61647385
On-chip Bus Thermal Analysis and Optimization
As technology scales, increasing clock rates, decreasing interconnect pitch, and the introduction of low-k dielectrics have made self-heating of the global interconnects an important issue in VLSI design. In this paper, we study the self-heating of on-chip buses and show that the thermal impact due to self-heating of on-chip buses increases as technology scales, thus motivating the need of finding solutions to mitigate this effect. Based on the theoretical analysis, we propose an irredundant bus encoding scheme for on-chip buses to tackle the thermal issue. Simulation results show that our encoding scheme is very efficient to reduce the on-chip bus temperature rise over substrate temperature, with much less overhead compared to other low power encoding schemes.
11962235
Embedded Multi-Processor System-on-chip (MPSoC) design considering process variations
As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep sub-micron designs. As a result, a paradigm shift from deterministic to statistical design methodology at all levels of the design hierarchy is inevitable (Borkar, 2005). As part of two NSF projects (NSF CNS CAREER 0643902 and NSF CNS 0720659), a variation-aware task allocation and scheduling method for multiprocessor system-on-chip (MPSoC) architectures is proposed, to mitigate the impact of parameter variations. A new design metric, called performance yield and defined as the probability of the assigned schedule meeting the predefined performance constraints, is used to guide the task allocation and scheduling procedure. An efficient yield computation method for task scheduling complements and significantly improves the effectiveness of the proposed variation-aware scheduling algorithm. Experimental results show that our variation-aware scheduler achieves significant yield improvements.
14304606
A Novel Criticality Computation Method in Statistical Timing Analysis
The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effective metrics in guiding circuit optimization. To facilitate the criticality computation considering the correlation, we define the critical region for the path and arc/node in a timing graph, and propose an efficient method to compute the criticality for paths and arcs/nodes simultaneously by a single breadth-first graph traversal during the backward propagation. Instead of choosing a set of paths for analysis prematurely, we develop a new property of the path criticality to prune those paths with low criticality at very earlier stages, so that our path criticality computation method has linear complexity with respect of the timing edges in a timing graph. To improve the computation accuracy, cutset and path criticality properties are exploited to calibrate the computation results. The experimental results on ISCAS benchmark circuits show that our criticality computation method can achieve high accuracy with fast speed.
15383836
Dependability analysis of nano-scale FinFET circuits
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous works have studied the performance or power advantages of FinFET circuits over bulk CMOS circuits. This paper provides the dependability analysis of FinFET circuits, studying the soft error vulnerability of FinFET circuits and the impact of process variation. Our experiments compare FinFET circuits against bulk CMOS circuits in both 32 nm and 45 nm technologies, showing that FinFET circuits have better dependability and scalability, which is indicated by better soft error immunity and less impact of process variation. It is concluded that FinFET-based circuit design is more robust than the bulk CMOS based circuit design
6895415
Variability-driven module selection with joint design time optimization and post-silicon tuning
Increasing delay and power variation are significant challenges to the designers as technology scales to the deep sub-micron (DSM) regime. Traditional module selection techniques in high level synthesis use worst case delay/power information to perform the optimization, and therefore may be too pessimistic such that extra resources are used to guarantee design requirements. Parametric yield, which is defined as the probability of the synthesized hardware meeting the performance/power constraints, can be used to guide design space exploration. The parametric yield can be effectively improved by combining both design-time variation-aware optimization and post silicon tuning techniques (such as adaptive body biasing (ABB)). In this paper, we propose a module selection algorithm that combines design-time optimization with post- silicon tuning (using ABB) to maximize design yield. A variation-aware module selection algorithm based on efficient performance and power yield gradient computation is developed. The post silicon optimization is formulated as an efficient sequential conic program to determine the optimal body bias distribution, which in turn affects design-time module selection. The experiment results show that significant yield can be achieved compared to traditional worst-case driven module selection technique. To the best of our knowledge, this is the first variability-driven high level synthesis technique that considers post-silicon tuning during design time optimization.
62533815
Soft Error Rate Analysis for Combinational Logic Using an Accurate Electrical Masking Model
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET models to accurately capture the nonlinear properties of submicron MOS transistors. Based on these models, we propose and validate the transient pulse generation model and propagation model for soft error rate analysis. The pulse generated by our pulse generation model matches well with that of HSPICE simulation, and the pulse propagation model provides nearly one order of magnitude improvement in accuracy over the previous models. Using these two models, we propose an accurate and efficient block-based soft error rate analysis method for combinational logic circuits.
10134877
Greedy Approximation Algorithms
Greedy strategy is a simple and natural method in the design of approximation algorithms. This chapter presents greedy approximation algorithms for very broad classes of maximization problems and minimization problems and analyzes their approximation bounds. A number of applications of these greedy approximation algorithms are also described in this chapter. For many applications, the greedy approximation algorithm can achieve the best known approximation bound in a straightforward manner. For some applications, they have different formulations, and the corresponding greedy approximation algorithms have different approximation bounds. In addition, some applications can have better approximation algorithm than the greedy approximation algorithm.
9475863
Optimization scheme for sensor coverage scheduling with bandwidth constraints
Wireless Sensor Network has attracted a lot of attentions due to its broad applications in recent years and also introduces many challenges. Network lifetime is a critical issue in Wireless Sensor Networks. It is possible to extend network lifetime by organizing the sensors into a number of sensor covers. However, with the limited bandwidth, coverage breach (i.e, targets that are not covered) can occur if the number of available time-slots/channels is less than the number of sensors in a sensor cover. In this paper, we study a joint optimization problem in which the objective is to minimize the coverage breach as well as to maximize the network lifetime. We show a “trade-off” scheme by presenting two strongly related models, which aim to tradeoffs between the two conflicting objectives. The main approach of our models is organizing sensors into non-disjoint sets, which is different from the current most popular approach and can gain longer network lifetime as well as less coverage breach. We proposed two algorithms for the first model based on linear programming and greedy techniques, respectively. Then we transform these algorithms to solve the second model by revealing the strong connection between the models. Through numerical simulation, we showed the good performance of our algorithms and the pictures of the tradeoff scheme in variant scenarios, which coincide with theoretical analysis very well. It is also showed that our algorithms could obtain less breach rate than the one proposed in (Cheng et al. in INFOCOM’ 05, 2005).
7656968
Using MEMS-based storage to boost disk performance
Non-volatile storage technologies such as flash memory, magnetic RAM (MRAM), and MEMS-based storage are emerging as serious alternatives to disk drives. Among these, MEMS storage is predicted to be the least expensive and highest density, and at about 1 ms access times still considerably faster than hard disk drives. Like the other emerging non-volatile storage technologies, it is highly suitable for small mobile devices but it is expensive to replace hard drives entirely. Its non-volatility, dense storage, and high performance still make it an ideal candidate for the secondary storage subsystem. We examine the use of MEMS storage in the storage hierarchy and show that using a technique called MEMS caching disk, we can achieve 30-49% of the pure MEMS storage performance by using only a small amount (3% of the disk capacity) of MEMS storage in conjunction with a standard hard drive. The resulting system is ideally suited for commercial packaging with a small MEMS device included as part of a standard disk controller or paired with a disk.
7378924
Minimum Coverage Breach and Maximum Network Lifetime in Wireless Sensor Networks
Network lifetime is a critical issue in Wireless Sensor Networks. It is possible to extend network lifetime by organizing the sensors into a number of sensor covers. However, with the limited bandwidth, coverage breach (i.e, targets that are not covered) can occur if the number of available time-slots/channels is less than the number of sensors in a sensor cover. In this paper, we study a joint optimization problem in which the objective is to minimize the coverage breach as well as to maximize the network lifetime. We show a "trade-off" scheme by presenting two strongly related models, which aim to tradeoffs between the two conflicting objectives. The main approach of our models is organizing sensors into non-disjoint sets, which is different from the current most popular approach and can gain longer network lifetime as well as less coverage breach. We proposed two algorithms for the first model based on linear programming and greedy techniques, respectively. Then we transform these algorithms to solve the second model by revealing the strong connection between the models. Through numerical simulation, we showed the good performance of our algorithms and the pictures of the tradeoff scheme in variant scenarios, which coincide with theoretical analysis very well. It is also showed that our algorithms could obtain less breach rate than the one proposed in [2].
6241423
OBFS: A File System for Object-Based Storage Devices
The object-based storage model, in which files are made up of o ne or more data objects stored on self-contained Object-Based Storage Devices (OSDs), is em erging as an architecture for distributed storage systems. The workload presented to the OSDs will be q uite different from that of generalpurpose file systems, yet many distributed file systems employ general-purpose file systems as their underlying file system. We present OBFS, a small and highly ef ficient file system designed for use in OSDs. Our experiments show that our user-level implement ation of OBFS outperforms Linux Ext2 and Ext3 by a factor of two or three, and while OBFS is 1/25 the size of XFS, it provides only slightly lower read performance and 10%‐40% higher write pe rformance.