Remove use of the macro TEST_FN from the AES test suite
The TEST_FN macro is now redundant and no longer necessary.
@@ -16,7 +16,7 @@ void aes_encrypt_ecb( data_t * key_str, data_t * src_str,
memset(output, 0x00, 100);
- TEST_FN( mbedtls_aes_init( &ctx ) );
+ mbedtls_aes_init( &ctx );
TEST_ASSERT( mbedtls_aes_setkey_enc( &ctx, key_str->x, key_str->len * 8 ) == setkey_result );
if( setkey_result == 0 )
@@ -40,7 +40,7 @@ void aes_decrypt_ecb( data_t * key_str, data_t * src_str,
memset(output, 0x00, 100);
- TEST_FN( mbedtls_aes_init( &ctx ) );
+ mbedtls_aes_init( &ctx );
TEST_ASSERT( mbedtls_aes_setkey_dec( &ctx, key_str->x, key_str->len * 8 ) == setkey_result );
if( setkey_result == 0 )
@@ -65,7 +65,7 @@ void aes_encrypt_cbc( data_t * key_str, data_t * iv_str,
memset(output, 0x00, 100);
- TEST_FN( mbedtls_aes_init( &ctx ) );
+ mbedtls_aes_init( &ctx );
mbedtls_aes_setkey_enc( &ctx, key_str->x, key_str->len * 8 );
TEST_ASSERT( mbedtls_aes_crypt_cbc( &ctx, MBEDTLS_AES_ENCRYPT, src_str->len, iv_str->x, src_str->x, output ) == cbc_result );
@@ -393,7 +393,6 @@ void aes_invalid_param( )
TEST_INVALID_PARAM_RET( MBEDTLS_ERR_AES_BAD_INPUT_DATA,
mbedtls_aes_setkey_dec( &dummy_ctx, NULL, 128 ) );
-
exit:
return;
}
