Refers to the passage below and then answer the question afterwards in the same language as the passage: Passage: AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is typically silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke's law. Kulingana na hali, vikosi ambavyo hupimwa katika AFM ni pamoja na nguvu ya mawasiliano ya mitambo, van der Waals, vikosi vya capillary, vikosi vya kushikamana kwa kemikali, vikosi vya electrostatic, vikosi vya sumaku (tazama nguvu ya sumaku ya microscope, MFM), vikosi vya Casimir, vikosi vya solvation, nk. Pamoja na nguvu ya nguvu inaweza kupimwa kwa wakati mmoja kupitia matumizi ya aina maalum za uchunguzi wa sumaku (tazama spectroscopy ya joto, microscopy ya upanuzi wa joto, na kadha
siliki au nitridi ya siliki