Effects of defects on dielectric breakdown phenomena and life time of polymeric insulation
Effects of defects on dielectric breakdown phenomena and life time of PE insulation were investigated. Volatile impurity was observed by FT-IR spectrum and oxidation reaction was faster on Cu than Al open pan. From the artificial impurities such as carbon fiber, nylon, Cu and Al particles, electrical tree started and dielectric breakdown was occurred finally. Space charge formed by the injection of electron from electrode and trapped in impurities acts as the main cause of dielectric breakdown in polymeric insulation.