Optical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative study
Envelope method and Inverse synthesis method are two commonly used method for evaluating the optical constants and thickness of the thinfilms from the optical transmission measurement. The two methods along with their evaluation in terms of accuracy and simplicity are presented in this paper by determining the optical constants and thickness of ZrO2−MgO thin films deposited by electron beam evaporation technique.