Microstructure and composition of a SNS Josephson junction using CaRuO{sub 3} as the metallic barrier
Superconductor - normal - superconductor (SNS) edge junctions consisting of YBa{sub 2}Cu{sub 3}O{sub 7-x}/CaRuO{sub 3}/YBa{sub 2}Cu{sub 3}O{sub 7-x} were fabricated on (001) LaA1O{sub 3} substrates. These devices display an excess interface resistance which is not well understood but is related to the SN interface and interlayer structure. High-resolution and conventional transmission electron microscopy were employed to investigate the SN interface to determine the structure and possible interface defects. Energy-loss spectroscopy and energy dispersive x-ray analysis were performed on the CaRuO{sub 3} film and near interface regions to quantify the extent of interdiffusion between the CiRuO{sub 3} and YBCO films. Changes in either the interface structure or the normal layer chemistry are expected to greatly influence the junction properties.