and inter-die via constraints. Experimental results show that our algorithm could provide noticeable improvement in the total wirelength compared to both 2D design and the previous 2.5D floorplanning algorithm.
26526878
Chromatic sums of 2-edge-connected maps on the plane
This paper provides the chromatic sum function equation of rooted 2-edge-connected maps on the plane. The enumerating function equations of rooted biloopless maps, rooted nonseparable maps, rooted 2-edge-connected bipartite maps and rooted loopless Eulerian maps on the plane are derived by the chromatic sum function equation of rooted 2-edge-connected maps on the plane. Moreover, some explicit expressions of enumerating functions are also derived.
185097
Adaptive rate control for H.264
This paper presents a rate control scheme for H.264 by introducing the concept of basic unit and a linear prediction model. The basic unit can be a macroblock (MB), a slice, or a frame. It can be used to obtain a trade-off between the overall coding efficiency and the bits fluctuation. The linear model is used to solve the chicken and egg dilemma existing in the rate control of H.264. Both constant bit rate (CBR) and variable bit rate (VBR) cases are studied. Our scheme has been adopted by H.264.