U fiirso qoraalka hoose ka dibna ka jawaab su'aasha kadib isla luqadda qoraalka:  Gudbinta: Atomic force microscopy (AFM) ama scanning force microscopy (SFM) waa nooc aad u sareeya oo ah nooca baaritaanka baaritaanka baaritaanka (SPM), oo leh qeexitaan la muujiyey oo ku saabsan kala duwanaanshaha qaybaha nanometer, in ka badan 1000 jeer ka fiican xadka kala duwanaanshaha indhaha.  Suaal: Waa maxay AFM?
Qalabka wax lagu baaro ee loo yaqaano'scanning probe microscopy'