Measurement of 64 organic thin-film transistors in an array test structure using relay-switch board for efficient evaluation of long-term reliability


 We propose an efficient array measurement test structure to measure many devices and to obtain statistical characteristics of organic thin-film-transistors (OTFT) for long-term reliability evaluation of new devices under development in laboratories and those that cannot achieve sufficient yield. We introduce to adopt different devices from the device under test for the array control circuit. We implemented a separate control circuit as a dedicated relay-switch board without device consolidation. This relay-switch board can also apply voltage stress to any number of devices under test for negative bias temperature instability evaluation. The interface issue between the chip and board is resolved with a flexible flat cable and an anisotropic conductive film. The proposed measurement system successfully measured the OTFT arrays in (sweep time of source measure unit) $\times$ (number of OTFTs) period, and only requires 84 min. for 64 nOTFTs (552 points/device), which corresponds to 1.3 min./device in the experiment.