A 192-Gb 12-High 896-GB/s HBM3 DRAM With a TSV Auto-Calibration Scheme and Machine-Learning-Based Layout Optimization

This article introduces a 192-Gb 896-GB/s 12-high stacked third-generation high-bandwidth memory (HBM3 DRAM) with low power consumption and high-reliability traits. New design schemes and features, including internal low-voltage signaling, center strobe calibration, through-silicon via (TSV) auto-calibration, a symbol-correcting in-DRAM ECC, and machine-learning-based layout optimization, allow large amounts of data transfers among the vertically stacked base and core dies with limited delay mismatch or SI degradation, as well as reduced power consumption from low-voltage swings. Experimental results confirm 896-GB/s bandwidth operations at 1.0-V voltage conditions with up to 15% improved power efficiency.