Magana: AFM ya ƙunshi wani cantilever tare da kaifi tip (bincike) a karshen da aka yi amfani da su duba da samfurin surface. The cantilever ne yawanci silicon ko silicon nitride da tip radius na lankwasa a kan tsari na nanometers. Lokacin da tip aka kawo a cikin kusanci da wani samfurin surface, sojojin tsakanin tip da kuma samfurin kai ga wani karkatarwa na cantilever bisa ga Hooke ta doka. Dangane da halin da ake ciki, sojojin da aka auna a AFM sun hada da inji lamba karfi, van der Waals sojojin, capillary sojojin, sinadaran bonding sojojin, electrostatic sojojin, Casimir Magnetic sojojin (duba Magnetic karfi, MFM), sojojin, solvation sojojin, da dai sauransu, tare da karfi yawa za a iya auna lokaci guda ta hanyar yin amfani da ƙarin nau'i na na musamman bincike (duba Jouver scanning microscopy, thermal karawa microscopy, da dai sauransu). Tambaya: Mene ne karfi da za a iya auna lokaci guda ta hanyar amfani da ƙarin nau'i na bincike na musamman (duba Jouver scanning microscopy
siliki ko siliki nitride