Dielectric properties of CaCu 3 Ti 4 O 12 thick films
CaCu 3 Ti 4 O 12 is believed to have a variety of potential applications due to its unusual high dielectric constant and very high thermal stability. Ceramic films of CaCu 3 Ti 4 O 12 differ from bulk specimens in dielectric and other physical properties. In this paper, the dielectric properties of CCTO thick films are investigated by SEM and dielectric spectra analysis. The difference thicknesses (0.1 mm, 0.2 mm, 0.3 mm) of thick films formed by the rolling-film method, and the permittivity of the thick film is almost the same value as the same-based CCTO bulk. It is found that the orientation of grain grown, the average particle size and thickness can significantly influence the dielectric properties of CCTO thick films.