Photoelectric properties of solar cells based on pCdTe-nCdS and pCdTe-nCdSe heterostructures

In this paper, we study the photoelectric properties of pCdTe-nCdS and pCdTe-nCdSe-based film heterostructures. It is shown that the high value of the electron diffusion length in pCdTe slick (pellicle) is due to the presence of a built-in field in it. The shift in the photosensitivity maximum is explained by changes in the band gap of cadmium telluride. As shown, the accumulation coefficient increases with raising thickness of the wide-gap layer. It has been established that the short-wavelength edge of the photosensitivity of the pCdTe-nCdS structure begins to increase sharply at a photon energy of hv ≤ 2,3 eV, while the photosensitivity of the pCdTe-nCdSe structure already at a photon energy has a significant value ∼ 100 μA/mV.