List of materials analysis methods
# List of materials analysis methods

This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.

* A
* B
* C
* D
* E
* F
* G
* H
* I
* K
* L
* M
* N
* O
* P
* Q
* R
* S
* T
* U
* V
* W
* X
* See also
* References

## Symbols

* μSR – see muon spin spectroscopy
* χ – see magnetic susceptibility

## A

* AAS – Atomic absorption spectroscopy
* AED – Auger electron diffraction
* AES – Auger electron spectroscopy
* AFM – Atomic force microscopy
* AFS – Atomic fluorescence spectroscopy
* Analytical ultracentrifugation
* APFIM – Atom probe field ion microscopy
* APS – Appearance potential spectroscopy
* ARPES – Angle resolved photoemission spectroscopy
* ARUPS – Angle resolved ultraviolet photoemission spectroscopy
* ATR – Attenuated total reflectance

## B

* BET – BET surface area measurement (BET from Brunauer, Emmett, Teller)
* BiFC – Bimolecular fluorescence complementation
* BKD – Backscatter Kikuchi diffraction, see EBSD
* BRET – Bioluminescence resonance energy transfer
* BSED – Back scattered electron diffraction, see EBSD

## C

* CAICISS – Coaxial impact collision ion scattering spectroscopy
* CARS – Coherent anti-Stokes Raman spectroscopy
* CBED – Convergent beam electron diffraction
* CCM – Charge collection microscopy
* CDI – Coherent diffraction imaging
* CE – Capillary electrophoresis
* CET – Cryo-electron tomography
* CL – Cathodoluminescence
* CLSM – Confocal laser scanning microscopy
* COSY – Correlation spectroscopy
* Cryo-EM – Cryo-electron microscopy
* Cryo-SEM – Cryo-scanning electron microscopy
* CV – Cyclic voltammetry

## D

* DE(T)A – Dielectric thermal analysis
* dHvA – De Haas–van Alphen effect
* DIC – Differential interference contrast microscopy
* Dielectric spectroscopy
* DLS – Dynamic light scattering
* DLTS – Deep-level transient spectroscopy
* DMA – Dynamic mechanical analysis
* DPI – Dual polarisation interferometry
* DRS – Diffuse reflection spectroscopy
* DSC – Differential scanning calorimetry
* DTA – Differential thermal analysis
* DVS – Dynamic vapour sorption

## E

* EBIC – Electron beam induced current (see IBIC: ion beam induced charge)
* EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS)
* EBSD – Electron backscatter diffraction
* ECOSY – Exclusive correlation spectroscopy
* ECT – Electrical capacitance tomography
* EDAX – Energy-dispersive analysis of x-rays
* EDMR – Electrically detected magnetic resonance, see ESR or EPR
* EDS or EDX – Energy dispersive X-ray spectroscopy
* EELS – Electron energy loss spectroscopy
* EFTEM – Energy filtered transmission electron microscopy
* EID – Electron induced desorption
* EIT and ERT – Electrical impedance tomography and electrical resistivity tomography
* EL – Electroluminescence
* Electron crystallography
* ELS – Electrophoretic light scattering
* ENDOR – Electron nuclear double resonance, see ESR or EPR
* EPMA – Electron probe microanalysis
* EPR – Electron paramagnetic resonance spectroscopy
* ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis
* ESCA – Electron spectroscopy for chemical analysis see XPS
* ESD – Electron stimulated desorption
* ESEM – Environmental scanning electron microscopy
* ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry
* ESR – Electron spin resonance spectroscopy
* ESTM – Electrochemical scanning tunneling microscopy
* EXAFS – Extended X-ray absorption fine structure
* EXSY – Exchange spectroscopy

## F

* FCS – Fluorescence correlation spectroscopy
* FCCS – Fluorescence cross-correlation spectroscopy
* FEM – Field emission microscopy
* FIB – Focused ion beam microscopy
* FIM-AP – Field ion microscopy–atom probe
* Flow birefringence
* Fluorescence anisotropy
* FLIM – Fluorescence lifetime imaging
* Fluorescence microscopy
* FOSPM – Feature-oriented scanning probe microscopy
* FRET – Fluorescence resonance energy transfer
* FRS – Forward Recoil Spectrometry, a synonym of ERD
* FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry
* FTIR – Fourier-transform infrared spectroscopy

## G

* GC-MS – Gas chromatography-mass spectrometry
* GDMS – Glow discharge mass spectrometry
* GDOS – Glow discharge optical spectroscopy
* GISAXS – Grazing incidence small angle X-ray scattering
* GIXD – Grazing incidence X-ray diffraction
* GIXR – Grazing incidence X-ray reflectivity
* GLC – Gas-liquid chromatography

## H

* HAADF – High angle annular dark-field imaging
* HAS – Helium atom scattering
* HPLC – High performance liquid chromatography
* HREELS – High resolution electron energy loss spectroscopy
* HREM – High-resolution electron microscopy
* HRTEM – High-resolution transmission electron microscopy
* HI-ERDA – Heavy-ion elastic recoil detection analysis
* HE-PIXE – High-energy proton induced X-ray emission

## I

* IAES – Ion induced Auger electron spectroscopy
* IBA – Ion beam analysis
* IBIC – Ion beam induced charge microscopy
* ICP-AES – Inductively coupled plasma atomic emission spectroscopy
* ICP-MS – Inductively coupled plasma mass spectrometry
* Immunofluorescence
* ICR – Ion cyclotron resonance
* IETS – Inelastic electron tunneling spectroscopy
* IGA – Intelligent gravimetric analysis
* IGF – Inert gas fusion
* IIX – Ion induced X-ray analysis, see particle induced X-ray emission
* INS – Ion neutralization spectroscopy
* Inelastic neutron scattering
* IRNDT – Infrared non-destructive testing of materials
* IRS – Infrared spectroscopy
* ISS – Ion scattering spectroscopy
* ITC – Isothermal titration calorimetry
* IVEM – Intermediate voltage electron microscopy

## L

* LALLS – Low-angle laser light scattering
* LC-MS – Liquid chromatography-mass spectrometry
* LEED – Low-energy electron diffraction
* LEEM – Low-energy electron microscopy
* LEIS – Low-energy ion scattering
* LIBS – Laser induced breakdown spectroscopy
* LOES – Laser optical emission spectroscopy
* LS – Light (Raman) scattering

## M

* MALDI – Matrix-assisted laser desorption/ionization
* MBE – Molecular beam epitaxy
* MEIS – Medium energy ion scattering
* MFM – Magnetic force microscopy
* MIT – Magnetic induction tomography
* MPM – Multiphoton fluorescence microscopy
* MRFM – Magnetic resonance force microscopy
* MRI – Magnetic resonance imaging
* MS – Mass spectrometry
* MS/MS – Tandem mass spectrometry
* MSGE – Mechanically stimulated gas emission
* Mössbauer spectroscopy
* MTA – Microthermal analysis

## N

* NAA – Neutron activation analysis
* ND – Neutron diffraction
* NDP – Neutron depth profiling
* NEXAFS – Near edge X-ray absorption fine structure
* NIS – Nuclear inelastic scattering/absorption
* NMR – Nuclear magnetic resonance spectroscopy
* NOESY – Nuclear Overhauser effect spectroscopy
* NRA – Nuclear reaction analysis
* NSOM – Near-field optical microscopy

## O

* OBIC – Optical beam induced current
* ODNMR – Optically detected magnetic resonance, see ESR or EPR
* OES – Optical emission spectroscopy
* Osmometry

## P

* PAS – Positron annihilation spectroscopy
* Photoacoustic spectroscopy
* PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography
* PAX – Photoemission of adsorbed xenon
* PC or PCS – Photocurrent spectroscopy
* Phase contrast microscopy
* PhD – Photoelectron diffraction
* PD – Photodesorption
* PDEIS – Potentiodynamic electrochemical impedance spectroscopy
* PDS – Photothermal deflection spectroscopy
* PED – Photoelectron diffraction
* PEELS – parallel electron energy loss spectroscopy
* PEEM – Photoemission electron microscopy (or photoelectron emission microscopy)
* PES – Photoelectron spectroscopy
* PINEM – photon-induced near-field electron microscopy
* PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis
* PIXE – Particle (or proton) induced X-ray spectroscopy
* PL – Photoluminescence
* Porosimetry
* Powder diffraction
* PTMS – Photothermal microspectroscopy
* PTS – Photothermal spectroscopy

## Q

* QENS – Quasielastic neutron scattering
* QCM-D – Quartz crystal microbalance with dissipation monitoring

## R

* Raman spectroscopy
* RAXRS – Resonant anomalous X-ray scattering
* RBS – Rutherford backscattering spectrometry
* REM – Reflection electron microscopy
* RDS – Reflectance difference spectroscopy
* RHEED – Reflection high energy electron diffraction
* RIMS – Resonance ionization mass spectrometry
* RIXS – Resonant inelastic X-ray scattering
* RR spectroscopy – Resonance Raman spectroscopy

## S

* SAD – Selected area diffraction
* SAED – Selected area electron diffraction
* SAM – Scanning Auger microscopy
* SANS – Small angle neutron scattering
* SAXS – Small angle X-ray scattering
* SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation
* SCEM – Scanning confocal electron microscopy
* SE – Spectroscopic ellipsometry
* SEC – Size exclusion chromatography
* SEIRA – Surface enhanced infrared absorption spectroscopy
* SEM – Scanning electron microscopy
* SERS – Surface enhanced Raman spectroscopy
* SERRS – Surface enhanced resonance Raman spectroscopy
* SESANS – Spin Echo Small Angle Neutron Scattering
* SEXAFS – Surface extended X-ray absorption fine structure
* SICM – Scanning ion-conductance microscopy
* SIL – Solid immersion lens
* SIM – Solid immersion mirror
* SIMS – Secondary ion mass spectrometry
* SNMS – Sputtered neutral species mass spectrometry
* SNOM – Scanning near-field optical microscopy
* SPECT – Single-photon emission computed tomography
* SPM – Scanning probe microscopy
* SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
* SSNMR – Solid-state nuclear magnetic resonance
* Stark spectroscopy
* STED – Stimulated emission depletion microscopy
* STEM – Scanning transmission electron microscopy
* STM – Scanning tunneling microscopy
* STS – Scanning tunneling spectroscopy
* SXRD – Surface X-ray diffraction

## T

* TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT)
* TEM – Transmission electron microscopy
* TGA – Thermogravimetric analysis
* TIKA – Transmitting ion kinetic analysis
* TIMS – Thermal ionization mass spectrometry
* TIRFM – Total internal reflection fluorescence microscopy
* TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy
* TMA – Thermomechanical analysis
* TOF-MS – Time-of-flight mass spectrometry
* Two-photon excitation microscopy
* TXRF – Total reflection X-ray fluorescence analysis

## U

* Ultrasound attenuation spectroscopy
* UPS – UV-photoelectron spectroscopy
* USANS – Ultra small-angle neutron scattering
* USAXS – Ultra small-angle X-ray scattering
* UT – Ultrasonic testing
* UV-Vis – Ultraviolet–visible spectroscopy

## V

* VEDIC – Video-enhanced differential interference contrast microscopy
* Voltammetry

## W

* WAXS – Wide angle X-ray scattering
* WDX or WDS – Wavelength dispersive X-ray spectroscopy

## X

* XAES – X-ray induced Auger electron spectroscopy
* XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure)
* XAS – X-ray absorption spectroscopy
* X-CTR – X-ray crystal truncation rod scattering
* X-ray crystallography
* XDS – X-ray diffuse scattering
* XPEEM – X-ray photoelectron emission microscopy
* XPS – X-ray photoelectron spectroscopy
* XRD – X-ray diffraction
* XRES – X-ray resonant exchange scattering
* XRF – X-ray fluorescence analysis
* XRR – X-ray reflectivity
* XRS – X-ray Raman scattering
* XSW – X-ray standing wave technique
