Laue diffraction of X-ray beams in a multilayer structure

The Laue diffraction theory of X-ray microbeams in multilayers 
(MLs) has been developed. The solution for calculating Xray 
reciprocal space maps has been obtained. The pendulum 
(Pendellösung) effect for perfect and imperfect MLs has been 
demonstrated. The numerical simulation of Laue diffraction in 
Mo/Si multilayers with boundary conditions in the case of geometrical 
optics and the Fresnel approximation has been carried 
out. For X-ray microbeams, the scattering at the edges 
of collimators and slits of the diffractometer should be taken 
into account.