Line Scratches Detection and Restoration via Light Diffraction
This paperpresents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise ro scrarches. The physical modelling of the defect along with its classification as region of partially missing data allows very good resulrs borh in detection and in restoration.