Fast and accurate 3D topography measurement based on a novel synthesis pattern method


 Prompt and accurate measurement of the three-dimensional (3D) contours of complex surfaces is currently a key research direction. In the current study, we presented a fast grayscale stripe synthesis method based on focused binary patterns. Specifically, by encoding a group of binary patterns, the patterns were captured by the camera within one exposure time cycle and synthesized into a grayscale-intensity triangular wave stripe pattern. Importantly, this method utilized the fast projection rate of the binary pattern, improved the speed of stripe projection, and prevented nonlinearity in the 3D measurement of stripe projection by synthesizing the gray pattern in the form of a binary pattern.