Non-contact surface roughness measurement with a light-field camera

A new non-contact surface roughness measurement technology has been developed. This is a technique that helps ensure the traceability of each component in the manufacturing process. Specifically, the surface roughness parameters Sq and Sdq were measured and evaluated using scattered light simulation and a light field camera. The roughness parameter Sq was determined using the generalized Harvey-Shack scattering theory and showed good agreement with existing machines. Furthermore, the roughness parameter Sdq was estimated from the argument “a” extracted from the K-correlation model.