Wrapping Paths of Undetected Transition Faults With Two-Cycle Gate-Exhaustive Faults

Undetectable faults result from logic redundancies and constraints on applicable tests. The presence of an undetected (undetectable or aborted) fault implies that a test, which would have covered its site, is missing from the test set. When undetected transition faults form a path, the missing tests imply that (small) delay defects along the path may not be detected even if they are detectable. The goal of this article is to provide additional coverage for paths of undetected transition faults by using two-cycle gate-exhaustive faults for subcircuits (gates) that wrap the paths. The use of gate-exhaustive faults alleviates the need to model delay defects along the paths, or use path delay faults that may also be undetectable. The article defines the target paths, and gates that wrap them, for which two-cycle gate-exhaustive faults can be defined. Experimental results for benchmark circuits demonstrate the discussion.